IEEE P1505.3™ Standard BAE manufacturing test interface implementation

Abstract

This paper provides an overview of a manufacturing test implementation by BAE Systems, utilizing the “IEEE-1505.3-2015™ Universal Test Interface (UTI) Pin Map Configuration for Portable and Bench Top Requirements Utilizing IEEE Std 1505-2010TM”[2] [3]. This standard specifies requirements for a test interface system configuration framework and a physical pin map, to enable the interoperability of compliant interface Fixtures (also known as Interface Test Adapters [ITA], Interface Devices [ID], or Interconnection Devices), on multiple scalable Automatic Test Systems (ATS). The paper describes how the features and capabilities of the IEEE-1505.3-2015™ Standard were applied by BAE for their manufacturing test applications. This also served to validate the open standard as a high performance, multi-signal connector, scalable architecture applicable across all of its manufacturing applications. As a fundamental interface element of any Test Program Set (TPS) input/output (I/O) configuration (receiver/fixture structure), the 1505.3 standard implementation at the factory and subsequent migration to its government customer for depot use, can have significant benefits. These value-added benefits for the US Air Force are discussed regarding the vertical integration of a IEEE-1505.3-2015™ TPS being migrated from factory to depot.