Using device ATE testers to solve system anomalies

This is a report of an electronic anomaly that occurred on an EEPROM that was operating in a laboratory mockup where there was limited control of timing and voltage levels. The electronic signals to the EEPROM were recreated on automatic test equipment where the symptoms of the anomaly were duplicated. Additional tests were done to solve the anomaly. The anomaly was caused by interrupt driven computer software that was writing to the part using out of specification timing.