2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)最新文献

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Lightning air terminals - is shape important? 闪电空中终端-形状重要吗?
W. Rison, C. Moore, G. Aulich
{"title":"Lightning air terminals - is shape important?","authors":"W. Rison, C. Moore, G. Aulich","doi":"10.1109/ISEMC.2004.1350045","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350045","url":null,"abstract":"Benjamin Franklin originally proposed the use of sharp pointed lightning rods as a way to prevent lightning strikes. Such rods do not prevent lightning strikes, but they prevent damage to a structure when it as struck by lightning. Conventional lightning protection systems consist of air terminals (lightning rods) to intercept a lightning discharge, downconductors to carry the current, and a grounding system to dissipate the current away from the protected structure. However, lightning protection systems do not prevent lightning, and the sharp points on lightning rods traditionally used in North America are not needed. To be effective, air terminals should be designed so that they are much more likely to be struck by lightning than objects on the structure they are protecting. Recent field studies indicate that a lightning rod with a blunt tip is more effective than a lightning rod with a sharp tip. Two non-conventional lightning protection systems are heavily marketed in North America - early streamer emission (ESE) air terminals and charge transfer systems (CTS). ESEs are claimed to have a much larger zone of protection than conventional air terminals. Proponents of CTS air terminals claim that corona current emitted from their arrays of sharp points can prevent lightning strikes to protected structures. Field studies of ESE air terminals show that their performance is similar to that of conventional sharp-pointed air terminals, and that they do not have the greatly enhanced zone of protection claimed for them. Field studies of charge transfer systems show that they do not prevent lightning strikes.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"173 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126753877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Circuit extraction via time-domain vector fitting 通过时域矢量拟合提取电路
S. Grivet-Talocia, F. Canavero, I. Stievano, I. Maio
{"title":"Circuit extraction via time-domain vector fitting","authors":"S. Grivet-Talocia, F. Canavero, I. Stievano, I. Maio","doi":"10.1109/ISEMC.2004.1349964","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349964","url":null,"abstract":"This paper introduces a new algorithm for the automatic synthesis of SPICE-ready equivalent circuits of complex multiport lumped interconnect structures. The method is named time-domain vector fitting (TD-VF) due to its analogy to the well-known vector fitting algorithm, which operates in the frequency domain. The TD-VF computes a rational approximation of the transfer matrix for the structure under modeling using as raw data its transient port responses to suitable excitations. These include, e.g., the case of transient port scattering responses as typically obtained by full-wave electromagnetic solvers based on the finite-differences time-domain (FDTD) or finite integration (FIT) methods. The TD-VF algorithm works entirely in the time domain, without requiring any knowledge of the frequency-domain responses. This allows direct processing of possibly truncated transient responses, therefore allowing for short full-wave simulations. This paper shows that the accuracy level achievable by TD-VF is excellent. Hence, passivity can be enforced a posteriori using the spectral properties of associated Hamiltonian matrices. Several examples of package, connectors, and discontinuities are provided as illustration.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126365652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Bounds for conducted emissions in three-conductor systems with long feeders 带长馈线的三导体系统的传导发射边界
G. Spadacini, D. Bellan, S. Pignari
{"title":"Bounds for conducted emissions in three-conductor systems with long feeders","authors":"G. Spadacini, D. Bellan, S. Pignari","doi":"10.1109/ISEMC.2004.1349867","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349867","url":null,"abstract":"Estimates are derived for the effects that electrically-long power cords play on conducted emissions (CE) in three-conductor systems. In particular, asymptotic predictions - in the form of upper and lower bounds - are obtained for CE levels measured at the ports of the line-impedance stabilization network. Throughout the analysis, a distributed-parameter prediction model is adopted for the power cord, a Thevenin equivalent representation is used for the electromagnetic interference (EMI) source, and modal decomposition of the circuit quantities is exploited. The impact of electrically-long power cords on EMI filter effectiveness is investigated by embedding basic filtering schemes in the proposed prediction model.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126806059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Power efficiency enhancement and parasitic radiation reduction methods for mobile radio systems 移动无线电系统的功率效率提高和寄生辐射减少方法
J. Gavan
{"title":"Power efficiency enhancement and parasitic radiation reduction methods for mobile radio systems","authors":"J. Gavan","doi":"10.1109/ISEMC.2004.1350012","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350012","url":null,"abstract":"In a mobile system, most of the radiated power transmitted is wasted and is the source of interference for many victim receivers and a radiation hazard for people. Only a very small part of the transmitted energy and power reach the desired receiver. We suggest new techniques to enhance base station energy efficiency and reduce radiation hazards using smart antenna arrays. We also suggest methods for mobile headphones to enhance transmission efficiency and mitigation techniques to reduce users radio energy absorption. We hope that, in the future and for the third or fourth generation cellular systems, such techniques will become dominant. These techniques are more easily implemented for the new cellular frequency range of 1800/2000 MHz and even for higher frequencies, than for the actual dominant 900 MHz band. This is due to the smaller antenna dimensions and to less radiation hazards from the new higher frequency bands.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114069296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Source selection: a critical choice for validating EMI models 源选择:验证电磁干扰模型的关键选择
