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Development of an automatic test set for an air-to-ground weapon system 空对地武器系统自动测试装置的研制
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047899
D. Poland
{"title":"Development of an automatic test set for an air-to-ground weapon system","authors":"D. Poland","doi":"10.1109/AUTEST.2002.1047899","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047899","url":null,"abstract":"This paper discusses the design and development of the Services Weapon Test Set (SWTS); an automated test set that is designed to be used at the Second Line Maintenance Facility for the troubleshooting and certification of the Brimstone Weapon System. This test set is designed to be operated by Royal Air Force personnel with little or no system unique training, and without the use of Technical Publications. All instructions and troubleshooting information are provided to the operator on the test set's screen.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134070038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Factory automation systems: Evolution and trends 工厂自动化系统:演变和趋势
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047967
L. Wang
{"title":"Factory automation systems: Evolution and trends","authors":"L. Wang","doi":"10.1109/AUTEST.2002.1047967","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047967","url":null,"abstract":"The paper mainly presents the evolution of factory automation and the trends for the next generation factory automation systems, i.e., open systems. Along the dimension of open architecture, it discusses some standardized methodologies involving Linux open source operating system, platform independent Java programming language, systematic object-oriented software engineering, Web-based information publishing, virtual instrument based system configuration, distributed and embedded real-time systems, etc. and their applications in factory automation systems. The resulting open systems are capable of keeping up with the evolving requirements in automation industry and it is expected that the strict use of standards would bring benefits to enterprises in the long sight.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":" 81","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134506151","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Test and measurement equipment adopts computer industry standards 测试测量设备采用计算机行业标准
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047906
S. Williams
{"title":"Test and measurement equipment adopts computer industry standards","authors":"S. Williams","doi":"10.1109/AUTEST.2002.1047906","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047906","url":null,"abstract":"Test-and-measurement engineers involved in measurement, automation and product test can significantly benefit from rapid developments in the general computer industry. Relevant computer-standard technologies, applied to the test, measurement and automation industry's solutions, instruments and systems, bring a wealth of vital, new and innovative capabilities to the users of such equipment. Use of computer-standard technologies also results in reduced equipment costs, dramatically improved ease of use, consistency between instruments, simpler and more powerful software solutions, and accelerated equipment time-to-market.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130587762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Mass interconnect approach takes full advantage of VXI capabilities in support of the Air Force C-17 upgrade program 大规模互连方法充分利用了支持空军C-17升级计划的VXI能力
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047888
A. Hawkins, J. Hopp
{"title":"Mass interconnect approach takes full advantage of VXI capabilities in support of the Air Force C-17 upgrade program","authors":"A. Hawkins, J. Hopp","doi":"10.1109/AUTEST.2002.1047888","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047888","url":null,"abstract":"Designing and deploying a VXI-based functional tester which incorporates a multiple array of test operations can be challenging. A VXI test system is an incredibly powerful hardware platform that requires a wide range of signal propagation choices and possibilities. With the addition of a mass interconnect solution integrated as part of the overall design, a complex program such as testing a sophisticated airplane immediately becomes extremely versatile.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124759923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An integrated view of test and diagnostic information standards 测试和诊断信息标准的综合视图
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047911
J. Sheppard, M. Kaufman
{"title":"An integrated view of test and diagnostic information standards","authors":"J. Sheppard, M. Kaufman","doi":"10.1109/AUTEST.2002.1047911","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047911","url":null,"abstract":"In this paper, we discuss the technical issues related to defining a coordinated view of integrated diagnostic information. Our objective is to define a process and modeling framework for solving the information integration problem. The process discussed is based on formal modeling methods that have been used for years in various contexts but rarely combined. Specifically, the approach applies a \"component\" orientation to the problem and draws heavily from the discipline of information modeling.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130256527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
What are the important factors affecting prognostics? 影响预后的重要因素是什么?
