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Proceedings, IEEE AUTOTESTCON最新文献

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Optimizing automated testing for high throughput 优化自动化测试以实现高吞吐量
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047883
J. C. Connell, L. Wheelwright
{"title":"Optimizing automated testing for high throughput","authors":"J. C. Connell, L. Wheelwright","doi":"10.1109/AUTEST.2002.1047883","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047883","url":null,"abstract":"Throughput in automated testing is a critical issue, especially at the maintenance level. Some general rules and approaches, when used with an analysis of the total test requirement, can often substantially reduce test time. New programming environments and new (to test equipment) interface standards such as Ethernet, when available, may provide significant throughput improvement in a test system. Agilent's recent work with manufacturers in the wireless industry has helped validate a variety of approaches to optimize test throughput for transceiver manufacturing. We have found that very significant gains can be realized from only a modest investment. This paper describes successful practices and techniques for optimizing test throughput, and gives specific quantitative examples of the improvements that have been achieved.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115750202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Data type extensibility in automatic test systems 自动测试系统中的数据类型可扩展性
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047944
I. Neag, S. Gal, D. Hartop
{"title":"Data type extensibility in automatic test systems","authors":"I. Neag, S. Gal, D. Hartop","doi":"10.1109/AUTEST.2002.1047944","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047944","url":null,"abstract":"This paper highlights the importance of data type extensibility for preventing software obsolescence in automatic test systems. It describes solutions proposed by the authors for supporting such extensibility in several interfaces of automatic test systems. Some, of these solutions are proposed for interface standards currently under development, while others are implemented in existing commercial products.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126919544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Rollout strategies for sequential fault diagnosis 顺序故障诊断的Rollout策略
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047898
F. Tu, K. Pattipati
{"title":"Rollout strategies for sequential fault diagnosis","authors":"F. Tu, K. Pattipati","doi":"10.1109/AUTEST.2002.1047898","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047898","url":null,"abstract":"Test sequencing is a binary identification problem wherein one needs to develop a minimal expected cost testing procedure to determine which one of a finite number of possible failure sources, if any, is present. The problem can be solved optimally using dynamic programming or AND/OR graph search methods (AO*, CF and HS). However, for large systems, the associated computation with dynamic programming or AND/OR graph search methods is substantial, due to the rapidly increasing number of OR nodes (denoting ambiguity states) and AND nodes (denoting tests) in the search graph. In order to overcome the computational explosion, the one-step or multi-step lookahead heuristic algorithms have been developed to solve the test sequencing problem. In this paper, we propose to apply rollout strategies, which can be combined with the one-step or multi-step lookahead heuristic algorithms to obtain near-optimal solutions in a computationally efficient manner than the optimal strategies. The rollout strategies are illustrated and tested using a range of real-world systems. We show computational results, which suggest that the information-heuristic based rollout policies are significantly better than other rollout policies based on Huffman coding and entropy.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127010329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 110
Discrete resistive elements versus a black body source for thermal imager testing 用于热成像仪测试的离散电阻元件与黑体源
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047882
Barton L. Rossnagel, T.H. Kelly
{"title":"Discrete resistive elements versus a black body source for thermal imager testing","authors":"Barton L. Rossnagel, T.H. Kelly","doi":"10.1109/AUTEST.2002.1047882","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047882","url":null,"abstract":"A comparison of four bar target image data in the long wave infrared range using a conventional blackbody source and a discrete resistive element source is made to assess the ability of an infrared scene projector to test thermal imagers such as forward looking infrared (FLIR) systems. The test equipment used to accomplish the comparison is comprised of four basic elements. These include a QWIP radiometer, a blackbody source with 0.6 cycles/mrad 7:1 aspect ratio four bar target, an infrared scene projector, and video frame capture electronics and analysis software. The video from the radiometer of each source is used as a means of comparing and contrasting the relative performance of an etched target in front of a conventional extended blackbody source and a resistive array source. The infrared image from each source is captured by the radiometer, digitized, and subsequently analyzed. Characteristics from the digitized imagery such as uniformity and intensity modulation of the 4 bar pattern and background are used as objective measures to assess the relative performance between the two approaches.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124901644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
RF Measurement Synthetic Instrumentation - 26.5 GHz and beyond RF测量合成仪器- 26.5 GHz及以上
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047877
R. Beers, L. Orlidge
{"title":"RF Measurement Synthetic Instrumentation - 26.5 GHz and beyond","authors":"R. Beers, L. Orlidge","doi":"10.1109/AUTEST.2002.1047877","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047877","url":null,"abstract":"Synthetic Instrumentation is a class of test devices implemented primarily with software and supported with minimal hardware conditioning for the test signals. This philosophy permits frequent reuse of the hardware elements (processors, A/Ds, D/As, signal conditioners and switches) when commanding different instrument functions. Substantially lower purchase and life cycle costs are therefore achieved. This paper describes the status of Honeywell's RF Measurement Synthetic Instrumentation, developed to meet the needs of both flightline test and Intermediate/depot testers (e.g. CASS). The functions developed included: spectrum analyzer, microwave transition analyzer, frequency/time interval counter, waveform digitizer, power meter and digital multimeter. Performance is competitive with standalone instruments. Honeywell's previous development work and our current Measurement Hardware Emulator (MHE) results show that Synthetic Instrumentation is sufficiently mature to: (1) be included in service life extension programs of legacy ATE, (2) be inserted in current ATE such as CASS, and (3) become the basis of next generation ATE architecture, such as NxTest.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125092148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A practical solution to instrument obsolescence in test systems 一种解决测试系统中仪器陈旧问题的实用方法
