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Proceedings, IEEE AUTOTESTCON最新文献

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Modular test architectures for the aerospace industry 航空航天工业的模块化测试体系结构
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047895
C. Nair
{"title":"Modular test architectures for the aerospace industry","authors":"C. Nair","doi":"10.1109/AUTEST.2002.1047895","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047895","url":null,"abstract":"This paper lays the ground work for a common test platform architecture being adopted by a number of organizations in the aerospace industry. Test engineers realize that integration is not a one time event. This paper discusses an architecture based on a modular hardware and software platform that ensures design freedom and the ability to upgrade test systems without rearchitecting the entire test system. Additionally engineers in diverse applications such as structural test, turbine/engine test, avionics, environmental screening, and hydraulic actuator test can now use common elements of design and implementation hence saving their organizations money and development time.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132077093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
PXI: the future of test PXI:测试的未来
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047892
L. Gutterman
{"title":"PXI: the future of test","authors":"L. Gutterman","doi":"10.1109/AUTEST.2002.1047892","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047892","url":null,"abstract":"As commercial and military electronic technology evolves, so does the need for more sophisticated, reliable, and cost-effective test equipment. The new PXI platform fills this gap and provides the ultimate test solution for field, laboratory, or manufacturing test applications. This paper discusses the evolution of test that led to the development of the PXI standard and provides technical information of the PXI bus.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121284530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Signal modeling focused on resource configuration and information acquisition 信号建模侧重于资源配置和信息获取
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047926
Zhang Wei, Shen Shituan, Li Yuhua
{"title":"Signal modeling focused on resource configuration and information acquisition","authors":"Zhang Wei, Shen Shituan, Li Yuhua","doi":"10.1109/AUTEST.2002.1047926","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047926","url":null,"abstract":"Some accessorial and peripheral work has often been considered burdensome in preparing a complicated test assignment when operating ATE. Since the signal is one of the most important objects for investigation, it is necessary to acquire the elaborate information of resource and channels in order to contribute to the subsequent configuration. Nevertheless it is difficult and inconvenient to deduce the required knowledge only from the known signals. It seems that some efforts concerning the signal's generation would benefit the puzzle's solution. Aiming to alleviate the limited test resource situations and provide the active, automatic configuration process, this paper proposes a signal modeling method based on Object-Oriented Analysis (OOA) with a general description language, and according to this consideration, an implementation approach which can acquire resource related information from a given signal is discussed. Through the analysis of possible relations between resources and signals, the recursive expressions are presented theoretically, and the signal's resource condition P(S/sub i/) and inheritance priority In(S/sub i/) are put forward to evaluate its generation cost and the feasibility of configuration.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124880349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Test station configuration and health management 测试站配置和运行状况管理
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047871
K. Berk, K. Fitzgibbon, N. Wilson, R. Barker, C. Howell
{"title":"Test station configuration and health management","authors":"K. Berk, K. Fitzgibbon, N. Wilson, R. Barker, C. Howell","doi":"10.1109/AUTEST.2002.1047871","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047871","url":null,"abstract":"This paper discusses how the test station health and care play an important part in minimizing no fault found (NFF) cases on units under test (UUTs). The paper presents successfully tested methods to collect and analyze test results, and display test information for test station instruments, interface test adapters (ITAs), and UUTs. The technology is currently being prototyped for the Ogden F-16 avionic depot facilities. The analysis methods provide support to identify causes of NFF resulting from discrepancies in testing procedures at different test levels (such as flight line, intermediate and depot maintenance levels). The methods also provide test program set (TPS) software for engineers to identify stack tolerance dependences, which cause misleading diagnostics and incorrect repair actions. The paper discusses the latest experimental results and contributions to the F-16 reduction of total ownership cost (R-TOC).","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127751758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
PXI for military test applications PXI用于军事测试应用
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047893
L. Gutterman
{"title":"PXI for military test applications","authors":"L. Gutterman","doi":"10.1109/AUTEST.2002.1047893","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047893","url":null,"abstract":"As PXI is gaining in-roads into military test applications, systems integrators start using the PXI platform as the core of military testers for manufacturing, service, and field test. This paper discusses two such applications. The first is a production tester used in the manufacturing of the Longbow launcher and the second is a portable field tester for the Maverick Missile System.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128128464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Partnering for test - does it work? 为测试而合作——它有效吗?
