L. Li, Jingnan Pan, C. Hwang, Gyuyeong Cho, Hark-Byeong Park, Yaojiang Zhang, J. Fan
{"title":"Radio-frequency interference estimation by reciprocity theorem with noise source characterized by Huygens's equivalent model","authors":"L. Li, Jingnan Pan, C. Hwang, Gyuyeong Cho, Hark-Byeong Park, Yaojiang Zhang, J. Fan","doi":"10.1109/ISEMC.2016.7571673","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571673","url":null,"abstract":"Noise coupling from a working IC to the neighboring victim antenna is estimated by decomposition based reciprocity theorem. The overall problem is decomposed into two parts. In the first part, the IC is turned on and the victim antenna is turned off, which is defined as forward problem. The second part is called reverse problem in which case the victim antenna is excited while the IC is turned off. An imaginary Huygens's box is introduced above the victim antenna for evaluating the coupled power from noise source to the victim RF antenna. The noise source is characterized by Huygens's equivalent source in the forward problem, and the victim antenna is modeled in full-wave simulation tool. With tangential E and H fields obtained in both forward problem and reverse problem, the coupled power can be estimated by numerical calculation of reciprocity theorem. The method by using Huygens's equivalent source is first validated by simulation in the forward problem. Later a test board with an IC and patch antenna is further measured to validate the overall methodology.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127301638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Pitfalls in measuring discontinuous disturbances with latest click analysers","authors":"Mario Monti, Elena Puri, Massimo Monti","doi":"10.1109/ISEMC.2016.7571563","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571563","url":null,"abstract":"The recent advancing in click analyser technology aims at reducing costs and time required to perform a full CISPR 14-1 compliant click measurement. The two relevant approaches to achieve costs and time reductions are, respectively, the use of Fast Fourier Transform (FFT) EMI receivers and performing the threshold calculation and actual measurement in a single run (single-run systems). However, there are some critical aspects related to these approaches. (i) The reduced dynamic range, emphasized in FFT receivers and single-run systems, can lead to underestimated measurements. (ii) The partial consideration of the disturbance (i.e., only its amplitude but not its shape in time) can make single-run systems susceptible to an erroneous calculation of clicks. Still, both approaches can be pursued with certain precautions: a specific circuitry to notify an overload condition of click analysers in general and the recording of both IF and quasi-peak channels in single-run systems. By thoroughly discussing the two issues and the related proposed precautions, we undermine popular claims of click analyser manufacturers and reconsider common beliefs about click analysers. We report on important technical aspects and scarcely known details, supporting our claims with simple lab tests and examples.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115075873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effect of power noise coupling between power via and signal via and its relationship with distance","authors":"Hank Lin, B. Tseng, Jackson Yen","doi":"10.1109/ISEMC.2016.7571606","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571606","url":null,"abstract":"The power switching noise caused by rapid charging and discharging has always been an issue in PDN (Power Delivery Network) design. This noise would not only deteriorate the stability of the power profile, it would also couple to signal transition via if the power via is placed nearby, resulting in deterioration of the overall system signal integrity. Therefore, the relative placement between power via and signal transition via is very important in board design. The relationship between effects of power-signal coupling and distance will be addressed in this paper and will be validated with both simulation results and measurement results from a real-case board design.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115536086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Going the distance: Aircraft and lightning, how far is far enough?","authors":"Christopher Fuller, F. Heather","doi":"10.1109/ISEMC.2016.7571714","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571714","url":null,"abstract":"With the limited data that is available this document serves the purpose to illustrate why aircraft should remain 25 nautical miles (NM) away from thunderstorms. There has been no extensive research on aircraft flying in or near thunderstorms since the 1980s, so data presented is from just normal naturally occurring lightning strikes. The studies show that 95-99% of all lightning strikes are within a 10 NM range; however, while uncommon, there are lightning strikes that can range from 20 to 30 NM [1][2]. Most aircraft agencies stress a 20 to 25 NM distance from thunderstorms. Finally in this paper we take a look at probability and risk estimations for an aircraft being struck by lightning and at what distances from storms is an acceptable level of risk reached. From the risk analysis of the two test cases we can see there are instances that indicate an acceptable level of risk within 25 NM, however it is not until then that a satisfactory level is reached across the board. Because of the studies and the risk assessment provided it seems reasonable why most pilots and aircraft agencies stress a 20 to 25 NM limit for avoiding thunderstorms.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"144 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116403989","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Chenxi Huang, Biyao Zhao, K. Shringarpure, S. Bai, X. Fang, T. Makharashvili, Hanqin Ye, Y. S. Cao, M. Cracraft, M. Cocchini, S. Connor, Q. Gaumer, S. Scearce, B. Archambeault, B. Achkir, E. Li, Lijun Jiang, A. Ruehli, J. Fan, J. Drewniak
