发布求助
文献互助 智能选刊 最新文献

Proceedings, IEEE AUTOTESTCON最新文献

筛选
英文 中文
Optimizing signal integrity, data throughput, and costs in mixed architecture systems 在混合架构系统中优化信号完整性、数据吞吐量和成本
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047890
C. Reynolds
{"title":"Optimizing signal integrity, data throughput, and costs in mixed architecture systems","authors":"C. Reynolds","doi":"10.1109/AUTEST.2002.1047890","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047890","url":null,"abstract":"A test system design that is limited to a single hardware architecture, whether it is rack-and-stack or an open-standard modular platform like VXI, may have considerable appeal for reasons of consistency. However, there are often compromises in performance or price that can be avoided by mixing and matching the best of both worlds. This paper describes a systematic approach to making the best instrumentation choices using an example configuration designed for testing satellite power subsystem controllers.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131329196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Strategies for mitigating risk related to the obsolescence of HP 8566/68 spectrum analyzers in ATE systems 降低ATE系统中HP 8566/68频谱分析仪过时相关风险的策略
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047943
Tom Hoppin
{"title":"Strategies for mitigating risk related to the obsolescence of HP 8566/68 spectrum analyzers in ATE systems","authors":"Tom Hoppin","doi":"10.1109/AUTEST.2002.1047943","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047943","url":null,"abstract":"The Hewlett-Packard 8566 and 8568 were the first RF and microwave spectrum analyzers offering remote control and data transfer through the GPIB interface. These analyzers have been widely deployed in automated test equipment (ATE) systems and the majority of units produced since introduction 24 years ago are in active use. These instruments were discontinued five years ago, and Agilent Technologies will suspend support for them this year. This situation exposes ATE system managers to higher levels of risk than might be apparent. This paper outlines risk areas and presents a range of mitigation actions that affected managers might take. In describing those actions, a new option for HP 8566/68 programming code compatibility is introduced and discussed.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120925792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
An application of Bayesian reasoning to improve functional test diagnostic effectiveness 应用贝叶斯推理提高功能测试诊断效率
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047952
David P. Menzer
{"title":"An application of Bayesian reasoning to improve functional test diagnostic effectiveness","authors":"David P. Menzer","doi":"10.1109/AUTEST.2002.1047952","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047952","url":null,"abstract":"This paper describes a software package that embodies a Bayesian reasoning engine and modeling schema to significantly improve the ability to discern the defective component causing a failed functional test. This software approach brings to functional test similar diagnostic capabilities that have become familiar to test engineers working with X-ray, automatic optical inspection (AOI) and in-circuit test (ICT) test technologies. This software package, known as Fault Detective, provides significantly improved diagnostic accuracy as compared to human efforts, and works with exactly the same data set as is currently available for diagnostic purposes. The model is based on the interaction of the functional test suite with the product functional block diagram. This approach also means that the software package is highly independent of the technology behind the system being diagnosed.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121378005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
CASS upgrade COSSI-a systematic approach to incorporating NxTest technology into legacy military ATE CASS升级cosis——将NxTest技术整合到传统军事ATE的系统方法
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047875
J. Orlet, G. Murdock
{"title":"CASS upgrade COSSI-a systematic approach to incorporating NxTest technology into legacy military ATE","authors":"J. Orlet, G. Murdock","doi":"10.1109/AUTEST.2002.1047875","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047875","url":null,"abstract":"The Consolidated Automated Support System (CASS) Upgrade Commercial Operations and Support Savings Initiative (COSSI) is a multi-year cooperative development agreement to insert commercial off the shelf (COTS) based NxTest technology into the existing US Navy CASS test station to provide operations and support (O&S) cost savings which was started in August 2000 and is scheduled to finish this year. This paper discusses the unique programmatic and technical challenges faced when incorporating new technologies into legacy military ATE.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122320532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Missile test confidence via test systems certification and associated data analysis 导弹测试信心通过测试系统认证和相关数据分析
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047950
D. L. Maupin
{"title":"Missile test confidence via test systems certification and associated data analysis","authors":"D. L. Maupin","doi":"10.1109/AUTEST.2002.1047950","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047950","url":null,"abstract":"This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123768965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
FPGAs in digital testing fpga数字测试
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047872
