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Non-uniformity correction and calibration of a portable infrared scene projector 便携式红外场景投影仪的非均匀性校正与标定
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047880
T.H. Kelly
{"title":"Non-uniformity correction and calibration of a portable infrared scene projector","authors":"T.H. Kelly","doi":"10.1109/AUTEST.2002.1047880","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047880","url":null,"abstract":"A key attribute of any tester for FLIR systems is a calibrated uniform source. A uniform source ensures that any anomalies in performance are artifacts of the FLIR being tested and not the tester. Achieving a uniform source from a resistor array based portable infrared scene projector requires implementation of nonuniformity correction algorithms instead of controlling the bonding integrity of a source to a cooler, and the coating properties of the source typical of a conventional blackbody. The necessity to perform the non-uniformity correction on the scene projector is because the source is a two-dimensional array comprised of discrete resistive emitters. Ideally, each emitter of the array would have the same resistance and thus produce the same output for a given drive current. However, there are small variations from emitter to emitter over the thousands of emitters that comprise an array. Once a uniform output is achieved then the output must be calibrated for the system to be used as test equipment. Since the radiance emitted from the monolithic array is created by flowing current through micro resistors, a radiometric approach is used to calibrate the differential output of the scene projector over its dynamic range. The focus of this paper is to describe the approach and results of implementing non-uniformity correction and calibration on a portable infrared scene projector.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129213447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
How the Internet is transforming test and measurement 互联网是如何改变测试和测量的
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047916
P. M. Ostrow
{"title":"How the Internet is transforming test and measurement","authors":"P. M. Ostrow","doi":"10.1109/AUTEST.2002.1047916","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047916","url":null,"abstract":"The Internet will have a profound effect on the future of the test and measurement industry. Web-based communication of data will become more commonplace and more important to engineers as they are required to share such information. The Internet not only automates measurement procedures but also allows the information to be shared on a global scale. Users can achieve efficiency that has not existed before. The Internet both as a sales tool and a separate sales channel will continue to drive down costs and increase productivity. Today's more advanced online commerce environments give a prospective customer the power to evaluate equipment for performance and options, comparatively price products, configure instruments, determine availability and choose from sizable databases of new and used equipment for rent, lease, and purchase.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134497523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A design pattern to encapsulate measurement uncertainty in reusable instrumentation modules 在可重用的仪器模块中封装测量不确定性的设计模式
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047949
B. Hall
{"title":"A design pattern to encapsulate measurement uncertainty in reusable instrumentation modules","authors":"B. Hall","doi":"10.1109/AUTEST.2002.1047949","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047949","url":null,"abstract":"A method of encapsulating and propagating measurement uncertainty information in modular instrumentation systems is described. The technique is simple to implement and fully compliant with international best practice. Measurement uncertainty is a fundamental aspect of any measurement system and is currently difficult to manage when systems are subjected to configuration changes. The technique could provide a significant step forward in maintaining the integrity of complex systems.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131553717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Using device ATE testers to solve system anomalies 使用设备ATE测试仪解决系统异常
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047947
J. Swail
{"title":"Using device ATE testers to solve system anomalies","authors":"J. Swail","doi":"10.1109/AUTEST.2002.1047947","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047947","url":null,"abstract":"This is a report of an electronic anomaly that occurred on an EEPROM that was operating in a laboratory mockup where there was limited control of timing and voltage levels. The electronic signals to the EEPROM were recreated on automatic test equipment where the symptoms of the anomaly were duplicated. Additional tests were done to solve the anomaly. The anomaly was caused by interrupt driven computer software that was writing to the part using out of specification timing.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133937223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Operating, monitoring and controlling plant components over cyberspace 通过网络空间操作、监测和控制工厂部件
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047968
M. Naghedolfeizi, Sanjeev Arora
{"title":"Operating, monitoring and controlling plant components over cyberspace","authors":"M. Naghedolfeizi, Sanjeev Arora","doi":"10.1109/AUTEST.2002.1047968","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047968","url":null,"abstract":"In recent years, nearly every industry has increasingly implemented computer based measurement, instrumentation and automation technologies to control, operate, and/or monitor various plant components of industrial equipment. This has also resulted in a paradigm shift from analog to digital technologies that are suitable for communications over the Internet, Web or networked computer systems. This paper presents a methodology for remote operation and monitoring of plant components through the Internet/Web. The Internet interfacing technologies have been examined through an experimental setup used at Fort Valley State University to perform remote experiments via the Internet. The setup is a motor-generator station that can be fully operated, monitored and controlled by computer systems using Virtual Instrument programs written in LabVIEW. It also features on-line capabilities that allow users to fully operate and monitor it remotely through the Internet. The paper also addresses typical technological concerns and challenges regarding safety and security measures as well as real-time operation.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"123 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129502710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Results using trend analysis for predicting automotive maintenance needs 应用趋势分析预测汽车维修需求的结果
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047962
J. R. Miller
