2016 IEEE AUTOTESTCON最新文献

{"title":"A case study: Dividing tests of interdependent units into independent test systems","authors":"Volkan Ozdemir","doi":"10.1109/AUTEST.2016.7589623","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589623","url":null,"abstract":"There are many units in weapon systems; that communicate with each other and supply necessary signals to related units. The complicated hardware and software interfaces of these systems make designing tests for production more challenging. In order to test a unit individually, without the other units existing in the test system, some serious test design work must be done for simulating the functions of other units. To design a well-balanced test application, commercially available test equipment must be used, since maintenance of the test system gets harder if unique test boards are designed instead of using general test equipment. In this paper, a case study which has two main units and three electronic boards is explained. These Units Under Test (UUT)are highly dependent on each other and unique output of one unit is the unique input of other units. Some signals even cannot be produced if the designated input is not wired to the UUT. These units and electronic cards communicate with each other using RS422 and Can-Open during the operation continuously. The communication rules are so strict that even only one random message is missing than the communication of the system fails. To design a test system that simulates functions of these units and communicates with UUT's at the same time by serial channel and CAN-Open, some serious time is needed. However, if the test designer has a limited time, then the process of designing must be flawless and systematic. With years of experience in the test design area, ASELSAN has excelled its own test development process in order to work under pressure and limited time. Dividing the test design process into different parts and building a closed loop control system around it lower the necessary time to develop tests dramatically. Throughout this paper, ASELSAN's way of designing a test system is clearly explained with a challenging weapon system.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117081268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A universal method for implementing IEEE 1588 with the 1000M Ethernet Interface","authors":"Zhaoqing Liu, Dongxing Zhao, Min Huang, Yigang Zhang","doi":"10.1109/AUTEST.2016.7589598","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589598","url":null,"abstract":"This paper proposed a universal method for implementing PTP (Precision Time Protocol) for test systems with the 1000M Ethernet Interface. To achieve the synchronization accuracy of sub-microsecond, the configurable real-time clock and the time stamp module were realized in the programmable logic which makes the PHY and MAC to be free of time stamp functions in the communication link. PTPd (Precision Time Protocol deamon, an open source implementation) was modified and transplanted into the embedded Linux system to realize PTP state machine while the IEEE 1588 IP core device driver was developed to provide the application layer with access to the accurate time-stamp obtained in link layer by IEEE 1588 IP core. This project structure makes the transplantation process concentrate on the time adjustment algorithm design in the application layer regardless of obtaining a precise time stamp in the hardware. The proposed method was evaluated on the Xilinx Zynq-7000 SOC platform by outputting PPS (Pulse Per Second) which can verify the synchronization accuracy of all nodes (master and slaves) in the network. After quantifying the accuracy and stability of the synchronization offset, we concluded that clock frequency offset and network transmission delay are the main influence factors for synchronization and proved the feasibility of maintaining submicrosecond-level synchronization accuracy within multi-level switch topology.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121413354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Fault diagnosis and augmented reality-based troubleshooting of HVAC systems","authors":"Rajeev Ghimire, K. Pattipati, P. Luh","doi":"10.1109/AUTEST.2016.7589590","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589590","url":null,"abstract":"Maintaining Heating, ventilating and air conditioning (HVAC) systems in buildings and vehicles in superior condition is essential to energy waste minimization, increased equipment availability and improved thermal comfort of occupants. HVAC systems are complex interconnected systems. Consequently, early detection and diagnosis of incipient faults in such systems using robust methodologies and tools is salient for achieving thermal comfort. The increased complexity, cross-subsystem fault propagation, and the associated information propagation delays in networked HVAC systems makes fault diagnosis and maintenance a challenging task. This motivates us to incorporate the emerging technologies, such as real-time monitoring, remote diagnosis and augmented reality (AR) technologies, for efficient fault diagnosis and troubleshooting in such systems. This paper presents an integrated AR-based framework to monitor an HVAC system (or any cyber-physical system) in real-time, access system health information remotely and act on that information proactively to prevent or minimize the system down time.