{"title":"PXI:测试的未来","authors":"L. Gutterman","doi":"10.1109/AUTEST.2002.1047892","DOIUrl":null,"url":null,"abstract":"As commercial and military electronic technology evolves, so does the need for more sophisticated, reliable, and cost-effective test equipment. The new PXI platform fills this gap and provides the ultimate test solution for field, laboratory, or manufacturing test applications. This paper discusses the evolution of test that led to the development of the PXI standard and provides technical information of the PXI bus.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"PXI: the future of test\",\"authors\":\"L. Gutterman\",\"doi\":\"10.1109/AUTEST.2002.1047892\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As commercial and military electronic technology evolves, so does the need for more sophisticated, reliable, and cost-effective test equipment. The new PXI platform fills this gap and provides the ultimate test solution for field, laboratory, or manufacturing test applications. This paper discusses the evolution of test that led to the development of the PXI standard and provides technical information of the PXI bus.\",\"PeriodicalId\":372875,\"journal\":{\"name\":\"Proceedings, IEEE AUTOTESTCON\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings, IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2002.1047892\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings, IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2002.1047892","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
As commercial and military electronic technology evolves, so does the need for more sophisticated, reliable, and cost-effective test equipment. The new PXI platform fills this gap and provides the ultimate test solution for field, laboratory, or manufacturing test applications. This paper discusses the evolution of test that led to the development of the PXI standard and provides technical information of the PXI bus.
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