{"title":"IVI class specifications and programming methodologies","authors":"D. Chejj","doi":"10.1109/AUTEST.2002.1047904","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047904","url":null,"abstract":"This paper describes the recently completed Interchangeable Virtual Instruments (IVI) Foundation specifications, concentrating on the instrument class specifications. The paper describes the process by which the foundation chooses and defines an instrument class specification, how that specification is structured, the instrument capabilities that it supports, and its implication on software instrument drivers. The paper also explores how drivers developed according to these class specifications can be used in a variety of development environments including LabVIEW, LabWindows/CVI, and Visual Studio. Finally, the paper explores the relationship between the class specifications, drivers that conform to those specifications, and the goal of achieving instrument interchangeability.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127190865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Evaluation of economics of testing in a manufacturing environment","authors":"R. Curry","doi":"10.1109/AUTEST.2002.1047914","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047914","url":null,"abstract":"In the manufacture of complex electro-mechanical devices, testing operations are instituted at many points in the process. The primary purpose of these test operations is to ensure a minimum number of faulty products propagate to the next level of assembly and that the corresponding test yield at that level of assembly is sufficient. The recurring and non-recurring expense of each of these test operations can be high but often the real cost is not. well understood. Similarly, a reduction of yield at an assembly operation is qualitatively understood to be costly but a quantitative assessment of this cost is not commonly performed. This paper proposes a model to assist in performing the cost-benefit trades that must be made when developing or evaluating a manufacturing test flow. Using a ground assumption defining the conditions required to justify a test operation, a general mathematical model is developed. This model seeks to quantify the cost of the test operation, the incremental cost of yield changes and the relationship of the topology of the assembly network in order to predict whether the specific set of conditions warrant a test. The general model is then used to explore some realworld scenarios, resulting in some surprising conclusions. A model template is provided to guide others in evaluating test economics in their environments.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133519766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Naval test equipment, following in the shadow of the weapons systems","authors":"M. Kaufman, M. Olea, Z. Zakarian","doi":"10.1109/AUTEST.2002.1047897","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047897","url":null,"abstract":"The need for a rigorous testing program is, in fact, greater today than in the past. Weapons systems. are considerably more complex than in the 1970s. These systems are also much more capable and greater reliance is placed on each individual weapon each firing. \"One shot, one kill\" is now a requirement. The long draw down on US DoD funding has had an effect on weapon system readiness and an equally significant effect on the test equipment used to support the weapon systems. The test equipment is facing many of the same challenges as the weapons systems themselves. The cost of maintaining the test equipment is going up rapidly as obsolescence issues grow. Personnel familiar with the equipment are leaving or retiring and replacing them is increasingly difficult. Test equipment support is often cut to meet program funding reductions. The recent increase in defense spending has yielded some hope of improvement in the state of test equipment. The future of legacy test equipment remains unclear. This paper presents a broad overview of test equipment used to support US Navy production programs. The state of the test systems, the challenges of supporting the test systems, and some of the solutions used are covered.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134152389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A unified interface for signal-oriented control of instruments and switches","authors":"S. Gal, I. Neag","doi":"10.1109/AUTEST.2002.1047903","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047903","url":null,"abstract":"The signal-based testing paradigm, which reduces the impact of instrument obsolescence, is typically implemented via software architectures that encapsulate instrument-specific code in signal drivers. The paper describes the design of a signal driver interface and an extension of this design that enables the uniform treatment of instruments and switches. The unified interface supports the control of switches found inside instruments, and the modeling of signal transmission capabilities of switches and signal paths. Its use has the potential to lower software development costs. by reducing the number of different interfaces in Automatic Test Systems.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127632688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Programmable real time bus emulation with real time data update","authors":"J. Beat","doi":"10.1109/AUTEST.2002.1047878","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047878","url":null,"abstract":"To meet the bus emulation requirements for digital avionics many Automatic Test Equipment (ATE) and/or Test Program Set (TPS) suppliers must design peculiar hardware in test stations or Interface Test Adapters (ITAs) to meet real time bus emulator requirements. Recently, BAE SYSTEMS Mission Solutions completed a rehost of the Central Electronics Unit (CEU) Line Replaceable Unit (LRU) TPS for the LANTIRN (Low Altitude Navigation and Targeting Infra-red for Night) Targeting Pod. This paper details how BAE SYSTEMS was able to implement this complex TPS requirement with their General Purpose Bus Emulator Card, eliminating the need for peculiar interface hardware contained in the Legacy ITA.