高等教育可测试性设计的抑制因素

D. Carey, R. Shannon
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引用次数: 1

摘要

许多工程专业的学生毕业时并没有在可测试性设计(DFT)、自动测试设备(ATE)或诊断方面具备必要的知识或经验,因此无法在这些领域工作。他们通常没有表现出对综合诊断的一致理解,或者没有认识到需要。这些同样的“新手”工程师将最终得出开发诊断系统的低级需求,并且缺乏测试环境知识将产生重大影响。如果不能充分处理系统的集成诊断和测试需求,将极大地影响系统的可支持性,从而影响系统在整个生命周期中的成本。综合诊断是一个职业领域,目前没有标准的基本资格,在大学水平上学习的教育机会很少,在大多数组织中没有将综合诊断作为系统工程活动进行实践的明确流程,也没有统一的方法与新员工分享技术和经验教训。研究发现,大多数测试工程师的培训是在职的,而不是作为高等教育学位课程的一部分获得的知识,或者是一个正式的培训过程。因此,任何应届毕业生都需要两到三年的时间才能胜任测试工程领域的工作。作为高等教育的一部分,可测试性教学设计有三个主要的抑制因素。第一个因素是成本。许多ATE系统的高成本和快速过时是进入任何中小型大学工程部门预算的障碍。即使算上企业捐款,也存在隐性成本,如设施和设备维护,这使得ATE的成本高得令人望而却步。此外,在美国,所有的工程课程都必须通过工程技术认证委员会(ABET)的认证。这是一个艰巨的过程,即使对于电气工程或机械工程这样老生常谈的课题也是如此。系主任不太可能冒着部门认证的风险,或延长认证过程,包括一个外来的主题,如DFT或诊断。最后,它是大多数机构的目标,他们的学生将在毕业后就业。为此,课程通常是根据当地雇主的需求定制的。如果周围的行业不需要熟练的诊断或DFT工程师,那么工程部门就没有动力将其纳入学位课程。本文深入探讨了这些因素中的每一个,并提供了克服每个因素带来的挑战的缓解措施。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Inhibiting factors in design for testability higher education
Many engineering students are not graduating with the necessary knowledge or experience in design for testability (DFT), automatic test equipment (ATE), or diagnostics in order to work in these fields. They typically do not demonstrate a consistent understanding of integrated diagnostics, or have an appreciation of the need. These same “fresh out” engineers will ultimately derive the low-level requirements for developing diagnostic systems, and this lack of knowledge of testing environments will have a significant impact. Failure to adequately address the integrated diagnostics and testing needs of a system greatly impacts its supportability and, consequently, the cost of that system throughout its life cycle. Integrated diagnostics is a career field for which there currently exists no standard set of basic qualifications, few educational opportunities to study at the university level, no clear processes within most organizations for practicing integrated diagnostics as a systems engineering activity, and no uniform method of sharing techniques and lessons learned with new employees. Studies have found that the majority of test engineer training is on-the-job, rather than knowledge acquired as part of a higher education degree program, or a formal training process [1]-[7]. As a result, it requires two to three years for any recent graduate to become competent in the field of test engineering. There are three main inhibiting factors to teaching design for testability as part of post-secondary education. The first factor is cost. The high cost, and quick obsolescence, of many ATE systems is a barrier to entry to any small- or medium-sized college's engineering department budget. Even accounting for corporate donations, there are hidden costs, such as facilities and equipment maintenance, which make ATE prohibitively expensive. Moreover, in the United States, all engineering curricula must be accredited by the Accreditation Board for Engineering and Technology (ABET). It is an arduous process, even for such well-worn topics as electrical engineering or mechanical engineering. A department chair is unlikely to risk the department's accreditation, or prolong the accreditation process, by including an exotic topic such as DFT or diagnostics. Finally, it is the goal of most institutions that their students will obtain employment upon graduation. To that end, curricula are often tailored to the demands of local employers. If surrounding industry is not asking for skilled diagnostic or DFT engineers, then there is no incentive for an engineering department to include it in a degree curriculum. This paper explores each of these factors in depth, and provides mitigations for overcoming the challenges that each presents.
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