A practical solution to instrument obsolescence in test systems

I. Roberts, C. Gorringe
{"title":"A practical solution to instrument obsolescence in test systems","authors":"I. Roberts, C. Gorringe","doi":"10.1109/AUTEST.2002.1047913","DOIUrl":null,"url":null,"abstract":"Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solution, bus level emulation, in detail. The features required of any implementation of this style of solution are presented, and the relevant instrument specific information is outlined. A process for the development of bus level emulators, and their subsequent integration into test systems is presented.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings, IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2002.1047913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Obsolescence of instruments in Automatic Test Systems (ATS) presents significant problems for test system users, and an important challenge for test system manufacturers. A solution is required which allows replacement of obsolete instruments, whilst protecting investment in test program development. This paper considers the forms that such solutions might take, and discusses one method of solution, bus level emulation, in detail. The features required of any implementation of this style of solution are presented, and the relevant instrument specific information is outlined. A process for the development of bus level emulators, and their subsequent integration into test systems is presented.
一种解决测试系统中仪器陈旧问题的实用方法
自动测试系统(ATS)中仪器的过时给测试系统用户带来了重大问题,也给测试系统制造商带来了重大挑战。需要一种解决方案,允许更换过时的仪器,同时保护测试程序开发的投资。本文考虑了这些解决方案可能采取的形式,并详细讨论了一种解决方法——总线级仿真。介绍了任何实现这种解决方案所需的功能,并概述了相关的仪器特定信息。介绍了总线电平仿真器的开发过程及其在测试系统中的集成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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