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047961
J.R. Miller, J.H. Grimes
{"title":"What are the important factors affecting prognostics?","authors":"J.R. Miller, J.H. Grimes","doi":"10.1109/AUTEST.2002.1047961","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047961","url":null,"abstract":"Trend analysis mathematics and data interactions are studied. Investigation of the tolerances on the projection of the linear trend line is undertaken. Importance of the number of measurements is discussed. It is shown that the best estimate of time to exceedance requires 8 to 9 measurements. Several examples of test data are presented. The relationship between requirements and test equipment performance is given. Two different methods to determine accuracy of prediction are discussed. Some methods of trend analysis have only limited ability and experience with accuracy of prediction questions. Based on experience with vehicle testing the major limitation has been non-repeatability of data.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"267 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124340743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Optical switching for automated test systems 用于自动测试系统的光交换
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047885
M. Bitting
{"title":"Optical switching for automated test systems","authors":"M. Bitting","doi":"10.1109/AUTEST.2002.1047885","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047885","url":null,"abstract":"The proliferation of optical technology in the commercial telecom arena has driven the need to develop cost effective fiber optic component test systems with high throughput rates. As more and more optical technology makes its way into military systems the needs are increasing for general-purpose optical test systems to meet these diverse requirements as well. An understanding of the optical performance parameters of optical switches is needed to design optimal optical switch based test systems for measurement of both active and passive optical component performance. The advantages of using optically switched test architectures to increase productivity, provide greater measurement accuracy and to lower overall test equipment investment are numerous. The general availability of optical switches that meet the required performance parameters, enable the development of cost effective flexible test systems and embedded monitoring systems that can support a wide range of requirements. This paper explores some of the uses of optical switches in test, measurement, and embedded monitoring applications. Optical switch system design options and performance tradeoffs are also discussed in detail. A comparison of modular with stand-alone optical switches is discussed with regard to cost and functionality.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132641489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Smart weapon BIT and reprogramming: A management update 智能武器BIT和重新编程:管理更新
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047887
S. Preiss, J.T. Lo Gudice
{"title":"Smart weapon BIT and reprogramming: A management update","authors":"S. Preiss, J.T. Lo Gudice","doi":"10.1109/AUTEST.2002.1047887","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047887","url":null,"abstract":"This paper offers insight into the challenges of modern day Navy and Marine Corp smart weapon Built In Test (BIT) and reprogramming. With the land-based organic depot quickly becoming a scarce commodity in today's environment of downsizing and streamlining, Navy and Marine Corp personnel are assuming more of the duties and responsibilities of the depot. The Common Munitions BIT Reprogramming Equipment (CMBRE) and Mobile Power Conditioning Unit (MPCU) embody all the elements of this new BIT and reprogramming process. The Joint Direct Attack Munitions (JDAM) was the first smart weapon, which used the CMBRE/MPCU system and is currently deployed on U.S. ships and military facilities located throughout the world. The JDAM program was also the first to employ ship ordnance personnel to BIT and reprogram \"live\" smart weapons on board ship. This paper offers a management perspective into how this new approach is being accomplished as the Navy boldly leads the way into the 21st century.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123557505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A commercial approach for designing synthetic instrumentation - serial bus test instrument 综合仪表的一种商用设计方法——串行总线测试仪
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047879
S. Fairbanks
{"title":"A commercial approach for designing synthetic instrumentation - serial bus test instrument","authors":"S. Fairbanks","doi":"10.1109/AUTEST.2002.1047879","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047879","url":null,"abstract":"The current implied requirement in instrumentation design is coercing commercial instrumentation suppliers into providing as much functionality as possible within as little physical space as possible. A number of design methods are needed to effectively deliver this, including miniaturization and a tight integration of digital and analog functionality. Another result is the introduction of instrumentation that can provide more than one capability.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115274770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Flexible digital demodulation/integrating simulation software with measurement hardware 灵活的数字解调/集成仿真软件与测量硬件
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047876
B. Zarlingo, K. Kalbasi, G. Jue
{"title":"Flexible digital demodulation/integrating simulation software with measurement hardware","authors":"B. Zarlingo, K. Kalbasi, G. Jue","doi":"10.1109/AUTEST.2002.1047876","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047876","url":null,"abstract":"Digitally modulated signals are now an important part of most modern RF/microwave communications systems. Analysis and troubleshooting of digitally modulated signals in the presence of high frequency effects typically require specialized hardware and firmware/software. In the past decade, the commercial wireless industry has evolved with a number of standards specifications and a rich set of digital modulation analysis tools due to its phenomenal growth. The authors have been involved in integrating design and simulation software measurement and analysis instrumentation for these standard specifications. These tools make testing and troubleshooting at various phases of the product development cycle faster, easier and more powerful. The same set of tools and methodologies can also be applied to the aerospace/defense industry, where open and standards-based technologies are not common. This paper will describe how existing design and test solutions can be combined to support various digital modulation techniques, bringing to the aerospace/defense many of the benefits now enjoyed by the wireless industry.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124889445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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