{"title":"Results using trend analysis for predicting automotive maintenance needs","authors":"J. R. Miller","doi":"10.1109/AUTEST.2002.1047962","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047962","url":null,"abstract":"This organization supports the US Army Test Measurement and Diagnostic Equipment Product Manager in a project called ADIP, Army Diagnostic Improvement Program. We provide engineering support by gathering and analyzing data from several vehicles. Such measurements as oil pressure, fuel pressure, compression unbalance, starter current, battery internal resistance, etc, are made. Our aim is to predict changes in these parameters to prevent unscheduled downtime and to fix small problems before they become larger. Explanation of the math used will be given. Use of the requirement tolerance placed as plus or minus bounds around the last measurement and the extrapolated trend line to produce time to exceedance will be described. Using some preliminary data it will be shown how to establish sampling intervals. Using these techniques we have found that for the data available the sample interval is about four (4) months. A number of problems that tend to obscure trends have been identified, studied, and solutions found. A few examples will illustrate some of these. Since the trend analysis is based on historical data from individual vehicles the results apply to that vehicle only. As more vehicles from that family are studied certain family traits emerge hence one may establish general family features.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129570133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Signal definition and test description - an IEEE standard 信号定义和测试描述- IEEE标准
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047907
K. Ellis, D. Delaney
{"title":"Signal definition and test description - an IEEE standard","authors":"K. Ellis, D. Delaney","doi":"10.1109/AUTEST.2002.1047907","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047907","url":null,"abstract":"This paper presents a summary of the new Signal Definition and Test Description Standard (SDTD) to be published by the IEEE. SDTD represents a radical departure from previous approaches to test description, in that it no longer simply represents a test language, as typified by ATLAS standards such as IEEE Std. 716 1995. Instead it provides a framework for component libraries of signal descriptions, which can be readily deployed in today's Automatic Test Systems (ATS) with other standards such as the IVI Signal Interface from the IVI foundation. The other major benefit of this Standard is the ease with which users can extend the signal types to describe emerging technologies and their associated signal requirements.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122490061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
UUT test requirements capture in any language you like... and still compliant with the IEEE Signal definition and test description standard UUT测试需求捕获在任何语言你喜欢…并且仍然符合IEEE信号定义和测试描述标准
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047909
K. Ellis, C. Gorringe, J. Langlois
{"title":"UUT test requirements capture in any language you like... and still compliant with the IEEE Signal definition and test description standard","authors":"K. Ellis, C. Gorringe, J. Langlois","doi":"10.1109/AUTEST.2002.1047909","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047909","url":null,"abstract":"This paper examines how to create consistent, portable, usable UUT requirement specifications utilizing COTS computer languages such as Basic, Java, C or C++. It goes on to describe the benefits of using standard, common building blocks that represent signals, and identifies the importance of allowing users to extend their own signal components. It concludes by showing several examples of the same, real requirement captured in different languages, and how these can be ported from one to another.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124854654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enveloping test requirements across product life cycle phases 贯穿产品生命周期阶段的测试需求
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047900
J. Lohse, T. D. Trimpe
{"title":"Enveloping test requirements across product life cycle phases","authors":"J. Lohse, T. D. Trimpe","doi":"10.1109/AUTEST.2002.1047900","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047900","url":null,"abstract":"With the total cost of test increasing over the life cycle of a product, there is an urgent need to \"reduce the cost of test\". This concept does not just address the high cost of test equipment, but rather looks at all aspects of test from requirements generation, to development, production, and post-production support at a depot or in the field. These aspects must be integrated together using a systems engineering approach. The result will be multiple requirements for the various test aspects. All these requirements must be gathered at the earliest stages of a program. In order to ensure that these test requirements are met over the life of the product, they need to be enveloped, or made broad enough to cover the spectrum of requirements that is required over the life cycle.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121872552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Real-time, embedded diagnostics and prognostics in advanced artillery systems 实时，嵌入式诊断和预测在先进的火炮系统
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047963
M. Araiza, R. Kent, R. Espinosa
{"title":"Real-time, embedded diagnostics and prognostics in advanced artillery systems","authors":"M. Araiza, R. Kent, R. Espinosa","doi":"10.1109/AUTEST.2002.1047963","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047963","url":null,"abstract":"This paper explores an integrated modeling and reasoning approach to real-time, embedded diagnostics and prognostics called the Armament Diagnostic And Prognostic Tool (ADAPT). In addition, an approach for using the real-time diagnostic and prognostic information for degraded operation control of armament systems is described. The application focus of this paper is on advanced armament system gun mounts; however, the ADAPT approach has general applicability to a large class of complex systems. It is powered and enabled by the integration of three modeling and reasoning technologies Prognostics Framework (PF) model-based reasoning, Statistical Network (StatNet) modeling, and a time domain gun mount simulation. The model embodied in the PF reasoning is called a fault/symptom matrix, which is a connectivity matrix that represents the linkages of anomalies or faults (rows in the matrix) to observable measurements and the coverage of tests that pass or fail (columns in the matrix). StatNet is a modeling algorithm in the ModelQuest Analyst data mining tool. This algorithm combines the effective 'network of functions' concept in neural networks with proven statistical learning techniques.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129152204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
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