{"title":"使用基本信号组件建模复杂信号","authors":"D. Delaney, C. Gorringe","doi":"10.1109/AUTEST.2002.1047910","DOIUrl":null,"url":null,"abstract":"One of the fundamental problems encountered by test engineers is that of balancing the desire to use standard signal descriptions against the flexibility offered by those tailored to a specific application. This paper looks at a new approach to providing the flexibility of a tailored description but by using standard, mathematically rigorous, building blocks; the aim of this approach is to provide consistent definitions that can be easily recreated on any test hardware possessing the required performance envelope.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Modeling complex signals using basic signal components\",\"authors\":\"D. Delaney, C. Gorringe\",\"doi\":\"10.1109/AUTEST.2002.1047910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"One of the fundamental problems encountered by test engineers is that of balancing the desire to use standard signal descriptions against the flexibility offered by those tailored to a specific application. This paper looks at a new approach to providing the flexibility of a tailored description but by using standard, mathematically rigorous, building blocks; the aim of this approach is to provide consistent definitions that can be easily recreated on any test hardware possessing the required performance envelope.\",\"PeriodicalId\":372875,\"journal\":{\"name\":\"Proceedings, IEEE AUTOTESTCON\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings, IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2002.1047910\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings, IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2002.1047910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling complex signals using basic signal components
One of the fundamental problems encountered by test engineers is that of balancing the desire to use standard signal descriptions against the flexibility offered by those tailored to a specific application. This paper looks at a new approach to providing the flexibility of a tailored description but by using standard, mathematically rigorous, building blocks; the aim of this approach is to provide consistent definitions that can be easily recreated on any test hardware possessing the required performance envelope.