Proceedings, IEEE AUTOTESTCON最新文献

筛选
英文 中文
Intermediate level maintenance Fibre Channel testing 中级维护光纤通道测试
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047918
C. Barker
{"title":"Intermediate level maintenance Fibre Channel testing","authors":"C. Barker","doi":"10.1109/AUTEST.2002.1047918","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047918","url":null,"abstract":"Fibre Channel (FC) has been identified as the next avionic communication architecture to complement, and in some cases, replace an over-burdened MIL-STD-1553 architecture. Despite the availability of FC commercial standards, a. common maintenance approach has not surfaced among the multitude of military avionic manufacturers. As a result, there is no clear definition of intermediate level maintenance testing of FC communication architectures as the definition is applied to military avionic equipment. This paper identifies the FC intermediate level maintenance challenges and formulates a viable solution for intermediate level testing that does not exist today. This maintenance solution transfers commercial practices into a military environment by establishing a basic support capability through the use of standardized commercial equipment and processes and then modifies those processes to build a generic, military test methodology.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129814370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
COTS VXI hardware combats obsolescence and reduces cost COTS VXI硬件对抗过时并降低成本
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047889
T. Sarfi
{"title":"COTS VXI hardware combats obsolescence and reduces cost","authors":"T. Sarfi","doi":"10.1109/AUTEST.2002.1047889","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047889","url":null,"abstract":"Many programs are currently faced with the problem of having to support production of hardware beyond the life span of some of the equipment used to test it. This presents a multitude of problems in that it is undesirable to make any changes that would result in the need to modify existing application code that has been in the field and working for many years. The Tektronix decision to make its VXI hardware obsolete, for example, left many users who had standardized on their hardware looking for alternatives. However, obsolescence is not isolated to any particular company or instrumentation bus, and challenges are frequently presented in trying to find replacement hardware. This paper focuses on commercially available solutions for replacing obsolete hardware. This includes, but is not limited to, emulating firmware sets on functionally similar COTS products, vendor-developed translation driver sets, drop-in replacements and device drivers. Advantages of each are explained, with detailed explanations of each implementation.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131418321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
DiagML - an interoperability platform for test and diagnostics software DiagML -测试和诊断软件的互操作性平台
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047942
E. Gould, D. Hartop, E. Lee, I. Neag
{"title":"DiagML - an interoperability platform for test and diagnostics software","authors":"E. Gould, D. Hartop, E. Lee, I. Neag","doi":"10.1109/AUTEST.2002.1047942","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047942","url":null,"abstract":"The integration of diagnostic software and test execution environments developed by different vendors requires a common data exchange format. The paper describes a new format based on XML, called the Diagnostic Modeling Language (DiagML). This format is currently used for integrating software applications developed by DSI International and TYX Corporation. The design-to-test process supported by DiagML is illustrated through a diagnostic application for a simple analog circuit.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134142470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
The selected problems of functional testing the ISDN multifunctional terminals ISDN多功能终端功能测试的选择问题
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047919
J. Turczyński, P. Lubkowski
{"title":"The selected problems of functional testing the ISDN multifunctional terminals","authors":"J. Turczyński, P. Lubkowski","doi":"10.1109/AUTEST.2002.1047919","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047919","url":null,"abstract":"Implementing the PPP protocol in ISDN networks results in widening the range of services offered in these networks, but it also creates the necessity to identify principles of co-operation for the ISDN-Internet interface. These principles are in turn required for verifying correctness of ISDN network terminals operation. The Paper presents the overviews of current state of standardising European ISDN networks taking into account their co-operation with the PPP protocol. It contains selected issues on testing multi-functional ISDN network terminals using the PPP protocol for accessing the Internet network. It presents also the suggested methodology for conformance tests verifying cooperation of ISDN devices using the PPP protocol.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117280508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The IVI open architecture driver specifications IVI开放体系结构驱动程序规范