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047913
I. Roberts, C. Gorringe
{"title":"A practical solution to instrument obsolescence in test systems","authors":"I. Roberts, C. Gorringe","doi":"10.1109/AUTEST.2002.1047913","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047913","url":null,"abstract":"Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solution, bus level emulation, in detail. The features required of any implementation of this style of solution are presented, and the relevant instrument specific information is outlined. A process for the development of bus level emulators, and their subsequent integration into test systems is presented.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126334075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Overview and applications of the IEEE P1451.4 smart sensor interface standard IEEE P1451.4智能传感器接口标准概述及应用
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047959
D. Potter
{"title":"Overview and applications of the IEEE P1451.4 smart sensor interface standard","authors":"D. Potter","doi":"10.1109/AUTEST.2002.1047959","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047959","url":null,"abstract":"With the goal of promoting the development and adoption of smart transducers, the IEEE 1451 family of smart sensor interface standards defines a set of standardized interfaces for different categories of smart sensors and smart actuators. One member of this family, the IEEE P1451.4 standard, defines a mixed-mode interface that combines that traditional analog sensor signal with a digital interface that enables self-identification of the sensor for plug and play operation. This self-identification is provided by a transducer electronic data sheet (TEDS) that is stored within the transducer. In addition to explaining the components and mechanisms of IEEE P1451.4, the paper describes the implication of plug and play sensors for test and measurement systems. The paper also documents an example implementation of a computer-based data acquisition system that exploits the plug and play sensor concept.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126334455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Using logical decision in DFT method selection 逻辑决策在DFT方法选择中的应用
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047945
Hyun-moo Kim, T. Ambler
{"title":"Using logical decision in DFT method selection","authors":"Hyun-moo Kim, T. Ambler","doi":"10.1109/AUTEST.2002.1047945","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047945","url":null,"abstract":"Describes how logical decision analysis can be used to find the most cost-effective design-for-testing (DFT) method among numerous choices. These days, due to the chip complexity following Moore's Law, testing is getting more difficult and more important. As a result, testing-related cost increases dramatically. To solve this problem, the concept of DFT was suggested, and there are several DFT methods. But, these DFT methods require some additional circuits and a little more complex register than an original register. This area overhead causes more production cost and fewer yields. Other problems occurred while implementing DFT, are performance degradation, EDA tool cost, increase of pin number, etc. Thus, it is very hard to decide which DFT method is most suitable. Optimization technique can be used to find the cost-effective test method if we have all cost models. But, defining cost models is very difficult. Some parameters of the cost models are not available yet because we need DFT selection sometimes before even a real design starts. Thus, we suggest using logical decision analysis to find cost-effective DFT methods. In this method, developing cost models is not needed.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116436975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Integrated logistics, maintenance, and operational support 综合后勤、维护和运营支持
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047954
J. Potts
{"title":"Integrated logistics, maintenance, and operational support","authors":"J. Potts","doi":"10.1109/AUTEST.2002.1047954","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047954","url":null,"abstract":"BAE SYSTEMS is developing an integrated application framework to support Logistics, Operations, Support, and Maintenance of Air Force assets from O-Level to D-Level, and from the Maintenance Operations Center (MOC) to the Air Operations Center (AOC). As we develop the framework, we are integrating the functionality of two existing products: Logistics Control and Information Support (LOCIS) and Agile Logistics and Maintenance Support (ALMS).","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131800199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Reducing No Fault Found using statistical processing and an expert system 利用统计处理和专家系统减少无故障发现
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047966
B. Steadman, T. Pombo, I. Madison, J. Shively, L. Kirkland
{"title":"Reducing No Fault Found using statistical processing and an expert system","authors":"B. Steadman, T. Pombo, I. Madison, J. Shively, L. Kirkland","doi":"10.1109/AUTEST.2002.1047966","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047966","url":null,"abstract":"This paper describes a method for capturing avionics test failure results from Automated Test Equipment (ATE) and statistically processing this data to provide decision support for software engineers in reducing No Fault Found (NFF) cases at various testing levels. NFFs have plagued the avionics test and repair environment for years at enormous cost to readiness and logistics support. The costs in terms of depot repair and user exchange dollars that are wasted annually for unresolved cases are graphically illustrated. A diagnostic data model is presented, which automatically captures, archives and statistically processes test parameters and failure results which are then used to determine if an NFF at the next testing level resulted from a test anomaly. The model includes statistical process methods, which produce historical trend patterns for each part and serial numbered unit tested. An Expert System is used to detect statistical pattern changes and stores that information in a knowledge base. A Decision Support System (DSS) provides advisories for engineers and technicians by combining the statistical test pattern with unit performance changes in the knowledge base. Examples of specific F-16 NFF reduction results are provided.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134230792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
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