{"title":"DiagML -测试和诊断软件的互操作性平台","authors":"E. Gould, D. Hartop, E. Lee, I. Neag","doi":"10.1109/AUTEST.2002.1047942","DOIUrl":null,"url":null,"abstract":"The integration of diagnostic software and test execution environments developed by different vendors requires a common data exchange format. The paper describes a new format based on XML, called the Diagnostic Modeling Language (DiagML). This format is currently used for integrating software applications developed by DSI International and TYX Corporation. The design-to-test process supported by DiagML is illustrated through a diagnostic application for a simple analog circuit.","PeriodicalId":372875,"journal":{"name":"Proceedings, IEEE AUTOTESTCON","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"DiagML - an interoperability platform for test and diagnostics software\",\"authors\":\"E. Gould, D. Hartop, E. Lee, I. Neag\",\"doi\":\"10.1109/AUTEST.2002.1047942\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The integration of diagnostic software and test execution environments developed by different vendors requires a common data exchange format. The paper describes a new format based on XML, called the Diagnostic Modeling Language (DiagML). This format is currently used for integrating software applications developed by DSI International and TYX Corporation. The design-to-test process supported by DiagML is illustrated through a diagnostic application for a simple analog circuit.\",\"PeriodicalId\":372875,\"journal\":{\"name\":\"Proceedings, IEEE AUTOTESTCON\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings, IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2002.1047942\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings, IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2002.1047942","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
DiagML - an interoperability platform for test and diagnostics software
The integration of diagnostic software and test execution environments developed by different vendors requires a common data exchange format. The paper describes a new format based on XML, called the Diagnostic Modeling Language (DiagML). This format is currently used for integrating software applications developed by DSI International and TYX Corporation. The design-to-test process supported by DiagML is illustrated through a diagnostic application for a simple analog circuit.