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A fully customized hardware system for ultra-fast feedback-controlled electromigration using FPGA 一个完全定制的基于FPGA的超快速反馈控制电迁移硬件系统
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6968058
Yuma Kanamaru, M. Ando, R. Suda, J. Shirakashi
{"title":"A fully customized hardware system for ultra-fast feedback-controlled electromigration using FPGA","authors":"Yuma Kanamaru, M. Ando, R. Suda, J. Shirakashi","doi":"10.1109/NANO.2014.6968058","DOIUrl":"https://doi.org/10.1109/NANO.2014.6968058","url":null,"abstract":"Electromigration (EM) method for the fabrication of nanogaps is specifically simple as compared with other methods because it is achieved by only passing a current through a metal nanowire. However, typical EM procedure induces an abrupt break that yields a nanogap with high tunnel resistance. Hence, various approaches have been reported to address this problem, and feedback-controlled electromigration (FCE) scheme has been successfully employed to make nanogaps safely and reliably. On the other hand, the formation of nanogaps by FCE method using a microprocessor-based controller with a general purpose operating system is considerably slow process. In this study, we designed a new system using field programmable gate array (FPGA). Furthermore, we applied this system to Au μm-wires. Consequently, the FCE experiments using FPGA-based control system were performed at 20 μsec of deterministic loop time. In addition, conductance was precisely controlled and adjusted from 10 mS to less than 77.5 μS for within 1 sec, which is 102-3 times shorter than that of conventional FCE procedure using microprocessor-based control system.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114594022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Nanotoxicology and safety evaluation of nanomedicines 纳米药物的纳米毒理学和安全性评价
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6968164
L. Manzo
{"title":"Nanotoxicology and safety evaluation of nanomedicines","authors":"L. Manzo","doi":"10.1109/NANO.2014.6968164","DOIUrl":"https://doi.org/10.1109/NANO.2014.6968164","url":null,"abstract":"In the last years, advanced toxicological methods and new research approaches have been proposed to improve and refine safety assessment of nanomaterials. High-throughput technologies, molecular markers, molecular imaging, and other tools originated from advanced research in nanotoxicology offer an exciting opportunity to improve the efficacy and predictivity of toxicity testing for candidate nanomedicines. Testing based on these novel research technologies can be conducted at low, clinically relevant doses focusing on what really represents an “adverse” response or a reliable indicator of adverse health outcome. When applied to candidate nanomedicines, this modern vision of toxicity testing can valuably contribute to address safety concerns, reduce regulatory uncertainties, expedite drug development, and sustain translation of nanotechnology enabled products to the clinic.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114860822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Gas-sensing properties of multi-walled carbon-nanotube sheet decorated with cobalt oxides 钴氧化物修饰多壁碳纳米管片的气敏性能
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6968162
D. Jung, Maeum Han, Jinhong Kim, Gil S. Lee
{"title":"Gas-sensing properties of multi-walled carbon-nanotube sheet decorated with cobalt oxides","authors":"D. Jung, Maeum Han, Jinhong Kim, Gil S. Lee","doi":"10.1109/NANO.2014.6968162","DOIUrl":"https://doi.org/10.1109/NANO.2014.6968162","url":null,"abstract":"A hybrid, nanocomposite carbon nanotube (CNT) sheet decorated with cobalt oxide (Co<sub>3</sub>O<sub>4</sub>) serving as gas sensor was fabricated for detecting hydrogen (H<sub>2</sub>). In order to improve performance of the sensor, Co<sub>3</sub>O<sub>4</sub> nanoparticles were decorated on the surface area of the CNT sheets by electrodeposition, which is an easy and simple method for fabricating hybrid composites. Moreover, the effect of surface area on sensitivity of CNT/Co<sub>3</sub>O<sub>4</sub> composite was further investigated, and we found the mean sizes of the Co<sub>3</sub>O<sub>4</sub> nanoparticles significantly affected the sensitivity of the composite.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115116427","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Noise consideration for cancer marker detection using nanowire 纳米线检测肿瘤标志物的噪声考虑
