Building test applications using timing and triggering with PXI

Abstract

The PXI platform provides sophisticated synchronization capabilities for automated test applications. This paper provides a technical overview of triggering and synchronization capabilities of PXI, including the PXI Trigger Bus, the Star Trigger Bus, and the back-plane clock. The test applications of triggering and synchronization are discussed and demonstrated, including: synchronization of multiple digitizers/scopes to simultaneously sample multiple channels; synchronization of a scope (or multiple scopes) to a source to accomplish time domain measurements of the DUT response to stimulus; position based measurements (digitizers synchronized to counter/timers); synchronization of a DMM to a switch to access multiple test nodes when the DUT has settled to a steady state; and synchronization of motion control with image acquisition.