Proceedings, IEEE AUTOTESTCON最新文献

Numeric issues in test software correctness 测试软件正确性中的数值问题

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047948

R. G. Hayes, Gary, Hughes, Phillip M. Dorin

引用次数: 0

Concurrent test systems using the structured distributed-programming paradigm 使用结构化分布式编程范例的并发测试系统

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047886

R. C. Salley

{"title":"Concurrent test systems using the structured distributed-programming paradigm","authors":"R. C. Salley","doi":"10.1109/AUTEST.2002.1047886","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047886","url":null,"abstract":"Traditionally developers in the automatic testing community have had no viable paradigm for handling concurrent systems. Test suites that could be processed in one hour using concurrency are being processed in 24 hours sequentially. The structured distributed programming paradigm (SDPP) is a non-traditional paradigm that allows developers to conceive viable distributed/concurrent/parallel systems with the same ease and assurance that they have been conceiving regular single-process sequential systems for the past 30 years. Structured distributed programming (SDP) is primitive, recursive, and applicable at all levels from application systems to operating systems to hardware systems to network systems. SDP is a mindset like object-oriented programming (OOP) is a mindset. As with OOP, the concepts of SDP are primitive and supportable by primitive syntax/semantics in programming languages. At compile time, an OOP sequential system is completely visualizable as a tree-structured graph. At compile time, an SDP system is completely visualizable as dual graphs, one a tree-structured graph of time and the other a cyclic graph of space. Since SDP systems are completely visualizable at compile time, test systems can be guaranteed, at compile time, to never race or deadlock; to always complete, cooperate and integrate with their environment; and to be maintainable, modifiable, reliable, and scalable to any degree.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129885566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Integrated circuit failure detection using IR laser 利用红外激光进行集成电路故障检测

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047955

E. Keenan, L. Kirkland, R. G. Wright, M. Zgol, D. Adebimpe

引用次数: 0

Extending your test without extending your test system 在不扩展测试系统的情况下扩展测试

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047874

J. Nemeth-Johannes, B. Watry

引用次数: 0

Building test applications using timing and triggering with PXI 使用PXI的定时和触发构建测试应用程序

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047894

L. Duraiappah

引用次数: 3

Portable maintenance aid instrument pack-improved weapon system diagnostics 便携式维修辅助工具包-改进的武器系统诊断

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047891

Stephen T. Maio, L. Orlidge

{"title":"Portable maintenance aid instrument pack-improved weapon system diagnostics","authors":"Stephen T. Maio, L. Orlidge","doi":"10.1109/AUTEST.2002.1047891","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047891","url":null,"abstract":"False removals are costly and add to the logistics tail of every weapon system. Integrating portable maintenance aids (PMAs) and maintenance information systems into the test repertoire can help significantly; however, these solutions do little to augment the information available for system test and diagnosis. Adding conventional test instrumentation under PMA control would provide the additional information we seek; however, these hardware intensive solutions are typically large, heavy and expensive. VXI offers an opportunity to consolidate instrumentation into a convenient package; however VXI modules are not designed to meet the rigor associated with the MIL-PRF-28800 Class 1 environment. Moreover, the majority of VXI products provide a single function. Therefore many VXI modules are required to provide the needed functionality, resulting in an instrumentation package that is large and awkward to use at best and quite often just not useable on the flightline. This paper addresses false removals, the challenges involved in addressing this issue, and the solution that is being implemented on the RAH-66 Comanche Helicopter program. A powerful approach to instrumentation that is both powerful and useable, and the test techniques that have been developed to augment diagnostic capability on the flightline, are described.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133057804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

IVI comes of age: an overview of IVI specifications with current status IVI的时代到来:IVI规格与当前状态的概述

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047901

F. Bode

{"title":"IVI comes of age: an overview of IVI specifications with current status","authors":"F. Bode","doi":"10.1109/AUTEST.2002.1047901","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047901","url":null,"abstract":"IVI stands for Interchangeable Virtual Instruments. The IVI Foundation was formed in 1997 and is a consortium founded to promote standard specifications for programmable test instruments The IVI Foundation focuses on the needs of users who build high performance test systems. By building on existing industry standards such as VXIplug&play driver concepts, the Foundation's goal is to deliver specifications that simplify interchangeability, provide better performance and maintainable test programs. To date, only a few IVI drivers have been available. In the past year, the IVI Foundation finished a major revision of it's architecture, and has released a blizzard of specifications, increasing its IVI Class specification by 80%, and dramatically improving the consistency and quality of released drivers. The DOD has expressed major interest in IVI's success. With the recent successful completion of the current set of specifications, the DOD has expressed interest in becoming involved in defining the next set of Class Specifications. The NxTest Working Group lists IVI as a key technical element, and the DOD has recently requested that the IVI Foundation consider Electro Optical equipment for their next set of Class Specifications. A Working Group has been formed to more clearly define this activity.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124423605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Synthesis of complex signals on test equipment 测试设备上复杂信号的合成

