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2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)最新文献

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Design and analysis of silicone rubber-based TERAPOSER for LPDDR4 memory test LPDDR4记忆测试用硅橡胶TERAPOSER的设计与分析
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571690
Jonghoon J. Kim, Heegon Kim, D. Jung, Sumin Choi, Jaemin, Junyong Park, Jiseong Kim, Joungho Kim, Dongho Ha, Michael Bae
{"title":"Design and analysis of silicone rubber-based TERAPOSER for LPDDR4 memory test","authors":"Jonghoon J. Kim, Heegon Kim, D. Jung, Sumin Choi, Jaemin, Junyong Park, Jiseong Kim, Joungho Kim, Dongho Ha, Michael Bae","doi":"10.1109/ISEMC.2016.7571690","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571690","url":null,"abstract":"Motivated by the increasing market demand for the high performance mobile devices, both the data rate and the number of pin of mixed-signal systems keep on increasing to realize multifunctional yet compact system designs. With this ascending technical trend, many signal integrity (SI) and power integrity (PI) problems such as ISI, jitter, crosstalk, simultaneous switching noise (SSN) have arisen that need to be thoroughly analyzed and tested. In order to accurately monitor the data signals of LPDDR4, a carefully designed test interposer considering such factors as impedance matching, minimization of skew and crosstalk needs to be proposed. In this paper, a novel test interposer scheme composed of a test interposer and silicone rubber sheets is proposed for LPDDR4 memory test. Through a series of simulations and measurements, we experimentally verify the proposed structures in time and frequency domains, and prove their accuracy and practicality.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127207576","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Sensitivity analysis of cable crosstalk to uncertain parameters using stochastic reduced order models 用随机降阶模型分析电缆串扰对不确定参数的敏感性
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571678
Zhouxiang Fei, Yi Huang, Jiafeng Zhou, Qian Xu
{"title":"Sensitivity analysis of cable crosstalk to uncertain parameters using stochastic reduced order models","authors":"Zhouxiang Fei, Yi Huang, Jiafeng Zhou, Qian Xu","doi":"10.1109/ISEMC.2016.7571678","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571678","url":null,"abstract":"This paper presents the sensitivity analysis of cable crosstalk against different uncertain variables using the stochastic reduced order model (SROM) method. A ranking of these uncertain variables is produced based on their impact levels on the crosstalk. This study shows that the complexity of the statistical problem can be reduced by ignoring the weak variables without affecting the accuracy. The statistical result is obtained with the SROM method, and compared with that of the conventional Monte Carlo (MC) method. It is found that the SROM method can reduce the computational cost required by the converged MC by at least two orders of magnitude. Also the SROM method is non-intrusive and straightforward to implement. Therefore, it could be an ideal solution to obtain the statistical solution in randomness-embedded electromagnetic compatibility (EMC) problems.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132487779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Estimation of interfrence between antennas on large platforms using physics-based truncation model and multi-level fast multipole method 基于物理截断模型和多级快速多极子方法的大型平台天线间干扰估计
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571743
Huapeng Zhao, Siping Gao, Wei-Jiang Zhao, Q. Wan, Jun Hu, Z. Chen
{"title":"Estimation of interfrence between antennas on large platforms using physics-based truncation model and multi-level fast multipole method","authors":"Huapeng Zhao, Siping Gao, Wei-Jiang Zhao, Q. Wan, Jun Hu, Z. Chen","doi":"10.1109/ISEMC.2016.7571743","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571743","url":null,"abstract":"This paper proposes an efficient method to estimate interference between antennas on large platforms. Due to the large size of the platform, calculation of interference between antennas on large platforms is time consuming even using a fast integral equation method like the multi-level fast multi-pole method (MLFMM). After analyzing coupling mechanisms, it is found that interference between antennas is mainly affected by a small portion of the large platform. Based on this observation, the large platform is truncated to save computational effort. The truncation model is then analyzed by MLFMM. Simulation results are presented to illustrate the effectiveness of the proposed method.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132055416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An EMI estimation for shielding edge treaments on a printed circuit board 印刷电路板屏蔽边缘处理的电磁干扰估计
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571722
S. Bai, Qian Liu, Kartheek Nalla, Jing Li, J. Drewniak, S. Connor, M. Cracraft, Bruce Archambeaul
