2016 IEEE AUTOTESTCON最新文献

{"title":"Logging: Gaining access to the inner workings of your TPS","authors":"M. McGoldrick","doi":"10.1109/AUTEST.2016.7589567","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589567","url":null,"abstract":"This paper describes an enhanced test system software architecture that includes a general use facility for passing test program data from an executing test program set (TPS) to one or more support applications running in parallel with the TPS. These support applications may include tools to assist the TPS developer in debugging the TPS, characterizing the unit under test, archiving test results data, and other applications that a test organization may find relevant and helpful. The same test system software architecture can also be used by instrument vendors in the design and implementation of the debugging tools that accompany their instrument drivers and other software. The paper also includes a description of a possible implementation of such an architecture, and demonstrates how it can be used to simplify the development of multiple and diverse types of support applications with little to no impact on the development of the TPS itself.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116063298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A maintenance production tool for support equipment lifecycle management","authors":"Christopher J. Guerra, A. Dinh, C. Camargo","doi":"10.1109/AUTEST.2016.7589644","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589644","url":null,"abstract":"Aircraft maintenance managers encounter significant pressure to maintain the operational readiness of their aircraft fleet. In the commercial domain, the demands result from financial pressure to remain competitive with peers. In the military domain, maintenance managers must meet operational targets to achieve mission success. For daily operations, many managers use printed tabular sheets or manually updated spreadsheets to track aircraft and support equipment status. While this affords expediency to the maintenance managers, the approach limits the immediate communication of status changes to other levels of supervision and to others in the organization who have interest in the information. The status sheet runs the risk of being lost or being annotated inadvertently. This tracking method adds additional time to the overall maintenance production process because subordinate staff have to exchange the information with the maintenance manager. The approach discards information because the documentation is destroyed daily or as needed. Improvements to maintenance production could benefit from this data, or the maintenance manager could use the information to identify trends in the fleet. This research describes the initial considerations in developing a maintenance production tool for tracking the status of support equipment. The tool uses a web service architecture to enable either a closed or networked system topology. The system tracks individual items by their part numbers. Reported information for the support equipment includes quantity status (availability and required amount), problem reports, safety violations, etc. The tool provides the ability to identify obsolescence of the items and to plan for future investments to mitigate against deficiencies in the equipment. A method to numerically aggregate the issues allows the maintenance manager and management to use the data to analytically rank the support equipment, which most severely affects the maintenance production. The flexible framework with which the tool was developed will allow for extensions to support other facets of maintenance production. Future work could include integration with the tracking process for individual aircraft to monitor the configuration and status. As the data for the support equipment will be consolidated in one location, the trend based and predictive health maintenance analysis of the assets will be possible.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115086946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Inhibiting factors in design for testability higher education","authors":"D. Carey, R. Shannon","doi":"10.1109/AUTEST.2016.7589619","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589619","url":null,"abstract":"Many engineering students are not graduating with the necessary knowledge or experience in design for testability (DFT), automatic test equipment (ATE), or diagnostics in order to work in these fields. They typically do not demonstrate a consistent understanding of integrated diagnostics, or have an appreciation of the need. These same “fresh out” engineers will ultimately derive the low-level requirements for developing diagnostic systems, and this lack of knowledge of testing environments will have a significant impact. Failure to adequately address the integrated diagnostics and testing needs of a system greatly impacts its supportability and, consequently, the cost of that system throughout its life cycle. Integrated diagnostics is a career field for which there currently exists no standard set of basic qualifications, few educational opportunities to study at the university level, no clear processes within most organizations for practicing integrated diagnostics as a systems engineering activity, and no uniform method of sharing techniques and lessons learned with new employees. Studies have found that the majority of test engineer training is on-the-job, rather than knowledge acquired as part of a higher education degree program, or a formal training process [1]-[7]. As a result, it requires two to three years for any recent graduate to become competent in the field of test engineering. There are three main inhibiting factors to teaching design for testability as part of post-secondary education. The first factor is cost. The high cost, and quick obsolescence, of many ATE systems is a barrier to entry to any small- or medium-sized college's engineering department budget. Even accounting for corporate donations, there are hidden costs, such as facilities and equipment maintenance, which make ATE prohibitively expensive. Moreover, in the United States, all engineering curricula must be accredited by the Accreditation Board for Engineering and Technology (ABET). It is an arduous process, even for such well-worn topics as electrical engineering or mechanical engineering. A department chair is unlikely to risk the department's accreditation, or prolong the accreditation process, by including an exotic topic such as DFT or diagnostics. Finally, it is the goal of most institutions that their students will obtain employment upon graduation. To that end, curricula are often tailored to the demands of local employers. If surrounding industry is not asking for skilled diagnostic or DFT engineers, then there is no incentive for an engineering department to include it in a degree curriculum. This paper explores each of these factors in depth, and provides mitigations for overcoming the challenges that each presents.