{"title":"一种解决测试系统中仪器陈旧问题的实用方法","authors":"I. Roberts, C. Gorringe","doi":"10.1109/AUTEST.2002.1047913","DOIUrl":null,"url":null,"abstract":"Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solution, bus level emulation, in detail. The features required of any implementation of this style of solution are presented, and the relevant instrument specific information is outlined. A process for the development of bus level emulators, and their subsequent integration into test systems is presented.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A practical solution to instrument obsolescence in test systems\",\"authors\":\"I. Roberts, C. Gorringe\",\"doi\":\"10.1109/AUTEST.2002.1047913\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solution, bus level emulation, in detail. The features required of any implementation of this style of solution are presented, and the relevant instrument specific information is outlined. A process for the development of bus level emulators, and their subsequent integration into test systems is presented.\",\"PeriodicalId\":372875,\"journal\":{\"name\":\"Proceedings, IEEE AUTOTESTCON\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings, IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2002.1047913\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings, IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2002.1047913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A practical solution to instrument obsolescence in test systems
Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solution, bus level emulation, in detail. The features required of any implementation of this style of solution are presented, and the relevant instrument specific information is outlined. A process for the development of bus level emulators, and their subsequent integration into test systems is presented.
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