A. Jiménez, M.G. Munoz
{"title":"FPGAs in digital testing","authors":"A. Jiménez, M.G. Munoz","doi":"10.1109/AUTEST.2002.1047872","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047872","url":null,"abstract":"This paper describes the techniques used to design an interface device (ID) for digital testing, based on field programmable gate arrays (FPGAs). The application reviewed comes from a CASS TPS development program, where 31 digital shop replaceable assemblies (SRAs) were grouped in a single ID. The ID consists of a set of FPGAs interconnected in an optimum mode to match each particular UUT interface requirements. FPGAs are basically used to alter the mapping of resources between UUTs and the ATE. The main advantage of the proposed solution is that the interface hardware can be modified by SW, and what is more, can be also altered during test program execution. The main objective is to provide the reader with a practical methodology for using FPGAs in future TPS developments. Since the circuits implemented on the FPGAs are also needed for the ATPG model, the information of the specific interface is extracted from the LASAR (ATPG environment) files and post-processed to obtain a VHDL (hardware description language) model. The details on how this is performed, with examples, are reviewed in depth.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131584709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Knowledge representation considerations for integration of diagnostic maturation information 集成诊断成熟度信息的知识表示考虑
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047965
Mr. Timothy, Wilmering
{"title":"Knowledge representation considerations for integration of diagnostic maturation information","authors":"Mr. Timothy, Wilmering","doi":"10.1109/AUTEST.2002.1047965","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047965","url":null,"abstract":"With increasing frequency engineers, systems analysts, and software application developers are obliged to quickly acquire broad-based knowledge in unfamiliar information domains. Often requisite information sources are embodied in a stream of open source data, such as a network of World Wide Web sites or a proprietary customer document or data repository. When this occurs, the principal impediment to extracting relevant information can be the sheer volume of data that must be navigated and interpreted. This paper discusses some of the considerations in choosing suitable knowledge representations for use in the acquisition, integration, and analysis of diagnostic maturation information.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132008300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Implementation of Prognostics Framework on Navy Battle Group - Automated Maintenance Environment (BG-AME) and Total Ship Monitoring (TSM) Programs 海军战斗群自动化维护环境(BG-AME)和全舰监测(TSM)项目预测框架的实施
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047960
M. Nolan, T. Cesarone
{"title":"Implementation of Prognostics Framework on Navy Battle Group - Automated Maintenance Environment (BG-AME) and Total Ship Monitoring (TSM) Programs","authors":"M. Nolan, T. Cesarone","doi":"10.1109/AUTEST.2002.1047960","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047960","url":null,"abstract":"This paper will describe how the Prognostics Framework model-based reasoning tool was used by the Navy under the Battle Group - Automated Maintenance Environment (BG-AME) and Total Ship Monitoring (TSM) Programs to provide real-time condition monitoring and prognostics of ship systems, and provide mission capability assessments to commanders.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134233277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Test Markup Language (TML) 测试标记语言(TML)
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047938
S. Wegener
{"title":"Test Markup Language (TML)","authors":"S. Wegener","doi":"10.1109/AUTEST.2002.1047938","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047938","url":null,"abstract":"This paper will briefly cover the Test Markup Language (TML) currently under development at The Boeing Company. TML is built on the commercial eXtensible Markup Language (XML) specification.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123067752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Draft standard for test industry metadata (TIM) 测试行业元数据(TIM)标准草案
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047912
R. Powell, G. Roffman
{"title":"Draft standard for test industry metadata (TIM)","authors":"R. Powell, G. Roffman","doi":"10.1109/AUTEST.2002.1047912","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047912","url":null,"abstract":"The Test Industry Metadata (TIM) standard is being developed to aid the test and measurement industry in organizing itself. TIM will include a common means of defining a product or service using standard industry terminology. The result will be a standard way to define products and their related resources for every test and measurement company and configure products both inter and intra company. Any TIM compliant search engine can then read this information, thus allowing them to correctly identify all of the product offerings for each company. Increasing product visibility increases the chances of customers finding the correct products and services and reduces the cost to test and measurement companies. The end result is a system of information exchange, which will be beneficial to both the consumers and the test and measurement industry alike.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127922615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信