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133644494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE P1505.3™ Standard BAE manufacturing test interface implementation","authors":"M. Stora, R. Spinner, S. Mann, George Isabella, D. Droste, Larry Adams","doi":"10.1109/AUTEST.2016.7589622","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589622","url":null,"abstract":"This paper provides an overview of a manufacturing test implementation by BAE Systems, utilizing the “IEEE-1505.3-2015™ Universal Test Interface (UTI) Pin Map Configuration for Portable and Bench Top Requirements Utilizing IEEE Std 1505-2010TM”[2] [3]. This standard specifies requirements for a test interface system configuration framework and a physical pin map, to enable the interoperability of compliant interface Fixtures (also known as Interface Test Adapters [ITA], Interface Devices [ID], or Interconnection Devices), on multiple scalable Automatic Test Systems (ATS). The paper describes how the features and capabilities of the IEEE-1505.3-2015™ Standard were applied by BAE for their manufacturing test applications. This also served to validate the open standard as a high performance, multi-signal connector, scalable architecture applicable across all of its manufacturing applications. As a fundamental interface element of any Test Program Set (TPS) input/output (I/O) configuration (receiver/fixture structure), the 1505.3 standard implementation at the factory and subsequent migration to its government customer for depot use, can have significant benefits. These value-added benefits for the US Air Force are discussed regarding the vertical integration of a IEEE-1505.3-2015™ TPS being migrated from factory to depot.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133867664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A novel approach of test and fault isolation of high speed digital circuit modules","authors":"D. Shuming, Wang Yan, Cao Zijian","doi":"10.1109/AUTEST.2016.7589639","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589639","url":null,"abstract":"Along with the development of digitization and intelligentization for radar and other electronic equipment, high speed digital circuit (HSDC) modules involving CPU, DSP, FPGA and etc. are widely used in these electronic equipment. The highest bit rate of the HSDC modules can reach several Gbit/s or even higher, external interface for these modules adopt high speed interfaces such as RapidIO 2.0, PCI Express 2.0, 10G Ethernet and etc. The chips used by the module are usually packaged by BGA. The pins are hidden below the chip, so they are difficult to be tested by the test probe. The application of the new technology brings a great challenge to the test and the fault isolation of the HSDC module. The automatic test system(ATS) which is based on the traditional I/O module cannot meet the test requirements of the HSDC modules. This article analyses the test requirements of the HSDC module based on VPX bus, including : a) The requirement of generating high speed digital signal of multiple channels; b) The requirement of collecting high speed digital signal of multiple channels; c) The requirement of high speed adapter. This article proposes the HSDC module test system's architecture which is based on the VPX bus. It introduces the function and specifications of the key components in this test system's architecture. The key components consist of high speed digital IO module, high speed interface module and high speed digital signal interface's adapter. High speed digital IO module is used to generate and collect the signal of RapidIO, RocketIO and other high speed digital signal. High speed interface module is used for the interface of the high speed optical fiber signal and the high speed ethernet signal. The high speed digital signal interface's adapter is used for connection between high speed digital test modules and UUT. The article also brings forward the fault isolation method of HSDC module of combining boundary scan and embedded test. Boundary scan is used for isolating open circuit fault and short circuit fault of HSDC modules. Test probe is not required by this method. The embedded test includes the method based on the test IP kernel and the method based on module BIT. Utilizing the method based on the test IP kernel, we can test the signal on internal test point of FPGA and pins of other chips (e.g., RAM, DSP). Utilizing the method based on module BIT, the chips fault and interface fault can be detected. It introduces the difference between the HSDC module and the traditional digital circuit module in the development of test program. The test and diagnosis methods presented in this article have already been used in several kinds of HSDC module.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133634246","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Increasing the security on non-networked ground support equipment: Analyzing the implementation of whitelisting protection","authors":"Seth A. C. DeCato","doi":"10.1109/AUTEST.2016.7589629","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589629","url":null,"abstract":"Within the United States Air Force (USAF), dedicated non-networked computer systems are used to maintain aircraft electronic systems. Traditional security practices like anti-virus (AV) software have been used to protect the maintenance equipment from malware and exploitation by adversaries. Malware sophistication and prevalence from well financed digital adversaries is rising. New layers of digital security must be applied to these computer systems so that both maintenance equipment and aircraft are protected. This paper will focus on implementing application whitelisting software (AWS).","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"1076 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132945557","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Run-time