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116113716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ultrahigh reliability US Army missiles and munitions","authors":"T. Erickson, W. E. Shankle, S. Marotta","doi":"10.1109/AUTEST.2002.1047953","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047953","url":null,"abstract":"Provides an overview of U.S. Army requirements necessary for missiles and munitions to survive and operate in extreme environments with ultrahigh reliability. Long-term storage of assets, exposure to harsh environments, and requirements for high reliability with minimum field checks are significant concerns for Army missiles and munitions. These concerns warrant investigation into new and advanced techniques that provide health monitoring and prognostics capability, as well as robust design. In the past, missiles and munitions were commonly stored for long periods of time within the various military depot environments. In the present Army, however, missiles and munitions can expect deployment into a theater of operations and subsequent return to stocks for a potential future deployment. These deployments are expected to occur several times during an asset's life cycle, with extremes being experienced for each deployment due to handling, transportation, and theater storage. Therefore, the potential detrimental affects which a missile and/or munition will likely encounter must be understood and accounted for in its design and fielding so that its war fighting capability and readiness can be assured. Ultrahigh reliability of weapon systems is a critical requirement for the transformed Army to quickly enable a lethal and decisive battle force. This presentation will define ultra-reliability as it relates to missiles and munitions. Approaches to achieving ultra-reliability will be discussed, including joint efforts by the Department of Defense and the Department of Energy in modeling materials aging phenomena.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"162 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116298965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An electrical current flow technology for the next generation of automated testing equipment","authors":"K. Fitzgibbon, L. Kirkland, N. Flann, N. Wilson","doi":"10.1109/AUTEST.2002.1047956","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047956","url":null,"abstract":"This paper presents a technology to measure and analyze electrical current (EC) flow in units-under-test (UUT). The paper discusses the results of preliminary investigations and high-level design specifications that will lead to the development of a prototype to demonstrate the concepts and the benefits of using EC data and information. Non-intrusive and intrusive sensor technology, and experimental results are presented. The characteristics and benefits of each sensor and technology are discussed. EC measurements are characterized by collection and domain types, and include time-domain signatures and single/multiple signals, and frequency-domain power spectral density (PSD) functions. EC data is then applied to neural network (NN) algorithms to provide pass/fail test results. The paper discusses NN methods of learning and processing for the different classes of signals. The methods and technologies discussed here introduce a valuable capability for test equipment operators, repair technicians, and test software engineers in the next generation of automated testing equipment (ATE).","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124756602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Bagnasco, M. Chirico, A. M. Scapolla, E. Amodei
{"title":"XML data representation for testing automation","authors":"A. Bagnasco, M. Chirico, A. M. Scapolla, E. Amodei","doi":"10.1109/AUTEST.2002.1047933","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047933","url":null,"abstract":"XML (eXtensible Markup Language) technologies seem to offer solutions for a wide range of automated testing issues. In fact, these technologies are very promising to address scalability and interoperability among distributed software applications and to facilitate reuse ensuring data coherency, completeness and reliability. In this paper we discuss the use of XML for representing the whole set of information regarding configuration and classification data involved with a software environment for test automation. Thus we introduce a case study where the effectiveness of this approach was used to face the automated testing of telecommunication device.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128399705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling complex signals using basic signal components","authors":"D. Delaney, C. Gorringe","doi":"10.1109/AUTEST.2002.1047910","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047910","url":null,"abstract":"One of the fundamental problems encountered by test engineers is that of balancing the desire to use standard signal descriptions against the flexibility offered by those tailored to a specific application. This paper looks at a new approach to providing the flexibility of a tailored description but by using standard, mathematically rigorous, building blocks; the aim of this approach is to provide consistent definitions that can be easily recreated on any test hardware possessing the required performance envelope.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125888710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Flexible automatic supervision in industrial manufacturing","authors":"L. Wang, Y. Chen","doi":"10.1109/AUTEST.2002.1047951","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047951","url":null,"abstract":"The work reported in the paper is concerned with the development and a case study of the flexible supervisory software for industrial manufacturing based on the reconfiguration concept. The role of the flexible supervisory software in industrial measurement and control systems is introduced first and then the reconfiguration-based approach to industrial supervisory software is discussed in detail. A real-world application is also presented as a case study to demonstrate the effectiveness of the proposed design approach.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130657132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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