{"title":"Power integrity with voltage ripple spectrum decomposition for physics-based design","authors":"Chenxi Huang, Biyao Zhao, K. Shringarpure, S. Bai, X. Fang, T. Makharashvili, Hanqin Ye, Y. S. Cao, M. Cracraft, M. Cocchini, S. Connor, Q. Gaumer, S. Scearce, B. Archambeault, B. Achkir, E. Li, Lijun Jiang, A. Ruehli, J. Fan, J. Drewniak","doi":"10.1109/ISEMC.2016.7571666","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571666","url":null,"abstract":"A decomposition method for the PCB PDN voltage ripple caused by the IC switching current is developed based on an equivalent circuit model from a cavity model. The decomposition is presented both in frequency domain and time domain. Along with this decomposition approach, a one-to-one correspondence between the voltage ripple and the geometry is revealed. Guidelines to decrease the PCB PDN voltage ripple is also discussed and corroborated by both simulation and analytical calculation.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114042710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Noise analysis of on-chip flexing crossbars with a geometric model","authors":"Serta Erdemir, A. Oruç","doi":"10.1109/ISEMC.2016.7571695","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571695","url":null,"abstract":"Recently, a new family of sparse crossbar switches, called flexing crossbars were introduced in [1] for on-chip networking. This paper describes a geometric approach that incorporates victim-aggressor noise models into the noise analysis and layout of such networks to minimize the crosstalk noise caused by the proximity of crosspoints and wires. It has been shown that flexing crossbars have less crosstalk noise than ordinary crossbars. The approach is sufficiently general enough to be applicable to other switching fabrics in which capacitive wire coupling effects dominate other noise factors.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123911665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Investigation on improvements in lightning retest criteria for spacecraft","authors":"Alex Terseck, D. Trout","doi":"10.1109/ISEMC.2016.7571739","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571739","url":null,"abstract":"Spacecraft are generally protected from a direct strike by launch the vehicle and ground structures, but protocols to evaluate the impact of nearby strikes are not consistent. Often spacecraft rely on the launch vehicle constraints to trigger a retest, but launch vehicles can typically evaluate the impact of a strike within minutes while spacecraft evaluation times can be on the order of hours or even days. For launches at the Kennedy Space Center where lightning activity is among the highest in the United States, this evaluation related delay could be costly with the possibility of missing the launch window altogether. This paper evaluated available data from local lightning measurements systems and computer simulations to predict the coupled effect from various nearby strikes onto a typical payload umbilical. Recommendations are provided to reduce the typical trigger criteria and costly delays.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123494495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Satyajeet Shinde, A. Patnaik, Tamar Makharashvilli, K. Masuda, D. Pommerenke
{"title":"Common mode current prediction from a power converter with attached cables based on a terminal equivalent circuit model","authors":"Satyajeet Shinde, A. Patnaik, Tamar Makharashvilli, K. Masuda, D. Pommerenke","doi":"10.1109/ISEMC.2016.7571766","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571766","url":null,"abstract":"An equivalent two terminal model based on Thevenin equivalents describes the common mode currents on the input and output side of a buck converter. A linear equivalent terminal model of the buck converter is created based on measured common mode currents for various common mode loads up to 300 MHz. The results using the terminal model agree well with the measurements for common mode load values that are within the range used for creating the terminal model, however, for loads far away from the characterization load range larger differences occur, as the power converter is a non linear circuit which is modelled by a linear equivalent circuit.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126457637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jiayi He, C. Hwang, Jingnan Pan, Gyuyeong Cho, Bumhee Bae, Hark-Byeong Park, J. Fan
{"title":"Extracting characteristic impedance of a transmission line referenced to a meshed ground plane","authors":"Jiayi He, C. Hwang, Jingnan Pan, Gyuyeong Cho, Bumhee Bae, Hark-Byeong Park, J. Fan","doi":"10.1109/ISEMC.2016.7571725","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571725","url":null,"abstract":"Meshed power and ground planes are commonly used in today's flexible printed circuit board (PCB). In this paper, a methodology to extract the effective characteristic impedance as well as the per-unit-length parameters of a transmission line with a meshed reference plane is proposed based on an equivalent transmission line model. The validity of this methodology is confirmed through comparison with full-wave simulations.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"47 12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126000358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On-site, quick and cost-effective techniques for improving the performance of EMI filters by using conducting bands","authors":"J. Bernal, M. Freire","doi":"10.1109/ISEMC.2016.7571679","DOIUrl":"https://doi.org/10.1109/ISEMC.2016.7571679","url":null,"abstract":"In this work we describe a simple and effective set of techniques to decrease the parasitic effects that undermine the performance of EMI filters at high frequencies. These techniques involve the use of bands of copper tape conveniently placed around the components of the filter. These techniques are practically cost-free and can be easily and quickly implemented on-site during pre-compliance tests to provide an increase of the attenuation of the filter at high frequencies. In some cases this can make it possible to avoid a re-design of the filter or the device under test. Moreover, these techniques can be used to readily determine whether a noise is of common mode or differential mode nature without altering the measuring setup, thus helping to speed up the re-design of the EMI filter if required and to avoid overdesign. We have constructed and measured several low pass filters mounting typical polyproyilene (PP) film capacitors and/or common-mode chokes to show the effectiveness of the proposed techniques. We obtain an equivalent circuit model that provides a physical explanation of the reduction of the parasitic inductance of capacitors. Also, we offer an explanation of the improvement achieved for the rejection of the common mode of chokes. Our results demonstrate that increases in filter attenuation at high frequencies go from approximately 3-4dB for simple shunt-capacitor filter to 10-15dB for a typical EMI filter.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121779661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}