嵌入工业可编程逻辑控制器的千兆以太网交换机的辐射抗扰度

Massiva Zouaoui, E. Sicard, G. Jacquemod, Ghislain Rudelou, Emmanuel Marsy, H. Braquet
{"title":"嵌入工业可编程逻辑控制器的千兆以太网交换机的辐射抗扰度","authors":"Massiva Zouaoui, E. Sicard, G. Jacquemod, Ghislain Rudelou, Emmanuel Marsy, H. Braquet","doi":"10.1109/ISEMC.2016.7571709","DOIUrl":null,"url":null,"abstract":"In this paper, the immunity of a Gigabit Ethernet Switch (GES) embedded in an industrial Programmable Logic Controller (PLC) is analyzed. For this matter, two configurations are tested. In the first, the GES is mounted on a dedicated test board, which isolates the integrated circuit (IC) with minimum interface components. In the second, the GES is embedded in a commercial PLC product. A Near Field Scan of Immunity setup, based on a local magnetic loop antenna injection is exploited to highlight potential weaknesses of the GES and indentify its sensitive functions. This study showed two susceptible functions in the GES: the oscillator pins and a data bus called Gigabit Media Independent Interface (GMII). These two functions were revealed to be susceptible in two generations of the same integrated circuit. This article also demonstrates the repeatability of the NFS results when the architecture embedding the IC is modified. The modeling of the NFSI and its coupling to the package and clock circuits is also discussed.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"25 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiated immunity of the Gigabit Ethernet Switch embedded in an industrial programmable logic controller\",\"authors\":\"Massiva Zouaoui, E. Sicard, G. Jacquemod, Ghislain Rudelou, Emmanuel Marsy, H. Braquet\",\"doi\":\"10.1109/ISEMC.2016.7571709\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the immunity of a Gigabit Ethernet Switch (GES) embedded in an industrial Programmable Logic Controller (PLC) is analyzed. For this matter, two configurations are tested. In the first, the GES is mounted on a dedicated test board, which isolates the integrated circuit (IC) with minimum interface components. In the second, the GES is embedded in a commercial PLC product. A Near Field Scan of Immunity setup, based on a local magnetic loop antenna injection is exploited to highlight potential weaknesses of the GES and indentify its sensitive functions. This study showed two susceptible functions in the GES: the oscillator pins and a data bus called Gigabit Media Independent Interface (GMII). These two functions were revealed to be susceptible in two generations of the same integrated circuit. This article also demonstrates the repeatability of the NFS results when the architecture embedding the IC is modified. The modeling of the NFSI and its coupling to the package and clock circuits is also discussed.\",\"PeriodicalId\":326016,\"journal\":{\"name\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"volume\":\"25 6\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2016.7571709\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2016.7571709","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文分析了嵌入工业可编程逻辑控制器(PLC)中的千兆以太网交换机(GES)的抗扰度。为此,测试了两种配置。在第一种方法中,GES被安装在一个专用的测试板上,用最少的接口组件隔离集成电路(IC)。第二种方法是将GES嵌入到商用PLC产品中。利用一种基于局部磁环天线注入的免疫近场扫描装置来突出GES的潜在弱点并识别其敏感功能。该研究显示了GES中两个易受影响的功能:振荡器引脚和称为千兆媒体独立接口(GMII)的数据总线。这两种功能在同一集成电路的两代中是易受影响的。本文还演示了修改嵌入IC的体系结构时NFS结果的可重复性。本文还讨论了NFSI的建模及其与封装和时钟电路的耦合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Radiated immunity of the Gigabit Ethernet Switch embedded in an industrial programmable logic controller
In this paper, the immunity of a Gigabit Ethernet Switch (GES) embedded in an industrial Programmable Logic Controller (PLC) is analyzed. For this matter, two configurations are tested. In the first, the GES is mounted on a dedicated test board, which isolates the integrated circuit (IC) with minimum interface components. In the second, the GES is embedded in a commercial PLC product. A Near Field Scan of Immunity setup, based on a local magnetic loop antenna injection is exploited to highlight potential weaknesses of the GES and indentify its sensitive functions. This study showed two susceptible functions in the GES: the oscillator pins and a data bus called Gigabit Media Independent Interface (GMII). These two functions were revealed to be susceptible in two generations of the same integrated circuit. This article also demonstrates the repeatability of the NFS results when the architecture embedding the IC is modified. The modeling of the NFSI and its coupling to the package and clock circuits is also discussed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信