C. Brench, B. L. Brench
{"title":"Source selection: a critical choice for validating EMI models","authors":"C. Brench, B. L. Brench","doi":"10.1109/ISEMC.2004.1349882","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349882","url":null,"abstract":"To ensure a computational model is accurately representing the real problem under investigation it is essential to examine and understand the source of excitation. While any number of choices may be available and may provide solutions that appear reasonable, they may not be valid for the particular problem being addressed. This paper provides a means to consider the validity and relevancy of the source.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"43 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121014498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A systematic approach and comparison of different 3-D chip structures for electromagnetic compatibility 不同三维芯片结构的电磁兼容性的系统方法和比较
M. Uusimaki, A. Renko
{"title":"A systematic approach and comparison of different 3-D chip structures for electromagnetic compatibility","authors":"M. Uusimaki, A. Renko","doi":"10.1109/ISEMC.2004.1349894","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349894","url":null,"abstract":"A systematic approach to estimate electromagnetic compatibility (EMC) issues in 3D package stacking is introduced. Five different structures are described and compared using a systematic method for electromagnetic compatibility investigation. The method consists of dividing different mechanical structures into smaller segments, which can be studied individually and in such a way that the EMC study is made simpler and can focus on one detail at a time. Estimations of importance of each segments is performed in reference to existing knowledge/data base. Simulations are generated to estimate the coupling effects in selected critical areas. This study highlights the strong points and weak points of the stacking methods investigated. Also the studied cases are arranged in the order of preference, namely, from EMC friendly to EMC disaster.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131377760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Via and reference discontinuity impact on high-speed signal integrity 通过和参考不连续影响高速信号的完整性
Jingook Kim, Joungho Kim, M. Rotaru, K. C. Chong, M. Iyer
{"title":"Via and reference discontinuity impact on high-speed signal integrity","authors":"Jingook Kim, Joungho Kim, M. Rotaru, K. C. Chong, M. Iyer","doi":"10.1109/ISEMC.2004.1349863","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349863","url":null,"abstract":"An efficient and consistent model for the signal trace with reference discontinuities has been devised. It has been verified that the signal trace model can be used to compute the noise coupling between signal traces and reference planes.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127825767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Influence of power line on ground line and communication line during short circuit fault 短路故障时电力线对地线和通信线的影响
Zhibin Zhao, Lin Li, X. Cui, Changzheng Gao
{"title":"Influence of power line on ground line and communication line during short circuit fault","authors":"Zhibin Zhao, Lin Li, X. Cui, Changzheng Gao","doi":"10.1109/ISEMC.2004.1350013","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1350013","url":null,"abstract":"The induced voltage on the communication line near power lines is calculated by virtue of the CDEGS software. When power lines fault, the fault current flows through the power lines and the ground lines. The influence of the ground lines is analyzed through a test on practical power lines. In addition, a transient analysis is carried out using the Fourier transformation with the modeled fault current.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134510361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Reduction of cavity-to-cavity power/ground noise coupling through plane cutout in multilayer PCBs 多层pcb中通过平面切割减少腔间功率/地噪声耦合
Junwoo Lee, Myunghoi Kim, Joungho Kim, M. Rotaru, M. Iyer
{"title":"Reduction of cavity-to-cavity power/ground noise coupling through plane cutout in multilayer PCBs","authors":"Junwoo Lee, Myunghoi Kim, Joungho Kim, M. Rotaru, M. Iyer","doi":"10.1109/ISEMC.2004.1349992","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349992","url":null,"abstract":"Power/ground noise excited in a plane cavity can be coupled to a neighboring plane cavity through a cutout. The coupled noise is substantial at the cavity resonance. The paper addresses a method of reducing the coupled noise through a cutout based on simulation and measurement. We demonstrated that the coupled noise can be suppressed by placing ports (devices) at the proper locations or designing the size of the plane cavity carefully.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114167368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Soil ionization in earth electrodes by a finite difference time domain scheme 有限差分时域格式的土壤电极电离
G. Ala, F. Viola
{"title":"Soil ionization in earth electrodes by a finite difference time domain scheme","authors":"G. Ala, F. Viola","doi":"10.1109/ISEMC.2004.1349934","DOIUrl":"https://doi.org/10.1109/ISEMC.2004.1349934","url":null,"abstract":"This paper proposes a finite difference time domain numerical scheme devoted to analyze the transient behavior of earth electrodes during the soil breakdown that can take place when a surge current has to be drained. To this aim, Maxwell's equations together with a space-time variable resistivity function are used. The model has been validated by comparing the computed results with data available in the technical literature. Simulation results related to complex earth electrodes of limited extension are reported. Electrodes of larger extension can be easily simulated but requiring more computational resources.","PeriodicalId":378094,"journal":{"name":"2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114233260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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