2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)最新文献

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High bandwidth low power interposer interconnect challenge, design, and validation in 3D silicon stacked interconnect (SSI) technology 3D硅堆叠互连(SSI)技术中的高带宽低功耗中间体互连挑战、设计和验证
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571687
Anna Wong, Gordon Tsui, Boon-Kai Soo, Chong-Ling Khoo, Yong Wang
{"title":"High bandwidth low power interposer interconnect challenge, design, and validation in 3D silicon stacked interconnect (SSI) technology","authors":"Anna Wong, Gordon Tsui, Boon-Kai Soo, Chong-Ling Khoo, Yong Wang","doi":"10.1109/ISEMC.2016.7571687","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571687","url":null,"abstract":"This paper describes the characteristics of interposer interconnects in 3D silicon stacked interconnect (SSI) technology in comparison to traditional silicon interconnects. It explores unique near end crosstalk (NEXT) and far end crosstalk (FEXT) behavior of simple interposer interconnect structure with simulation results. Six different routing structures were investigated for I/O density and signal integrity trade-off with emphasis in timing impact due to crosstalk. Analysis shows that the four routing structures with lower I/O density meet timing requirement set for 625MHz, whereas the remaining two routing structures with higher I/O density fail. The routing structure that demonstrates the best trade-off was implemented in a SSI technology test chip. Lab data shows that the timing impact from simultaneous switching noise (SSN) is less than 20% of timing budget at 625MHz targeted operating frequency.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"179 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133287605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack 在没有完整软件堆栈的情况下预测集成电路软失效敏感性的测量技术
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571597
Suyu Yang, Benjamin J. Orr, Yuangdong Guo, Yilong Zhang, D. Pommerenke, H. Shumiya, J. Maeshima, Taketoshi Sekine, Y. Takita, K. Araki
{"title":"Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack","authors":"Suyu Yang, Benjamin J. Orr, Yuangdong Guo, Yilong Zhang, D. Pommerenke, H. Shumiya, J. Maeshima, Taketoshi Sekine, Y. Takita, K. Araki","doi":"10.1109/ISEMC.2016.7571597","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571597","url":null,"abstract":"In this paper, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115441897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
High-speed bus signal integrity compliance using a frequency-domain model 高速总线信号完整性符合性使用频域模型
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571594
Si T. Win, J. Hejase, W. Becker, Glen A. Wiedemeier, D. Dreps, J. Myers, K. Willis, John Horner, A. Varma
{"title":"High-speed bus signal integrity compliance using a frequency-domain model","authors":"Si T. Win, J. Hejase, W. Becker, Glen A. Wiedemeier, D. Dreps, J. Myers, K. Willis, John Horner, A. Varma","doi":"10.1109/ISEMC.2016.7571594","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571594","url":null,"abstract":"A new technique for frequency-domain compliance testing of high-speed differential interfaces is implemented in a signal integrity simulation tool that can accurately predict a channel's bit-error rate (BER) from seven frequency-domain parameters. This greatly increases the speed and efficiency of designing the number of computer systems required for custom configurations in scale-out data centers. The compliance method is tested with three example case studies in channel printed circuit board (PCB) design. These three studies are: finding maximum loss due to routable trace length as a function of wiring depth layer (which affects crosstalk), finding the maximum routable length when introducing reflections and crosstalk due to adding a connector in the channel, and finding what amount of skew introduced by asymmetry in a differential pair for reasons such as the glass weave or different copper lengths under which a channel can still operate. The pass/fail frequency compliance results are discussed and compared with the time-domain simulation results of the channels tested.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"2 1-2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115313736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Research on digital video signal electromagnetic information leakage based on DVI 基于DVI的数字视频信号电磁信息泄漏研究
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571715
Sen Wang, Y. Qiu, Jin Tian, Qinglin Xu