Proceedings, IEEE AUTOTESTCON Pub Date : 2002-12-10 DOI: 10.1109/AUTEST.2002.1047905
J. Mueller
{"title":"The IVI open architecture driver specifications","authors":"J. Mueller","doi":"10.1109/AUTEST.2002.1047905","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047905","url":null,"abstract":"This paper describes the IVI open architecture standard which provides the basic driver standardization that makes IVI drivers easy to learn and use. It provides an overview of the open architecture specifications and describes how they impact the tasks of system developers.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130332831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Mobile extended spectrum electro-optical test set 移动扩展频谱电光测试仪
Proceedings, IEEE AUTOTESTCON Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2002.1047881
R. W. Priddy, E. E. Burroughs, D. B. Beasley, M. A. Manzardo
{"title":"Mobile extended spectrum electro-optical test set","authors":"R. W. Priddy, E. E. Burroughs, D. B. Beasley, M. A. Manzardo","doi":"10.1109/AUTEST.2002.1047881","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047881","url":null,"abstract":"Classical electro optical automated test equipment (EO ATE) inherently has several design limitations due to trying to satisfy the entire EO spectrum requirements. Problems such as a fixed number of targets, ease in changing stimulus and measurement devices and finally, reconfiguring to cover multiple sensor fields-of-view yields a tester that compromises the support of the individual needs of many units under test (UUTs). In addition, targets are static with no dynamic scene projection of realistic, in-band targets in a clutter background environment (targets in defilade, moving targets, smoke, dust, rain, fog, etc.). The Developmental Test Command has a major instrumentation development with Simulation, Training and Instrumentation Command (STRICOM) for a mobile extended spectrum electro-optical test capability as part of the Mobile Infrared Scene Projection (MIRSP) program. A prototype system that utilizes the Texas Instruments (TI) digital micro-mirror device (DMD/spl trade/) to project both static and dynamic targets to the UUT is currently under development. This EO tester is modular and programmable allowing the target stimulus sub-system to interface with existing and future optical systems required to support Army sensors across multiple fields-of-view. Targets are defined/programmed in software, and then \"replicated\" using the DMD for presentation to the UUT within microseconds. The EO ATE supports typical laboratory tests as well as dynamic scene projection to EO sensors. This paper describes the new design techniques implemented to transform standard EO UUT testing as well as scene projection in spectral bands continuous from 0.2 to 14 micrometer (/spl mu/m) wavelengths. In addition, other innovative techniques have been incorporated to address problems inherent in current EO ATE designs.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129761390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Non-invasive current measurement pulsed electron system and measurement techniques 无创电流测量脉冲电子系统及测量技术
Proceedings, IEEE AUTOTESTCON Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2002.1047920
K. F. Wille, K. Fitzgibbon
{"title":"Non-invasive current measurement pulsed electron system and measurement techniques","authors":"K. F. Wille, K. Fitzgibbon","doi":"10.1109/AUTEST.2002.1047920","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047920","url":null,"abstract":"This paper explains the theory, manufacture, and techniques for practical use of a non-invasive measurement sensor for electrical current in wires, cables, component leads, and traces in printed circuit boards. All current established technologies used for this purpose exhibit technical weaknesses, as well as the technical strengths for which they are chosen. Some technical weaknesses exhibited include low response to both AC and DC currents, high sensitivity to magnetic noise, difficulty in repeatability, and low effectiveness in areas densely populated with current carriers, e.g. PCBs. The proposed hardware sensor system measures the deflection of a pulsed stream of electrons generated from a low voltage electro-optical source. The concept of electron beam deflection is not innovative in itself, but is largely unexplored for the measurement of magnetic fields, specifically magnetic fields generated by current carriers. Therefore this sensor has the potential to exhibit strengths and weaknesses different from established technologies. The techniques for measurement procedures to be used in conjunction with analytical software to be included in a potential current sensing system has the probability of providing additional strengths to both the proposed pulsed electron sensor, and the sensors of established technologies.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"158 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121529191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Collaborative testing and support using the Internet 使用互联网进行协作测试和支持
Proceedings, IEEE AUTOTESTCON Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2002.1047970
K. Berk, K. F. Wille