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6968009
T. Rim, Sungho Kim, Kihyun Kim, Nanki Hong, Jeong-Soo Lee, Y. Jeong, M. Meyyappan, C. Baek
{"title":"Noise consideration for cancer marker detection using nanowire","authors":"T. Rim, Sungho Kim, Kihyun Kim, Nanki Hong, Jeong-Soo Lee, Y. Jeong, M. Meyyappan, C. Baek","doi":"10.1109/NANO.2014.6968009","DOIUrl":"https://doi.org/10.1109/NANO.2014.6968009","url":null,"abstract":"In this paper, a method to extract the signal-to-noise ratio (SNR) is proposed for the Si nanowire (Si-NW) biologically-active field-effect transistors (BioFETs). We have fabricated the devices using CMOS compatible process and demonstrated specific alpha fetoprotein (AFP) detection using the monoclonal antibody of AFP. The low-frequency noise was measured to calculate the parameter. Using our method, we calculated the noise equivalent voltage and calculated the SNR. The Si-NW BioFET showed a SNR of 15.1dB. These parameters are useful indicators to evaluate FET-type sensor devices.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123425096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Stretchable inter-connection by printed silver nano-ink 印刷银纳米油墨的可拉伸互连
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6967969
Jiseok Kim, B. Keane, J. S. Park, W. Kim
{"title":"Stretchable inter-connection by printed silver nano-ink","authors":"Jiseok Kim, B. Keane, J. S. Park, W. Kim","doi":"10.1109/NANO.2014.6967969","DOIUrl":"https://doi.org/10.1109/NANO.2014.6967969","url":null,"abstract":"A stretchable conductive horseshoe-patterned inter-connector is fabricated by direct stamping of silver nano ink on a thin sheet of PDMS. Horseshoe-shaped electrode's stretching behavior has been analyzed and tested in terms of bending mechanical stress concentration and electrical resistivity change. Also, an LED is connected with the stretchable inter-connection for the ending demonstration. The whole device is conformably attached onto a finger. The LED stays lit until the finger is completely bent.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123680468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Thermophysical properties of pentaerythritol/nano-SiB6 composites for thermal storage 季戊四醇/纳米sib6储热复合材料的热物理性质
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6967955
P. Hu, Pan-Pan Zhao, Yi Jin
{"title":"Thermophysical properties of pentaerythritol/nano-SiB6 composites for thermal storage","authors":"P. Hu, Pan-Pan Zhao, Yi Jin","doi":"10.1109/NANO.2014.6967955","DOIUrl":"https://doi.org/10.1109/NANO.2014.6967955","url":null,"abstract":"Pentaerythritol (PE) is a solid-solid phase change material with large latent heat. To improve its performance of thermal storage, nano-SiB6 particles were physically mixed into PE as nucleating agent with contents of 1 wt%, 3wt%, 5wt%, respectively. FTIR analysis was performed for pure PE, nano-SiB6 and the composites. The results show that there are no valence bonds between PE and nao-SiB6, and the composite can storage and release heat as the pure PE do. The surface morphologies of pure PE and PE/nano-SiB6 were scanned by a SEM. The composite shows a much more compacted lamellar microstructure. The specific heat capacities, solid-solid phase change temperatures and latent heats of pure PE and components were measured using DSC, respectively. The PE/nano-SiB6 composites have larger specific heat, lower solid-solid phase change temperature and latent heat than these of pure PE.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121868148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Low voltage SRAM design using tunneling regime of CNTFET 利用CNTFET的隧道机制设计低压SRAM
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6968042
Z. Ahmed, K. Sarfraz, Lining Zhang, M. Chan
{"title":"Low voltage SRAM design using tunneling regime of CNTFET","authors":"Z. Ahmed, K. Sarfraz, Lining Zhang, M. Chan","doi":"10.1109/NANO.2014.6968042","DOIUrl":"https://doi.org/10.1109/NANO.2014.6968042","url":null,"abstract":"This paper presents low-voltage techniques for static random access memory (SRAM) bit-cell design using the ambipolar characteristics of Carbon Nanotube field effect transistor (CNTFET). The sub-60mV/dec band-to-band tunneling (BTBT) leakage region is used for transistor operation which reverses the charging-discharging characteristics of p-type and n-type CNTFETs compared to the conventional CMOS transistors. Our first 8T-SRAM design, operating at 0.33V power supply, has 6 p-type and 2 n-type CNTFETs, all operating in BTBT region. The second design uses all p-type CNTFETs for reliable fabrication process. The proposed SRAM bit-cells have 4 orders of magnitude lower standby leakage current, about 40% wider write margins and ~50% improved read static noise margins compared to state of the art 22nm CMOS bit-cell under an equal SRAM bit-cell area constraint.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114066613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Signal conditioning of carbon nanotube thin film loudspeakers 碳纳米管薄膜扬声器的信号调理
