Optimizing signal integrity, data throughput, and costs in mixed architecture systems

Abstract

A test system design that is limited to a single hardware architecture, whether it is rack-and-stack or an open-standard modular platform like VXI, may have considerable appeal for reasons of consistency. However, there are often compromises in performance or price that can be avoided by mixing and matching the best of both worlds. This paper describes a systematic approach to making the best instrumentation choices using an example configuration designed for testing satellite power subsystem controllers.