{"title":"Collaborative testing and support using the Internet","authors":"K. Berk, K. F. Wille","doi":"10.1109/AUTEST.2002.1047970","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047970","url":null,"abstract":"The Internet and its current infrastructure provide many opportunities to exploit improved electronics testing by increasing collaboration among individuals worldwide. This paper proposes several ways to take advantage of the ubiquitous Internet infrastructure, its applications, and increasing network bandwidth to better share knowledge between engineering and test technicians, and to build and maintain a network of knowledge sharing among test and maintenance technicians in geographically separated units. Current Internet infrastructure applications that are available and being used in an ad hoc manner are email, instant messaging, video conferencing and remote control of PCs. These applications can be used by the military to integrate and enhance communications methods and improve the sharing of data as well as remote control of automatic test equipment by engineers providing diagnostic assistance. Knowledge management techniques will be exploited to provide capture of and better access to \"head knowledge\" which typically stays within an individual technician or engineer. Collection of repair and test data in real time from geographically dispersed locations can be implemented via the Internet. Engineering can be more responsive in updating TPS software by having more information and in turn distribute the updates via the Internet by providing access to a secure server.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116738465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ATE life extension using emulated peripheral devices 使用仿真外围设备延长ATE寿命
Proceedings, IEEE AUTOTESTCON Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2002.1047917
J. C. Dahl, D. Dunn
{"title":"ATE life extension using emulated peripheral devices","authors":"J. C. Dahl, D. Dunn","doi":"10.1109/AUTEST.2002.1047917","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047917","url":null,"abstract":"The old super-minicomputer systems that are tucked away inside many of the world's Automatic Test Equipment (ATE) workstations are often 10 to 30 years old. These sturdy and reliable legacy computers - built in an era when the cost of a system regularly exceeded a half million dollars - tend to run reasonably well and in most cases, spare system parts are still available. One glaring weakness that the majority of these minicomputers share is failing peripheral devices mainly the disk drives and tape drives.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"2000 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116883496","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A case for flight line testing of EW suites meeting the war fighter's need "a strike mission situational awareness issue" 满足作战人员需要的电子战套件飞行线测试案例“打击任务态势感知问题”
Proceedings, IEEE AUTOTESTCON Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2002.1047957
K. Voigt, Kathleen R. Bendot
{"title":"A case for flight line testing of EW suites meeting the war fighter's need \"a strike mission situational awareness issue\"","authors":"K. Voigt, Kathleen R. Bendot","doi":"10.1109/AUTEST.2002.1047957","DOIUrl":"https://doi.org/10.1109/AUTEST.2002.1047957","url":null,"abstract":"The Electronic Warfare Operational Advisory Group (EW, OAG) presented {again, this year} that a significant need has arisen from the war-fighter and user community to test and confirm the various EW systems in our operational platforms in a quick, efficient and cost effective manor. There are at least eleven (11) discrete threats identified which are 100% lethal against US tactical aircraft. Situational awareness on-board tactical aircraft is essential to our war-fighters' survival. We base this situational awareness on Radar Warning Receivers detecting and alerting the pilot of lethal threats in time to react to them, as well as an active jammer capability towards these and other threat signals. We have observed in numerous years of experience, with the current fleet of tactical aircraft, many tens of thousands of maintenance actions related to EW systems. The data on these actions reveal a multitude of system failures that went initially undetected or misdiagnosed. The result is at least unknown to the pilot that he has a reduced EW capability, in terms of range or as basic as actual functionality of these systems. This places the war-fighter at extreme risk for he expects these systems to perform when they, in fad, may not. It is easy to see the critical nature of this need of this surety. A flight line test concept would verify the systems effectiveness or at least its functionality. Functionality that escaped the system's or a subsystem's ability to detect through BIT. The continued experiences of inadequate BIT testing, both in the new systems but, more importantly, in the existing legacy systems is reality. These elements, in fact, are where the greatest occurrence of failures in the system performance and yet we have no method of detecting them on a real time, nonintrusive way. Mission accomplishment is placed at risk and lives in jeopardy.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124257822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信