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6968142
A. Hall, Jeremy Gaston, W. Wolde, E. Baker, M. Okada, YuHuang Wang, S. Karna
{"title":"Signal conditioning of carbon nanotube thin film loudspeakers","authors":"A. Hall, Jeremy Gaston, W. Wolde, E. Baker, M. Okada, YuHuang Wang, S. Karna","doi":"10.1109/NANO.2014.6968142","DOIUrl":"https://doi.org/10.1109/NANO.2014.6968142","url":null,"abstract":"Super-aligned carbon nanotube (CNT) thin films offer the capability to be placed into compact lightweight sound sources for active noise control, loudspeaker, or other acoustic applications. The super-aligned CNT films generate thermoacoustically induced oscillations to generate sound. This occurs through the use of a dynamic signal, such as applying an alternating current in the audio frequency range to the thin film. This mechanism is carried out through joule heating which heats the air above the surface, thereby producing sound waves from periodic air vibration. Here, we report an investigation of the sound pressure and thermal properties of advanced carbon nanotube thin films with an emphasis to address the signal distortion issue.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126314574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Using rapid developing and developing speed model to decrease line width in electron beam lithography 采用快速显影和显影速度模型减小电子束光刻线宽
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6968114
H. Yeh, K. Shen, S. Chang, H. M. Chen, T. Liao, C. Kuan
{"title":"Using rapid developing and developing speed model to decrease line width in electron beam lithography","authors":"H. Yeh, K. Shen, S. Chang, H. M. Chen, T. Liao, C. Kuan","doi":"10.1109/NANO.2014.6968114","DOIUrl":"https://doi.org/10.1109/NANO.2014.6968114","url":null,"abstract":"In this paper, we have established a developing speed model for electron beam lithography. By applying this model and a rapid developing method, we successfully decrease the line width by 51%. Furthermore, we can easily narrow down the line width without adding complex processes on the substrate. Some researches has used many ways to supress the scatterings of electron intensity distribution and control the beam profiles by simulations. In the other hand, we limit the level of developed patterns. This method is easier to perform, however, has not been studied formerly. Aiming for Nano structural devices, this model is valuable and worth studying.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126506680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of stress distribution in direct stamping of silver nano ink by analysis of finite-element model 利用有限元模型分析银纳米油墨直接冲压过程中的应力分布
14th IEEE International Conference on Nanotechnology Pub Date : 2014-12-01 DOI: 10.1109/NANO.2014.6967970
Jiseok Kim, W. Kim
{"title":"Evaluation of stress distribution in direct stamping of silver nano ink by analysis of finite-element model","authors":"Jiseok Kim, W. Kim","doi":"10.1109/NANO.2014.6967970","DOIUrl":"https://doi.org/10.1109/NANO.2014.6967970","url":null,"abstract":"Mechanical analysis in direct stamping of silver nano ink is simulated by a finite element model, Ansys. Stress distribution on the layer of silver nano ink is predicted while external pressure is applied onto the stamp. Compressive stress over the layer of silver nano ink is approximately the external pressure while higher stress is found at the both side-end of pattern trench. This compressive stress may help to compact silver nano ink in the trench of the stamp to form densified conductive electrode.","PeriodicalId":367660,"journal":{"name":"14th IEEE International Conference on Nanotechnology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125921920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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