紧凑的内置电流传感器，用于I/sub DDQ/测试

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI:10.1109/OLT.2000.856619

Y. Tsiatouhas, T. Haniotakis, D. Nikolos

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引用次数: 3

摘要

本文提出了一种基于电流镜像技术的用于CMOS VLSI电路I/sub DDQ/测试的简单、紧凑的内置电流传感器。该传感器可以实现小的检测时间，可用于在线和离线I/sub DDQ/测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A compact built-in current sensor for I/sub DDQ/ testing

In this paper a simple to implement, compact, build-in current sensor for I/sub DDQ/ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line I/sub DDQ/ testing.

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来源期刊

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)

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