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123838693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A method for storing semiconductor test data to simplify data analysis","authors":"Jeremy W. Webb","doi":"10.1109/AUTEST.2016.7589630","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589630","url":null,"abstract":"The automated testing of semiconductor wafers, integrated circuits (IC), and surface mount devices generates a large volume of data. These devices are tested in stages and their test data is typically collected in log files, spreadsheets, and comma separated value files that are stored at both the foundry and on-site on file shares. Building a cohesive picture of the quality and performance of these devices can be difficult since the data is scattered throughout many files. In addition, tracking any deviations in performance from wafer to wafer by analyzing historical process control monitoring (PCM) test data is a manual, laborious task. Collecting the test data from multiple sources (e.g., foundries and contract manufacturers) can be cumbersome when manual intervention is required. Automating the transfer of test data from third party servers to on-site file shares is crucial to providing a consistent method of accessing the data for analysis. This paper provides a method of both implementing a database for storing test data collected at the various stages of IC manufacturing, as well as automating the retrieval and import of test data into the database from all relevant sources.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125946378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Diskless clients in modern ATE","authors":"W. J. Headrick, Scott Jennings","doi":"10.1109/AUTEST.2016.7589576","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589576","url":null,"abstract":"For modern Automatic Test Equipment, it is not unusual to have multiple computers making up a single system. One issue with having multiple computers is the requirement for each computer to have a disk drive and associated operating system. This becomes an issue in environments that require periods processing, as each system must be cleared prior to moving from one operating state to another. This process can become even more complicated by the fact that some of the computers may be installed in places that are not readily accessible for quick turnaround. In addition, these computers require additional disk drives to support the operation in each mode. In order to reduce the complexity of periods processing, a scheme of diskless operation can be used to allow multiple computers to share a single disk drive off a master computer. This paper will describe a method to handle just such a complex scenario. In this particular instance, several computers are hosted running multiple operating systems off of one main computer's hard drive. This allows for quick and reliable periods processing to be performed while maintaining acceptable performance. With the advent of cheap Solid State Disk drives and fast intelligent managed switches, the performance of the overall system is actually not impacted much at all. Modern operating systems and tools provide the capability to implement diskless nodes in a fairly straightforward manner. While this technology is not new by any means (older ATE used Sun computers in a diskless configuration), modern technology makes this easy to implement and provides a performance close enough to a disk based system to be an effective solution. In addition, by removing the extra disks, not only is the periods processing time reduced, but the margin of error in completing the conversion is reduced to the one drive.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122276528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Solar Probe Plus (SPP) wrap around automated testing","authors":"Tony Parker","doi":"10.1109/AUTEST.2016.7589611","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589611","url":null,"abstract":"The Solar Probe Plus (SPP) mission, under NASA's Living with a Star program, will fly a spacecraft (S/C) through the sun's outer corona. The mission will gather data on the processes of coronal heating, solar wind acceleration, and production, evolution and transport of solar energetic particles. The spacecraft has an Electrical Power System or EPS that has to undergo testing before delivery to the spacecraft for integration and testing. The specific unit to be delivered is called the Power System Electronic box or PSE. The PSE relies on a novel S/A control algorithm which autonomously positions the wings to optimize the thermal load while maintaining adequate electrical power. A Wrap Around Automated Testbed (WAAT) containing various Ground Support Equipment (GSE) has been designed to test the PSE in real-time. The major components of the Testbed consist of a dynamic solar array simulator (SAS); A Battery Simulator to emulate the spacecraft flight battery; An EPS emulator to control command and telemetry to the PSE. This EPS emulator also provides a fast serial link for