Concurrent scan monitoring and multi-pattern search

Abstract

Accompanying the needs of many critical applications of electronic devices, on-line tests are increasingly required. Non-intrusive concurrent scan monitoring is an easy-to-implement vector-based testing procedure, handicapped by two main factors: the interval for operating vectors to match test patterns and test data to be stored. The paper presents an evolution of this testing technique. Besides decreasing the average latency interval up to three orders of magnitude, it also reduces the memory required for test-data and improves the on-line fault-coverage.