{"title":"An EMI estimation for shielding edge treaments on a printed circuit board","authors":"S. Bai, Qian Liu, Kartheek Nalla, Jing Li, J. Drewniak, S. Connor, M. Cracraft, Bruce Archambeaul","doi":"10.1109/ISEMC.2016.7571722","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571722","url":null,"abstract":"Various PCB edge treatments including via stitching and edge plating connecting ground planes can be employed to suppress the EMI from multilayer printed circuit boards. The shielding performance of these edge treatments is studied in this work. Design curves and an empirical equation are given based on parametric study to summarize the variation of the total radiated power (TRP) as a function of slot length (spacing between vias) and number of openings. Comparisons between measurements and simulation suitably agree within engineering accuracy.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122177382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Noise coupling path analysis for RF interference caused by LCD noise modulation LCD噪声调制射频干扰的噪声耦合路径分析
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571671
C. Hwang, Sunkyu Kong, Takashi Enomoto, J. Maeshima, K. Araki, D. Pommerenke, J. Fan
{"title":"Noise coupling path analysis for RF interference caused by LCD noise modulation","authors":"C. Hwang, Sunkyu Kong, Takashi Enomoto, J. Maeshima, K. Araki, D. Pommerenke, J. Fan","doi":"10.1109/ISEMC.2016.7571671","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571671","url":null,"abstract":"RF interference caused by liquid crystal display (LCD) noise modulation in a mobile phone was investigated and its noise coupling path was demonstrated. In the frequency division duplex communications, mobile phones can send (uplink) and receive (downlink) at the same time. When an antenna transmits high power signal, the baseband noise from an LCD panel is modulated into an RF band and causes interference in a receiving antenna. A noise coupling path between an antenna and a display driver IC, which drives the LCD panel, was experimentally demonstrate. In addition, a simple noise source model was proposed to represent modulation mechanism. A network analysis with the modulation model showed good correlation with the measured spectra of the modulated noise in a receiving antenna.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"661 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120883085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
PAM4 signaling considerations for high-speed serial links 高速串行链路的PAM4信令注意事项
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571771
N. Dikhaminjia, J. He, M. Tsiklauri, J. Drewniak, J. Fan, A. Chada, B. Mutnury, B. Achkir
{"title":"PAM4 signaling considerations for high-speed serial links","authors":"N. Dikhaminjia, J. He, M. Tsiklauri, J. Drewniak, J. Fan, A. Chada, B. Mutnury, B. Achkir","doi":"10.1109/ISEMC.2016.7571771","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571771","url":null,"abstract":"The paper discusses current challenges and advantages of multi-level signaling for high-speed serial links, showing the differences and similarities in link-path analysis between binary and multi-level signaling. Comparison of two signaling methodologies is given from the general theory viewpoint, as well as on the basis of various tests regarding crosstalk, jitter, equalizations and different channel characteristics, such as material, impedance and overall manufacturing design sensitivity.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"16 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116712253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Verifying MIL-STD-461G CS101 using frequency domain measurements on an oscilloscope 在示波器上使用频域测量验证MIL-STD-461G CS101
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571760
M. Schnecker
{"title":"Verifying MIL-STD-461G CS101 using frequency domain measurements on an oscilloscope","authors":"M. Schnecker","doi":"10.1109/ISEMC.2016.7571760","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571760","url":null,"abstract":"Conducted susceptibility measurements such as MIL-STD-461G CS101 require the insertion of an interfering signal on the power rails of an equipment under test (EUT) and verifying proper operation. The interfering signal includes a range of frequencies and amplitudes as required by the standard. The level of the interfering signal at each frequency must be verified using either an oscilloscope or a test receiver. The latter instrument is used to verify the signal in the frequency domain while the former is used to verify the signal in the time domain. This paper investigates the benefits of using an oscilloscope to verify the signal in the frequency domain using the FFT function found on most oscilloscopes. It will be shown that this method is more reliable and accurate compared with time domain methods and more convenient than receiver measurements while having the ability to safely measure ungrounded power signals using a high voltage differential probe.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125143086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Limitations of symmetry test method for antennas as specified in ANSI C63.5-2006 standard ANSI C63.5-2006标准中天线对称试验方法的限制
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571730
Anoop Adhyapak, Zhong Chen