{"title":"Research on digital video signal electromagnetic information leakage based on DVI","authors":"Sen Wang, Y. Qiu, Jin Tian, Qinglin Xu","doi":"10.1109/ISEMC.2016.7571715","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571715","url":null,"abstract":"Electromagnetic radiation of computer contains video information which causes the information leakage. Electromagnetic radiation of PC contains video information, and the image can be reconstructed. In this paper, the way of computer video information transmission of DVI video interface be analyzed. The model of time and frequency domain corresponding to serial transmission and parallel transmission of video information is built. According to the principle of video information interception and reconstruction, the radiation leakage characteristics when different video signal is transmitted through the serial and parallel way is researched in this paper. Through the analysis and measurement of the electromagnetic information leakage, then we can get a conclusion that it is easy to be intercepted when the gray image is transmitted in serial way, black and white image is transmitted in parallel way, because it shows the characteristic of “false parallel and real serial”.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123954330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Radiated immunity of the Gigabit Ethernet Switch embedded in an industrial programmable logic controller 嵌入工业可编程逻辑控制器的千兆以太网交换机的辐射抗扰度
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571709
Massiva Zouaoui, E. Sicard, G. Jacquemod, Ghislain Rudelou, Emmanuel Marsy, H. Braquet
{"title":"Radiated immunity of the Gigabit Ethernet Switch embedded in an industrial programmable logic controller","authors":"Massiva Zouaoui, E. Sicard, G. Jacquemod, Ghislain Rudelou, Emmanuel Marsy, H. Braquet","doi":"10.1109/ISEMC.2016.7571709","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571709","url":null,"abstract":"In this paper, the immunity of a Gigabit Ethernet Switch (GES) embedded in an industrial Programmable Logic Controller (PLC) is analyzed. For this matter, two configurations are tested. In the first, the GES is mounted on a dedicated test board, which isolates the integrated circuit (IC) with minimum interface components. In the second, the GES is embedded in a commercial PLC product. A Near Field Scan of Immunity setup, based on a local magnetic loop antenna injection is exploited to highlight potential weaknesses of the GES and indentify its sensitive functions. This study showed two susceptible functions in the GES: the oscillator pins and a data bus called Gigabit Media Independent Interface (GMII). These two functions were revealed to be susceptible in two generations of the same integrated circuit. This article also demonstrates the repeatability of the NFS results when the architecture embedding the IC is modified. The modeling of the NFSI and its coupling to the package and clock circuits is also discussed.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"25 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120890054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Millimeter-wave broadband transition of stripline and CPWG on thin-to-thick substrates 薄到厚基板上带状线和CPWG的毫米波宽带跃迁
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571705
N. Ghassemi, H. Tournier
{"title":"Millimeter-wave broadband transition of stripline and CPWG on thin-to-thick substrates","authors":"N. Ghassemi, H. Tournier","doi":"10.1109/ISEMC.2016.7571705","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571705","url":null,"abstract":"In many applications such as chip (or package) to PCB transition, due to the small pitch size of the chip (or package), very narrow 50 Ω; stripline or grounded coplanar waveguide (CPWG) is required. In order to reduce the line width, stripline or CPWG should be fabricated on thin substrate (in case of CPWG because minimum manufacturable gap is limited in normal low cost PCB technology). On the other hand using thin substrate increases metallic loss of CPWG and stripline, which is important especially at millimeter wave, and long channels, then it, is preferred to use thick substrate to reduce metallic loss. Also for many applications such as printed circuit antenna, thick substrate is preferred because it can increase the bandwidth and gain of the antenna. Then a broadband transition from stripline (or CPWG) on thin to thick substrate is needed. This paper presents a low-loss, broadband transition of stripline (and CPWG) on thin-to-thick substrates. Measurement results show that the proposed transitions have less than 0.1 dB insertion loss up to 40 GHz. Several TRL kits are used to de-embed the effect of connectors and probes.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116344104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A new method to calculate phase center locations for arbitrary antenna systems and scenarios 一种计算任意天线系统和场景下相位中心位置的新方法
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571729
D. Harke, H. Garbe, Prashant Chakravarty