incident radiant flux on the S/A wings for any wing angle, S/C attitude and shadow condition during any point in the mission computed via a Simulink model to the SAS based on PSE telemetry. The EPS emulator will also provide any necessary loads, power supplies and temperatures and A script engine that will allow communication between all GSE and provide complete automation. This WAAT provides the user the ability to test the PSE or any other Unit Under test including board or slice level designs by having command and telemetry specific to that particular GSE. Each GSE then becomes part of an entire Testbed completely under automated control by tying it to a single script engine on a server. With the exception of the script engine each GSE has a PXI controller and is using PXI modules to accomplish various tasks including controlling and communicating with multiple Digital Signal Processors (DSPs). The WAAT can travel with the PSE or the UUT to automate the process for environmental testing before delivery to the spacecraft. The WAAT can also be used for back up testing in the event any anomalies that occur during spacecraft integration or flight.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127753822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"KORAT — A platform independent test automation tool by emulating keyboard/mouse hardware signals","authors":"Yung-Pin Cheng, Deron Liang, Wei-Jen Wang","doi":"10.1109/AUTEST.2016.7589572","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589572","url":null,"abstract":"Software, ranging from firmware, BIOS, and embedded software to complex software products, can only be tested by designing test cases to go through code and then verifying the results with expected outcomes. When code is changed frequently, regression testing is critical to ensure that changes do not introduce new faults. However, depending on the input types of the system under test (SUT), regression tests often require testers to drive the SUT manually, mainly by keyboard and mouse. In the meantime, testers play an important role as test oracle to determine the correctness of a test run by observing if the SUT behaves abnormally. Regression tests can be automated by programming or adopting testing tools. The most cost-effective approach supported by some commercial testing tools is capturing the testing behaviors of a human tester and then replaying the tests to assert the correctness. Unfortunately, most capture/replay tools are designed for testing the software which must be executed under a general-purpose O.S. They are inapplicable to many software systems, such as embedded software, BIOS, etc. In this paper, a capture/replay testing tool called KORAT is proposed. KORAT adopts a hardware component to intercept and emulate keyboard/mouse signals to drive an SUT as if the SUT is interacting with a human. A tester can design and operate a test case on a correct SUT to record the behaviors into a KORAT test script, in which no programming skills are required. In a regression run, the test case is replayed and the correctness is asserted automatically by analyzing SUT's video output (aka, images) and sending keyboard and mouse signals smartly. The correctness of a replay run can be asserted by image recognition, optical character recognition (OCR), and ASCII string matching via networking. Since KORAT only interfaces the video output of a SUT, it is platform independent and non-intrusive; meaning there is no performance interference caused by KORAT's capture and replay. A real application of KORAT to BIOS regression testing of industrial computer (militarized computers) manufacturing is described.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116642210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Digital radio frequency memory synthetic instrument enhancing US Navy Automated Test Equipment mission","authors":"C. P. Heagney","doi":"10.1109/AUTEST.2016.7589583","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589583","url":null,"abstract":"This research project aims to expand the capability of current US Navy Automated Test Equipment (ATE) family of testers known as the Consolidated Automated Support System (CASS). Industry research is now focused on breaking the historical construct of test equipment. Advances in the field of Synthetic Instruments have opened the door to test avionics in new ways. Every year new capabilities are developed using core hardware and increasingly capable software modules to create complex waveforms. This research creates a Digital Radio Frequency Memory (DRFM) Synthetic Instrument that can be programmed to perform a wide array of low latency Radio Frequency (RF) tests. Synthetic Instruments are defined as a concatenation of hardware and software modules used in combination to emulate a traditional piece of electronic instrumentation. This Synthetic Instrument couples high speed Analog-to-Digital Converters (ADC) to high speed Digital-to-Analog Converters (DAC) with Field Programmable Gate Arrays (FPGA) in between for digital signal processing. An RF front end is used to down convert the RF to baseband where it is sampled, modified, and up converted back to RF. The FPGA performs Digital Signal Processing (DSP) on the signal to