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047915
S. Centeno
{"title":"Partnering for test - does it work?","authors":"S. Centeno","doi":"10.1109/AUTEST.2002.1047915","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047915","url":null,"abstract":"Government partnering with industry for operational flight program (OFP) software test and evaluation is not a new concept. The intent of this paper is to show how the focus of the US Air Force has changed to meet the demand of a more responsive and affordable logistics system through revised partnering concepts and how it applies to software test. To understand what, why and how changes in the logistics process have materialized, a comparison must first be made to reflect the deltas of pre-1990 logistics processes to current day reformed processes for software sustainment and how these processes evolved over time. The intent of the paper is to iterate that government and industry partnering is indeed a win-win proposition for the strength of our national defense.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114354255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Leveraging LRU TPS diagnostic data for use in SRU TPS development 利用LRU TPS诊断数据用于SRU TPS开发
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047873
M. Araiza, P. Dussault, J. Elrod
{"title":"Leveraging LRU TPS diagnostic data for use in SRU TPS development","authors":"M. Araiza, P. Dussault, J. Elrod","doi":"10.1109/AUTEST.2002.1047873","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047873","url":null,"abstract":"This paper explores how a model-based diagnostic reasoning tool and run time engine can be used during line replaceable unit (LRU) test program set (TPS) development to diagnose to the sub-shop replaceable unit (SRU) level and how the LRU diagnostic session file can be leveraged during SRU TPS development. This multi-tiered diagnostics approach is enabled by the Diagnostic Profiler tool, used to engineer and generate a diagnostic knowledge base (DKB), and the Diagnostician reasoner, which embodies the DKB. Although the application focus is on the ATLAS integrated family of test equipment, this approach has general applicability to other automatic test equipment and source languages.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121837129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A reference architecture for remote diagnostics and prognostics applications 远程诊断和预测应用程序的参考体系结构
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047964
F. T. Campos, Nathaniel Mills, M. L. Graves
{"title":"A reference architecture for remote diagnostics and prognostics applications","authors":"F. T. Campos, Nathaniel Mills, M. L. Graves","doi":"10.1109/AUTEST.2002.1047964","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047964","url":null,"abstract":"This paper describes a reference architecture for developing and implementing software applications that perform remote vehicle diagnostics and prognostics. The reference architecture incorporates emerging standard server technologies at the application level to ensure portability across a broad range of server platforms and to promote reuse of core application components across diverse end user domains. The core applications include the real-time diagnostics management application, a diagnostic analysis toolset, and an analysis and authoring environment for developing diagnostic/prognostic applications. The diagnostic analysis toolset uses Java-based application components within a common framework to enable a diverse mix of reasoning and rule-based methods to be flexibly integrated within diagnostic and prognostic applications. These same components are also used in the real time server environment for executing diagnostic and prognostic strategies.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125132364","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Test strategy planning method for complex integrated circuits 复杂集成电路测试策略规划方法
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047946
Songjun Lee, A. Ambler
{"title":"Test strategy planning method for complex integrated circuits","authors":"Songjun Lee, A. Ambler","doi":"10.1109/AUTEST.2002.1047946","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047946","url":null,"abstract":"This paper describes an advanced test planning technique for integrated circuits (ICs) with high production volumes. Since the proportion of test costs is relatively high, with complexities of IC devices increasing, many different test methods must be taken into account to test an IC cheaply and accurately. Many test planning methods have been introduced in the past ten years or more, however, the trends of ICs is to become more and more complex with high production volumes. This paper is focused on current complex ICs such as microprocessors. It can predict the overall manufacturing cost in the early design stage, and help the manufacturer reduce the overall costs.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125152413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Adopting IVI: an incremental approach [Interchangeable Virtual Instruments] 采用IVI:渐进式方法[可互换的虚拟仪器]
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047902
S. O'Donnell, R. Brackett
{"title":"Adopting IVI: an incremental approach [Interchangeable Virtual Instruments]","authors":"S. O'Donnell, R. Brackett","doi":"10.1109/AUTEST.2002.1047902","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047902","url":null,"abstract":"Interchangeable Virtual Instruments (IVI) instrument driver technology offers the test system developer many benefits over existing implementations. As instruments become obsolete, or as newer higher performance or lower cost instruments become available, the significant investment expended on the Test Program Set (TPS) will not be impacted. Lockheed Martin Information Systems (LMIS) is encouraged by the promise IVI brings to Automatic Test Equipment (ATE). We are committed to the principle of isolating test software from the variability of a specific instrument. We have demonstrated this commitment by incorporating an IVI-like interface in our automated test systems several years ago when IVI was not adequately defined. As a result, we have seen first-hand the benefits it brings to non-recurring engineering expenses of new systems. Today, IVI is still not fully defined; its major drawback being the limited number of approved instrument classes. The slow speed of bringing an instrument class to fruition may be the major obstacle of adopting IVI in a test system. This paper identifies our approach for an incremental adoption of IVI into current, future, and legacy programs as it becomes more defined.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126185971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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