Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)最新文献_第2页

An overview of the applications of a pulsed laser system for SEU testing 概述了脉冲激光系统在SEU测试中的应用

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856612

V. Pouget, P. Fouillat, D. Lewis, H. Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet

引用次数: 24

A compact built-in current sensor for I/sub DDQ/ testing 紧凑的内置电流传感器，用于I/sub DDQ/测试

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856619

Y. Tsiatouhas, T. Haniotakis, D. Nikolos

引用次数: 3

Self-testing of FPGA delay faults in the system environment FPGA延迟故障在系统环境下的自检

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856610

A. Krasniewski

引用次数: 5

Comparison between random and pseudo-random generation for BIST of delay, stuck-at and bridging faults 延迟、卡滞和桥接故障的BIST随机与伪随机生成比较

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856623

P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel

{"title":"Comparison between random and pseudo-random generation for BIST of delay, stuck-at and bridging faults","authors":"P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel","doi":"10.1109/OLT.2000.856623","DOIUrl":"https://doi.org/10.1109/OLT.2000.856623","url":null,"abstract":"The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. As delay testing using external testers requires expensive ATE, built-in self test (BIST) is an alternative technique that can significantly reduce the test cost. The generation of test patterns in this case is usually pseudo-random (produced from an LFSR), and it has been proven that Single Input Change (SIC) test sequences are more effective than classical Multiple Input Change (MIC) test sequences when a high robust delay fault coverage is targeted. In this paper, we first question the use of a pseudo-random generation to produce effective delay test pairs. We demonstrate that using truly random test pairs (produced from a software generation) to test path delay faults in a given circuit produces higher delay fault coverage than that obtained with pseudo-random test pairs obtained from a classical primitive LFSR. Next, we show that the same conclusion can be drawn when stuck-at or bridging fault coverage is targeted rather delay fault coverage. A modified hardware TPG structure allowing the generation of truly random test patterns is introduced at the end of the paper.","PeriodicalId":334770,"journal":{"name":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130667601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 23

Improving on-line BIST-based diagnosis for roving STARs 改进基于bist的漫游星在线诊断

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856608

M. Abramovici, C. Stroud, Brandon Skaggs, J. Emmert

引用次数: 34

A stamping technique to increase the error correction capacity of the (127,k,d) RS code 一种提高(127,k,d) RS码纠错能力的冲压技术

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856632

T. Vallino, A. Dandache, J. Delahaye, F. Monteiro, B. Lepley

引用次数: 0

Micro-checkpointing: checkpointing for multithreaded applications 微检查点:多线程应用程序的检查点

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856604

K. Whisnant, Z. Kalbarczyk, R. Iyer

引用次数: 14

High level synthesis methodology for on-line testability optimization 在线测试性优化的高级综合方法

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856637

M. A. Naal, E. Simeu

引用次数: 3

New techniques for accelerating fault injection in VHDL descriptions 加速VHDL描述中故障注入的新技术

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856613

B. Parrotta, M. Rebaudengo, M. Reorda, M. Violante

引用次数: 58

On-line current testing for a microprocessor based application with an off-chip sensor 用片外传感器对基于微处理器的应用进行在线电流测试

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856617

B. Alorda, I. D. Paúl, J. Segura, T. Miller

引用次数: 2