{"title":"用片外传感器对基于微处理器的应用进行在线电流测试","authors":"B. Alorda, I. D. Paúl, J. Segura, T. Miller","doi":"10.1109/OLT.2000.856617","DOIUrl":null,"url":null,"abstract":"This work presents a prototype architecture that provides on-line IDDQ measurement for a microprocessor-based system. It has been implemented using an IDDQ testable microprocessor (the Intel 386/sup TM/ EX embedded microprocessor) and an off-chip current sensor. Three current test activation modes are supported. A direct test mode through a sensor dedicated pin, a test mode where the microprocessor controls the off-chip sensor, and a P1149.1 driven test. Measurements and architecture operation are detailed.","PeriodicalId":334770,"journal":{"name":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"On-line current testing for a microprocessor based application with an off-chip sensor\",\"authors\":\"B. Alorda, I. D. Paúl, J. Segura, T. Miller\",\"doi\":\"10.1109/OLT.2000.856617\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a prototype architecture that provides on-line IDDQ measurement for a microprocessor-based system. It has been implemented using an IDDQ testable microprocessor (the Intel 386/sup TM/ EX embedded microprocessor) and an off-chip current sensor. Three current test activation modes are supported. A direct test mode through a sensor dedicated pin, a test mode where the microprocessor controls the off-chip sensor, and a P1149.1 driven test. Measurements and architecture operation are detailed.\",\"PeriodicalId\":334770,\"journal\":{\"name\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"volume\":\"111 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OLT.2000.856617\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OLT.2000.856617","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-line current testing for a microprocessor based application with an off-chip sensor
This work presents a prototype architecture that provides on-line IDDQ measurement for a microprocessor-based system. It has been implemented using an IDDQ testable microprocessor (the Intel 386/sup TM/ EX embedded microprocessor) and an off-chip current sensor. Three current test activation modes are supported. A direct test mode through a sensor dedicated pin, a test mode where the microprocessor controls the off-chip sensor, and a P1149.1 driven test. Measurements and architecture operation are detailed.
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