achieve the desired output. Application of this DRFM in automated testing is demonstrated using a Reconfigurable Transportable Consolidated Automated Support System (RTCASS) tester at Naval Air Systems Command (NAVAIR) Jacksonville, FL. The Unit Under Test (UUT) is an ALQ-162 Defensive Electronic Countermeasures (DECM) receiver-transmitter. Ultra-low latency signals are generated to simulate enemy jamming stimulus. As the ALQ-162 detects and responds to the input, the DRFM switches to a new frequency. The time taken by the ALQ-162 to acquire, respond, and re-acquire is measured. This test confirms the internal Yttrium Iron Garnet (YIG) oscillator meets slew specifications. Currently Navy ATE can only test RF units using high latency steady state tests. This research project developed a supplemental unit that can be added to the VXI chassis in the CASS family of testers and conduct ultra-low latency active tests. The instrument acts as hardware-in-the-loop to perform real-time tests including a new capability to measure jamming response time from DECM avionics. Demonstrated performance capabilities include: latency <; 100 ns, output Spurious-Free Dynamic Range (SFDR) > 80 dBc, input SFDR > 60 dBc, frequency tuning resolution <; 2 Hz, and frequency settling time <; 0.5 ns. New RF capabilities developed by this effort parallel similar research ongoing for digital test instruments like the Teradyne High Speed Subsystem. Incorporating this Digital RF Memory synthetic instrument into current and future ATE will improve readiness and supportability of the fleet. Improvements demonstrated by this research project will expand the type and quantity of assets able to be tested by current and future ATE.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"208 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132437792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Modern technologies are biting off more than our test systems can chew","authors":"Neil Baliga","doi":"10.1109/AUTEST.2016.7589578","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589578","url":null,"abstract":"Despite billions spent on software in testing aerospace and high technology products, companies are still struggling to keep up with Moore's law and shorter schedules. This results in excessive software development, hard to analyze data, manual labor that slows the disposition cycle time, lower production rates, and costly errors in high-value DUT's. Modern technology has delivered a one-two punch for aerospace manufacturing organizations. The first blow is the increased complexity of devices; existing test systems are stretched beyond their capabilities and require major rework and iteration. The second fatal blow is the pressure on test organizations to release on extremely short schedules and budgets due to rising competition in the industry. This paper presents two key concepts to mitigate the effects of the new technology revolution on your test systems - Modularity and Scalability. These are not new concepts; this paper will, however, discuss what these concepts mean for test systems, and also cover how to implement and combine the them to reduce recurring costs and technical risk in your test organizations.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127759572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"TPS metrics extraction software for resource management","authors":"J. Luna, M. Morgan, C. Geiger","doi":"10.1109/AUTEST.2016.7589596","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589596","url":null,"abstract":"The Navy has a large set of Test Program Set (TPS) code and associated data that are an untapped resource in Automatic Test System (ATS) planning and support. The ability to relate test instrument capabilities to TPS source data and ATS usage data would provide a comprehensive look at how avionics maintenance is performed. This could identify economic targets of opportunity for the deployment of new and innovative test techniques. Currently the technology does not exist to tap into the available TPS code and associated data. The objective of this effort was to develop a software toolset that provides an innovative capability to extract usage metrics from TPS source code and ATS log data. This paper describes an effort focused on defining and developing a complete data metrics generation concept for the aggregation and analysis of ATE and TPS data. This is a new capability that parses TPS source code and extract metrics that leverages other sources of data, such as log data and UUT maintenance data. The result of the process is the creation of TPS and ATS component usage metrics that can be used to support usage analyses. As a result of this effort, concept software for metrics extraction and analysis from TPS source code and TPS log files was successfully demonstrated. A key goal of this capability is to show how standard Navy maintenance data for Weapon Replaceable Assembly (WRA) and Subsystem Replaceable Assembly (SRA) testing can be merged with TPS data to determine enterprise utilization and prediction of future utilization based on predicted maintenance demand data.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127917886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}