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047908

M. Cornish, C. Gorringe, J. Langlois

{"title":"Synthesis of complex signals on test equipment","authors":"M. Cornish, C. Gorringe, J. Langlois","doi":"10.1109/AUTEST.2002.1047908","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047908","url":null,"abstract":"A traditional signal definition exhaustively lists every attribute and condition that it was thought the signal could possibly have. However, it is often the case that we are only interested in controlling a limited number of signal attributes and conditions. The traditional method is inflexible in this respect, leading to problems when trying to map different capabilities in a signal standard, as required for ATP (Automated Test Program) portability. In this paper we consider a concept called a Signal Graph to define a model of a single, complete signal. Each component in the Signal Graph identifies a feature or behavior that our signal will exhibit. The Signal Graph is a mechanism whereby we can define a set of features that we require, which can then be mapped onto a series or collection of suitable resources (e.g. algorithm, PC card, bus instrument, etc.). We show how complex, 'user defined' signals can be created and then mapped onto real hardware to provide a portable ATE (Automatic Test Environment) signal description, which can be used on a variety of ATEs. This paper draws upon IEEE standard SDTD (Signal Definition and Test Description) standard to utilize common components and interfacing techniques and shows how a single test description can be used for both simulation and execution.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115111838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Streamlining customer vendor synergy through distributed test and automated issue reporting by utilizing modern test equipment connectivity and Internet infrastructure 通过利用现代测试设备连接和Internet基础设施，通过分布式测试和自动问题报告，简化客户和供应商的协同作用

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047969

K. K. Johnson, R. Myer

{"title":"Streamlining customer vendor synergy through distributed test and automated issue reporting by utilizing modern test equipment connectivity and Internet infrastructure","authors":"K. K. Johnson, R. Myer","doi":"10.1109/AUTEST.2002.1047969","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047969","url":null,"abstract":"The Internet is enabling a new approach to testing strategies by redistributing traditional test functions between component vendors and equipment integrators. Modern connectivity, design software and graphical programming environments have made it practical to create automated test programs that share information via the Internet. Many tests need no longer be preformed by the system integrator, but can be disturbed to the vendors resulting in powerful economic savings. System integrator, test engineers develop the test programs for their component vendors. This gives their system designers confidence in test. Results are uploaded directly to their database from vendors. Component vendors no longer have to fully re-interpret the meaning or revision of specifications, saving time, and are able to ship product with confidence of acceptance by using the integrators program. Addition benefits are gained through timely automated issue notification via email through the appropriate escalation chain. Latency elimination and file compatibility in test data can be very beneficial when it flows across company boundaries seamlessly. System designers can simulate performance even before the components arrive at their location. This paper reviews the concepts, economics and techniques for redistributing test to shorten the design cycle, increase supply chain efficiency, and reduce capital equipment budgets.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124611604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Nanotechnology impact on aircraft design and maintenance 纳米技术对飞机设计和维修的影响

Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047958

L. Kirkland, R. G. Wright

{"title":"Nanotechnology impact on aircraft design and maintenance","authors":"L. Kirkland, R. G. Wright","doi":"10.1109/AUTEST.2002.1047958","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047958","url":null,"abstract":"This paper describes unique research efforts relating to the development of nanoscale devices to replace standard integrated circuits, and eventually entire electronic systems. Standard integrated circuits (IC) have limitations or restrictions in size, speed, reliability, complexity and finding suitable replacements for discontinued items. Nanoscale device development and understanding has dramatically grown. One of the key properties of quantum physics that quantum computers rely on is the ability of certain atoms or nuclei to work together as quantum bits. These computing devices are a fraction of the size of typical ICs (nanoscale). Nanoscale devices developed using quantum physics principles have unlimited potential to revolutionize the methods and design of fabricated printed circuit cards and complete systems. They can replace an entire PC board or the set of PC boards that comprise a Line Replaceable Unit (LRU). This would be a good and practical jumping-off point. to going direct to the complete device, system or function level. This might include a nanoscale computer (general purpose or flight control), transmitter, GPS receiver, position and/or attitude sensors in either a standalone configuration, or combined within conventional devices (e.g., a nanoscale communications suite (xmtr/rcvr, etc.). encapsulated within the Plexiglas canopy or the control yoke of an F16 rather that, behind the instrument panel or maybe the whole comm suite into the pilot's helmet.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127424461","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0