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Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)最新文献

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Low cost concurrent error detection based on module weight-based codes 基于模块权重码的低成本并发错误检测
Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 2000-07-03 DOI: 10.1109/OLT.2000.856633
D. Das, N. Touba, M. Seuring, M. Gössel
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引用次数: 40
Proceedings 6/sub th/ IEEE International On-Line Testing Workshop IEEE国际在线测试研讨会论文集
Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 1900-01-01 DOI: 10.1109/OLT.2000.856603
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引用次数: 0
Concurrent scan monitoring and multi-pattern search 并发扫描监控和多模式搜索
Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) Pub Date : 1900-01-01 DOI: 10.1109/OLT.2000.856621
J.M.V. dos Santos
{"title":"Concurrent scan monitoring and multi-pattern search","authors":"J.M.V. dos Santos","doi":"10.1109/OLT.2000.856621","DOIUrl":"https://doi.org/10.1109/OLT.2000.856621","url":null,"abstract":"Accompanying the needs of many critical applications of electronic devices, on-line tests are increasingly required. Non-intrusive concurrent scan monitoring is an easy-to-implement vector-based testing procedure, handicapped by two main factors: the interval for operating vectors to match test patterns and test data to be stored. The paper presents an evolution of this testing technique. Besides decreasing the average latency interval up to three orders of magnitude, it also reduces the memory required for test-data and improves the on-line fault-coverage.","PeriodicalId":334770,"journal":{"name":"Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125144810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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