reconfigurable instruments for advanced board-level testing","authors":"I. Aleksejev, A. Jutman, S. Devadze","doi":"10.1109/MIM.2017.8006390","DOIUrl":"https://doi.org/10.1109/MIM.2017.8006390","url":null,"abstract":"In recent years embedded instrumentation becomes a cutting-edge technology in the field of testing and measurements. In this paper, we propose a classification of different implementations of FPGA-based embedded instruments based on the format they are delivered to an end-user. Up to now, instruments provided as soft core IPs and hard macro blocks only were proposed. In this work, we present novel run-time reconfigurable (RTR) instruments, which are distributed as pre-compiled readyto-use bitstreams, and study their applicability for boardlevel test tasks. These instruments are designed in a special way that allows on-the-fly adaptation of the instrument to test the particular product. With the help of these RTR instruments one can considerably improve quality of tests for printed circuit board assemblies as well as reduce test time. Being integrated to the test setup, the instruments represent an automated and low-cost complementary solution for testing of complex high-performance boards and systems.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130586926","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A universal structure model for switches and its application to automatic test system","authors":"Xiuhai Cui, Shaojun Wang, Ning Ma, Yu Peng","doi":"10.1109/AUTEST.2016.7589624","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589624","url":null,"abstract":"Various types of switches are widely used in aerospace automatic test industry, such as toggle switch, tree switch, mux switch and matrix switch etc. Different types of switches have different drivers and development methods. To simplify the implementations of drivers and reduce the cost and time associated with developing new test systems. This paper proposes a universal model to define different types of switches. Based on such model, we develop a test system targeting various types of switches. In this system, we use backtrack searching algorithm to find the path between ends of switch. These different switches can use one kind of driver. To improve the interchangeability of instrument, the software architecture was built with IVI (Interchangeable Virtual Instrumentation) - COM (Component Object Model) driver architecture. Our test system has been verified in actual PXI (PCI eXtensions for Instrumentation) system and VXI (VME eXtensions for Instrumentation) system.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129347519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Fatigue damage detection for advanced military aircraft structures","authors":"Paul Braden","doi":"10.1109/AUTEST.2016.7589592","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589592","url":null,"abstract":"Modern military aircraft are evolving into more sophisticated structures, with exotic new materials and stealthy designs. But in all of the advances, what is the implication for overhaul procedures and tooling? Looking at implementation of new technologies employed by the Air Force for the repair of aging F-16's, A-10's, KC-135's and C-130's, we can see how the new fleet of F-35's, F-22's and KC-46's will face certain unexpected challenges that deserve proper review and analysis. One primary concern is the widespread use of composite skins on the wings of fighter planes. There are several key advantages but few manufacturers have understood the complications from repairing these materials. For instance, on the F-16, the horizontal tail is made of carbon fiber riveted to aluminum subsurface. Besides the difficulties in finding the fractures, there are relatively few repair procedures for mitigating these problems like there are in classic sheet metal work. In this presentation, we analyze the most recent advances to address the overhaul concerns arising from composite skins in military aircraft. A cost analysis is presented to show the various reasons why composite skins may cause a headache for the military as the technology of detection and repair tries to catch up to these advanced new materials. Some computations will also be performed to show the reduction in strength over time for carbon fiber composites as compared to 7475 series aluminum. Simulations that focus on the growth of expected cracks that may escape NDI will be presented to show the difference in damage and fatigue life between the two materials and how current inspections will need to be improved to solve this difficult problem.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123775122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Reducing the cost of test through strategic asset management","authors":"D. Lowenstein, C. Slater","doi":"10.1109/AUTEST.2016.7589569","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589569","url":null,"abstract":"For most aerospace and defense companies, test and measurement equipment is one of the largest, if not the largest, capital expenses on their balance sheets. With that said, few companies have a comprehensive, corporate wide program to effectively manage and maximize the utilization of test and measurement equipment over its projected lifetime. Other industries, such as power generation, airlines and foundries, have been able to master optimization and utilization of their capital to maximize their return on investment. This paper will explore the balance of the three fundamental aspects that make up asset management and will focus on how to implement strategies to lower the total cost of ownership for test. The three areas addressed in this paper are: 1. Management of the “real” asset profile - the number and capabilities of assets across an enterprise. 2. The ability to maximize the optimization and utilization of the assets on a continuous basis. 3. Schemes to develop and implement life cycle strategies for test and measurement assets. The implementation and usage of an asset management program can have huge positive implications, not only on reducing capital costs, but on faster throughput, lower operational expenses, shorter time to market, and even better quality; all of these allow a company to be more competitive in the new firm fixed contract world.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129113491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}