{"title":"A new method to calculate phase center locations for arbitrary antenna systems and scenarios","authors":"D. Harke, H. Garbe, Prashant Chakravarty","doi":"10.1109/ISEMC.2016.7571729","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571729","url":null,"abstract":"Accurately setting up antenna measurement procedures and maintaining good performance of radar navigation systems are two examples of tasks relying on precise knowledge of the phase center (PC) location. Currently this problem is discussed particularly in 3 m-electromagnetic compatibility (EMC) field emission measurement, when an exact distance between test antenna and the equipment under test (EUT) is needed. If, in an electromagnetic scenario, a point can be found behaving like an isotropic radiator emitting spherical waves, this point is called the PC. Since many methods to find the PC are prone to various limitations, this paper proposes an algorithm able to handle discretionary systems. Directions of multiple far field Poynting vectors are evaluated in order to backtrack the location from where electromagnetic energy seems to emanate. Simulations with the electromagnetics software FEKO generate input data for the evaluation process. Fast convergence and repeatable, reasonable results are achieved. As a small amount of data is sufficient to calculate reliable PC locations and this reduces the required measurement effort, practical applicability is ensured.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121100217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Compact inductors deembedded with asymmetric through-only structures 紧凑型电感去嵌不对称的仅通结构
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571689
John Yan, Arash Zargaran-Yazd
{"title":"Compact inductors deembedded with asymmetric through-only structures","authors":"John Yan, Arash Zargaran-Yazd","doi":"10.1109/ISEMC.2016.7571689","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571689","url":null,"abstract":"This paper investigates the use of asymmetric through-only de-embedding approach for on-chip stacked inductors. Silicon structures are fabricated on a standard 28nm CMOS process and characterized with a network analyzer on folded GSGSG pads to facilitate rapid, one-touch measurements. The proposed de-embedding approach is compared with the conventional de-embedding approach. Additionally, the proposed de-embedded inductance and quality factor values are compared with a conventional physics based model as well as electromagnetic simulations. Along with the simplicity of the de-embedding structure, one can expect reduced silicon real estate cost during testing and characterization of multiple layer stacked inductors. As a result, the response of compact stacked inductors can become increasingly predictable to accommodate the demand of decreasing costs for wireline and wireless interfaces while providing increasing circuit and system performance.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125811671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Simulation of ESD coupling into cables based on ISO 10605 standard using method of moments 基于ISO 10605标准的电缆ESD耦合仿真
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571734
I. Oganezova, G. Shen, S. Yang, D. Pommerenke, V. Khilkevich, R. Jobava
{"title":"Simulation of ESD coupling into cables based on ISO 10605 standard using method of moments","authors":"I. Oganezova, G. Shen, S. Yang, D. Pommerenke, V. Khilkevich, R. Jobava","doi":"10.1109/ISEMC.2016.7571734","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571734","url":null,"abstract":"ESD events can damage or upset electronic vehicle systems, so discharges to the electronic systems or to the attached cables need to be considered. Discharges to the cables or to coupling structures close to the cables were investigated and a Method of Moments (MoM)-based methodology for ESD simulation is proposed. The simulation results for test benches according to ISO standards were verified against measurements.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114808078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A new efficient interesting points enhanced electromagnetic attack on AT89S52 在AT89S52上实现了一种新的高效点增强电磁攻击
2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) Pub Date : 2016-07-25 DOI: 10.1109/ISEMC.2016.7571639
Changhai Ou, Zhu Wang, Degang Sun, Xinping Zhou, J. Ai
{"title":"A new efficient interesting points enhanced electromagnetic attack on AT89S52","authors":"Changhai Ou, Zhu Wang, Degang Sun, Xinping Zhou, J. Ai","doi":"10.1109/ISEMC.2016.7571639","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571639","url":null,"abstract":"Electromagnetic attacks are non-invasive attacks and pose serious threats to the security of cryptographic devices. However, its environment is complex and the noise on electromagnetic traces is often large. Thus, traditional differential electromagnetic analysis (DEMA) and correlation electromagnetic analysis (CEMA) require a lot of electromagnetic traces to recover the key used in the cryptographic devices. In order to reduce the number of electromagnetic traces required in our attacks, two high efficiency side channel distinguishers named multiple interesting points combined differential electromagnetic analysis (MIP-DEMA) and multiple interesting points combined correlation electromagnetic analysis (MIP-CEMA) are proposed in this paper. Experimental results on AES algorithm targeting an AT89S52 microcontroller show that, to get success rates of 0.80 and 1.00, only 40% ~ 60% of electromagnetic traces are needed in our MIP-DEMA and MIP-CEMA.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124467064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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