2016 IEEE AUTOTESTCON最新文献

A new category of software-defined instrumentation for wireless test 一种用于无线测试的新型软件定义仪器

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589614

T. Helaly, N. Adnani

{"title":"A new category of software-defined instrumentation for wireless test","authors":"T. Helaly, N. Adnani","doi":"10.1109/AUTEST.2016.7589614","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589614","url":null,"abstract":"The past decade has seen an exponential proliferation of wideband radio communication technologies. The drive toward wider bandwidths and increasingly complex modulations presents unique challenges from a test and measurement perspective. At the same time, device manufacturers typically have to contend with decreasing product margins and shrinking test equipment budgets. This trend is going to accelerate with the rapid proliferation of newer Internet of Things, 5G and their unique test requirements. This paper introduces a new category of software-defined, headless wireless signal analyzer. Distinguished by its cost-effectiveness, small form-factor, networkability and enhanced performance specifications, this product enables a range of new test applications that could not be effectively addressed by legacy benchtop, modular and handheld spectrum analyzers. The software-defined aspect enables the user to take advantage of an external host processor such as that in a laptop or desktop. Additionally, software modules for specific modulation formats can be utilized with a common hardware platform. This paper describes key attributes and architecture of the wireless signal analyzer platform and how it differs from conventional benchtop, modular and handheld test equipment.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124609397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Automated maintenance path generation with Bayesian networks, influence diagrams, and timed failure propagation graphs 使用贝叶斯网络、影响图和定时故障传播图自动生成维护路径

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589574

S. Oonk, F. J. Maldonado

{"title":"Automated maintenance path generation with Bayesian networks, influence diagrams, and timed failure propagation graphs","authors":"S. Oonk, F. J. Maldonado","doi":"10.1109/AUTEST.2016.7589574","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589574","url":null,"abstract":"Large and complex systems such as space vehicles, power plants, manufacturing facilities, oil refineries, gas delivery systems, among others often have networks of alarms monitoring basic parameters (e.g. high or low temperature, voltage out-of-tolerance, power loss, etc.) which are correlated to failure modes, but not necessarily in a very direct way. In this paper, we present a plurality of graph-based methods which are combined in a novel way for the automated analysis of a system's alarms (or any other observable discrepancies) to determine the most appropriate maintenance. Specifically: (i) Timed Failure Propagation Graphs (TFPG) and/or Bayesian Networks (BN) read alarms as evidence for conducing backward root-cause diagnosis and forward failure effects analysis while (ii) Influence Diagrams (ID) select optimal maintenance operations considering the likely causes and effects as well as the utility of available maintenance options. Innovative contributions to these individual techniques include an automated BN instantiation methodology and system/sensor TFPG diagnostic algorithms. The overall proposed system then determines optimal maintenance paths suggested to be conducted by personnel.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125457358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

An Ethernet and USB-based compact automated field test equipment for mobile surveillance and reconnaissance systems 一种基于以太网和usb的紧凑型自动化现场测试设备，用于移动监视和侦察系统

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589577

Onder Unver, Cem Cigdemoglu

引用次数: 0

Anomaly detection in analog circuits using Support Vector Data Description 基于支持向量数据描述的模拟电路异常检测

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589573

Yang Yu, Yueming Jiang, Yanmei Lv, Yongxue Ma, Xiyuan Peng

引用次数: 0

Distributed wireless sensor network system for electric field measurement 分布式无线传感器网络电场测量系统

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589597

Dawei Deng, Haiwen Yuan

引用次数: 2

Tapping into boundary scan resources for vehicle health management 利用边界扫描资源进行车辆健康管理

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589618

L. Ungar, M. Sudolsky

{"title":"Tapping into boundary scan resources for vehicle health management","authors":"L. Ungar, M. Sudolsky","doi":"10.1109/AUTEST.2016.7589618","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589618","url":null,"abstract":"Design for testability (DFT) should go beyond simply assisting manufacturing test or even beyond fielded unit troubleshooting. Boundary scanned components can be controlled to collect real time snapshots of signals capable of assessing circuit health in situ without interfering with normal operation or flight. Vehicle Health Management (VHM) frameworks can utilize the information gained from SAMPLE instructions gathered by JTAG/IEEE-1149.1 boundary scan compatible ICs using Boeing On-Line Diagnostic Reporting (BOLDR®) techniques to enable this data collection for assessing what maintenance actions should be taken. Boundary scan data at or around the time that failures take place can be collected as historical information and retained as “evidence” during a call for line replaceable unit (LRU) maintenance actions. First, it can help assess whether built-in test (BIT) or embedded test indications are persistent, continuous for certain operational modes, intermittent, or simply spurious. In other words, it can help determine false alarms (FAs). Second, once LRUs are in the repair facility and a No Fault Found (NFF) situation is encountered, the historical evidence can help determine the root cause and direct repair actions. Distributed and Centralized BIT for VHM data acquisition can be enhanced by the information boundary scan data provides. Many LRUs that already have boundary scan hardware can utilize embedded software updates coupled with BOLDR® VHM techniques with minimal if any hardware changes to take advantage of this added information source. This paper details how SAMPLE and BOLDR® can be used without major changes in legacy or new avionics.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115068498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

U-TEST® — An innovative test platform to accelerate the entry-into-service of military and civil electronic systems U-TEST®-一个创新的测试平台，加速军用和民用电子系统的投入使用

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589580

Loup Foussereau, Gerard Delfour, J. Ardussi

{"title":"U-TEST® — An innovative test platform to accelerate the entry-into-service of military and civil electronic systems","authors":"Loup Foussereau, Gerard Delfour, J. Ardussi","doi":"10.1109/AUTEST.2016.7589580","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589580","url":null,"abstract":"The aerospace industry is constantly in need of better tools to improve the speed and accuracy of airborne electronic systems development. Certification of compliance with design requirements typically requires the simultaneous testing of multiple components. Any delay in their availability, or unexpected need for a partial redesign, can adversely impact the timing and cost of the final product. The later the problem arises in the development cycle, the costlier will be the corrective action. To address this industry concern, Spherea has successfully introduced an integration test platform called U-TEST®. The U-TEST® ATE platform is specifically designed to span the transition between all phases of integration testing, including laboratory simulation, supplier component test stand, air-framer test stand, “Iron Bird,” a/c ground test and a/c flight test. It accomplishes this in part through the use of sophisticated modeling and interoperable test vectors, as described below. The use of industry standard programming interfaces maximizes its availability to a broad customer set. In this paper the authors will outline the basic features of the U-TEST® system, and share the results of previous customer use.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"4 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121895086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Modulation identification for cognitive aeronautical air-ground communications 认知航空地空通信的调制识别

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589641

H. Al-Hraishawi, L. Gupta

引用次数: 1

Noncontact sensors and Nonintrusive Load Monitoring (NILM) aboard the USCGC spencer USCGC spencer上的非接触式传感器和非侵入式负载监测(NILM)

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589633

Peter A. Lindahl, S. Leeb, J. Donnal, Greg Bredariol

引用次数: 11

High-speed FPGA configuration and testing through JTAG 通过JTAG对高速FPGA进行配置和测试

2016 IEEE AUTOTESTCON Pub Date : 2016-09-01 DOI: 10.1109/AUTEST.2016.7589601

Ammon Gruwell, Peter Zabriskie, M. Wirthlin

引用次数: 24