Leveraging LRU TPS diagnostic data for use in SRU TPS development

M. Araiza, P. Dussault, J. Elrod
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引用次数: 1

Abstract

This paper explores how a model-based diagnostic reasoning tool and run time engine can be used during line replaceable unit (LRU) test program set (TPS) development to diagnose to the sub-shop replaceable unit (SRU) level and how the LRU diagnostic session file can be leveraged during SRU TPS development. This multi-tiered diagnostics approach is enabled by the Diagnostic Profiler tool, used to engineer and generate a diagnostic knowledge base (DKB), and the Diagnostician reasoner, which embodies the DKB. Although the application focus is on the ATLAS integrated family of test equipment, this approach has general applicability to other automatic test equipment and source languages.
利用LRU TPS诊断数据用于SRU TPS开发
本文探讨了如何在生产线可替换单元(LRU)测试程序集(TPS)开发过程中使用基于模型的诊断推理工具和运行时引擎来诊断子车间可替换单元(SRU)级别,以及如何在SRU TPS开发过程中利用LRU诊断会话文件。这种多层诊断方法由用于设计和生成诊断知识库(DKB)的Diagnostic Profiler工具和包含DKB的Diagnostician推理器支持。虽然应用的重点是ATLAS集成测试设备家族,但这种方法对其他自动测试设备和源语言也具有普遍的适用性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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