运行时可重构仪器,用于高级板级测试

I. Aleksejev, A. Jutman, S. Devadze
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引用次数: 4

摘要

嵌入式仪器是近年来测试测量领域的一项前沿技术。在本文中,我们提出了基于fpga的嵌入式仪器的不同实现的分类,基于它们交付给最终用户的格式。到目前为止,只提出了软核ip和硬宏块的工具。在这项工作中,我们提出了新的运行时可重构(RTR)仪器,它们作为预编译的即用型比特流分发,并研究了它们在板级测试任务中的适用性。这些仪器以一种特殊的方式设计,允许对仪器进行动态调整以测试特定的产品。在这些RTR仪器的帮助下,可以大大提高印刷电路板组件的测试质量,并缩短测试时间。这些仪器集成到测试装置中,为测试复杂的高性能电路板和系统提供了自动化和低成本的补充解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Run-time reconfigurable instruments for advanced board-level testing
In recent years embedded instrumentation becomes a cutting-edge technology in the field of testing and measurements. In this paper, we propose a classification of different implementations of FPGA-based embedded instruments based on the format they are delivered to an end-user. Up to now, instruments provided as soft core IPs and hard macro blocks only were proposed. In this work, we present novel run-time reconfigurable (RTR) instruments, which are distributed as pre-compiled readyto-use bitstreams, and study their applicability for boardlevel test tasks. These instruments are designed in a special way that allows on-the-fly adaptation of the instrument to test the particular product. With the help of these RTR instruments one can considerably improve quality of tests for printed circuit board assemblies as well as reduce test time. Being integrated to the test setup, the instruments represent an automated and low-cost complementary solution for testing of complex high-performance boards and systems.
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