{"title":"Limitations of symmetry test method for antennas as specified in ANSI C63.5-2006 standard","authors":"Anoop Adhyapak, Zhong Chen","doi":"10.1109/ISEMC.2016.7571730","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571730","url":null,"abstract":"The ANSI C63.5-2006 standard stipulates a symmetry test to check the antenna balance. The s21 response between two similar antennas, placed at 1m height above the ground plane, is first recorded. The antenna under test is rotated 180° and the response is recorded again. The difference gives the symmetry of the antenna and should be less than 1.0 dB. This paper discusses the limitation of the symmetry test configuration. Specifically, it specifies to place both transmit and receive antennas at a fixed height of 1m above a conducting ground plane, resulting the antenna under test to situate in a null field at some frequencies due to the ground reflection. The effect from the ground plane at the nulls of response distorts the symmetry test result. A new technique is proposed wherein the receive antenna (antenna under test) is placed at 1m height above the ground plane and the transmit antenna scans from 1m to 4m at a step of 0.05 m. The scanning of the transmit antenna helps to eliminate the nulls in the s21 response. Because the antenna under test is always at the fixed height, the measurement yields valid symmetry results for the antenna under test for 1 m height.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123008942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A gasket-free electromagnetic shielding structure for 2.4 GHz band using folded quarter-wavelength SIW resonators 基于折叠四分之一波长SIW谐振器的2.4 GHz频段无垫片电磁屏蔽结构
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571657
S. Yoneda, Y. Shiraki, Y. Sasaki, N. Oka, H. Oh-Hashi
{"title":"A gasket-free electromagnetic shielding structure for 2.4 GHz band using folded quarter-wavelength SIW resonators","authors":"S. Yoneda, Y. Shiraki, Y. Sasaki, N. Oka, H. Oh-Hashi","doi":"10.1109/ISEMC.2016.7571657","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571657","url":null,"abstract":"In recent years, various types of new shielding structures realizing shielding effectiveness (SE) at specific frequency band have been reported. A gasket-free shielding structure using cascaded substrate integrated waveguide (SIW) resonators is one of them. The structure consists of cascaded SIW resonators with different resonant frequencies placed on inner walls of a gap. Though the structure has an advantage of being almost free of deterioration due to its non-contact structure, miniaturization of the SIW resonators is necessary to be applied at several GHz bands. In this paper, a gasket-free shielding structure using folded quarter-wavelength (FQ)-SIW resonators is proposed and its SE is evaluated. An FQ-SIW resonator is a miniaturized SIW resonator by applying a multilayer substrate and modifying position of the coupling slits. A prototype configuration for 2.4 GHz band is designed and fabricated using a five-layered FR4 substrate. The designed FQ-SIW resonators are miniaturized to almost 1/7 of conventional SIW resonators, and the measured results of the cascaded configuration showed more than 30-dB improvement of SE at 2.4 GHz band.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128104118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Proposal for a Brazilian regulation of electromagnetic compatibility applied to automotive vehicles 关于适用于汽车的巴西电磁兼容性法规的提案
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571698
A. N. de São José, U. C. Resende, M. A. de Menezes, José H. Ferreira
{"title":"Proposal for a Brazilian regulation of electromagnetic compatibility applied to automotive vehicles","authors":"A. N. de São José, U. C. Resende, M. A. de Menezes, José H. Ferreira","doi":"10.1109/ISEMC.2016.7571698","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571698","url":null,"abstract":"For the last two decades, electro-electronic components have become more and more integrated into automotive vehicles, with an increasing importance in essential functions implying the safe overall operation of the car. Although these innovations come as a car performance improvement, it can also have adverse effects (some related to safety) in case of malfunction. These undesirable behaviors can be caused by Electromagnetic Interferences (EMI), and the probability increases when a large number of electro-electronic components act together in the same environment, causing failures that may damage part or the whole system. In Brazil, the Electromagnetic Compatibility (EMC) validation of these systems is currently a relative option and the decision of testing or not (and how deep) is up to each car manufacturer. Moreover, most of these validations are still realized out of Brazil, turning developments more expensive, more time-consuming and underusing Brazilian metrology chain. This paper proposes a study of the Brazilian automotive EMC validation context and a comparison with the worldwide scenario, taking into account its technical, economic and social impacts and bringing arguments to discuss a possible federal regulation. This electronic document is a “live” template and already defines the components of your paper [title, text, heads, etc.] in its style sheet.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117136582","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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