概述了脉冲激光系统在SEU测试中的应用

Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI:10.1109/OLT.2000.856612

V. Pouget, P. Fouillat, D. Lewis, H. Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet

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引用次数: 24

摘要

本文介绍了用脉冲激光进行单事件扰动试验的几个最新结果。它包括测试SRAM单元的灵敏度映射，触发器中从机引起的干扰，16mbit DRAM的MBU映射以及序列计数器的在线测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An overview of the applications of a pulsed laser system for SEU testing

This paper presents several recent results concerning single-event upset testing with a pulsed laser. It includes sensitivity mapping of an test SRAM cell, slave-induced upset in a flip-flop, MBU mapping of a 16 Mbit DRAM, and online testing of a sequencer-counter.

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Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)

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