{"title":"导弹测试信心通过测试系统认证和相关数据分析","authors":"D. L. Maupin","doi":"10.1109/AUTEST.2002.1047950","DOIUrl":null,"url":null,"abstract":"This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Missile test confidence via test systems certification and associated data analysis\",\"authors\":\"D. L. Maupin\",\"doi\":\"10.1109/AUTEST.2002.1047950\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.\",\"PeriodicalId\":372875,\"journal\":{\"name\":\"Proceedings, IEEE AUTOTESTCON\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings, IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2002.1047950\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings, IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2002.1047950","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Missile test confidence via test systems certification and associated data analysis
This paper discusses missile data analysis from production and fleet return test runs. This data can be used to detect a wide array of potential problems. The author looks at how this data can be used by the manufacturers and depots that collect it. I will also examine data analysis visual display chart types and how to effectively group the results. Future trends in the use of the analysis programs will also be briefly explored.