2016 IEEE AUTOTESTCON最新文献

{"title":"Integrating software data loaders into ATE systems","authors":"T. Troshynski","doi":"10.1109/AUTEST.2016.7589607","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589607","url":null,"abstract":"The Integrated Modular Avionics (IMA) concept has been adopted into several new military and commercial aircraft programs such as the F-22, F-35, Airbus 380, and Boeing 787. The goal of the IMA concept is to reduce the number and varieties of hardware computing modules and to increase the portability of avionics software. The IMA concept is currently being driven by industry initiatives such as the Future Airborne Capability Environment (FACETM) Consortium. It can also be seen in new industry standards such as ARINC 653 which defines an avionics application standard software interface. As a result of the adoption of the IMA concept, new avionics hardware modules are becoming increasingly generic, multipurpose, and reconfigurable based on the loaded software applications. Therefore, the automated test equipment (ATE) used to support maintenance and service of these new avionics systems must consider the use of standard approaches for handling loadable avionics software such as ARINC 615 and 615A software data loaders. This paper provides a brief technical overview of IMA systems and ARINC software data load protocols. It also explores strategies for integrating software data loaders into ATE systems that are required to support IMA based Units Under Test.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129542377","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Automating atmospheric neutron testing: Minimizing cost and improving statistical certainty","authors":"Matthew J. Smith, Lawrence M. Kent, James J. Montante","doi":"10.1109/AUTEST.2016.7589615","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589615","url":null,"abstract":"Accurate radiation-induced event-rate predictions are critical in establishing expected electronic equipment performance in natural space and terrestrial avionic environments. Some sources of uncertainty, like environmental software models, cannot easily be improved. However, the statistical certainty of collected data, facility rental expense, and engineering man-power can be optimized through high fidelity automated test. The investment in automated test development results in a lower overall cost of a test campaign, while simultaneously maximizing statistical certainty of the collected data. This is achieved by tailoring the automated test to expedite the event data capture per unit of real time at atmospheric neutron test facilities.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115254755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The practical aspects of TPS resource data discovery","authors":"L. Kirkland","doi":"10.1109/AUTEST.2016.7589565","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589565","url":null,"abstract":"Performing a complete and accurate desktop analysis of a Test Program Set (TPS) with all the supporting data can be an extremely exhaustive experience. True TPS transparency has plagued the world of test and diagnosis for decades. Programs managers and users have a need to know exactly how the TPS works and how the Automatic Test Equipment (ATE) resources are allocated. It is fundamental to automatically make available a total envelope of TPS instrument usage and determine or make suggestions about TPS resource allocation considerations or facts. Exposing TPS facts which are somewhat hidden and providing guidance to aid in the determination of planning and support is important for process improvement. The evaluation of ATE resource allocation for a group of TPSs will aid in ATE design engineering. TPS resource transparency needs to be made available to all high level users and managers. Those who use a TPS and those who manage or oversee TPSs should have the resource data readily available to evaluate the TPS to know things like resource allocation usage and how the resources are used to expose TPS instrument requirements for future development and support. There are many pertinent and critical aspects which pertain to instrument settings and usage. Instrument or resource evaluation for a TPS is a much needed notion to judge test program performance and long term support. ATE resource utilization, selection, and recurrent problems of specific instruments, programming techniques or instrument settings can be revealed. There is a potential to refine the way a unit is tested, how resources are allocated and if resources can be optimized. Optimal resource allocation can potentially lower test time, solve TPS weaknesses, and keep current with technology to reduce long term support costs. An emulator can reveal run-time inefficiencies, range settings, limit levels, check program flow, allow assigning values to TPS variables, etc. The comprehensive information contained in the TPS and supporting data can serve to expose under and over utilized test equipment, proper resource selection, and many other issues which determine the quality of the TPS and ATE resources. Software programmable algorithms could expose facts automatically. A TPS developed by different engineers can and probably will utilize different instruments and/or instrument settings to perform some tests. The optimal use of instrumentation can be seen by RTOK rates, diagnostics, optimal measurements and glitches. There will always be some similarities in a TPS developed by different engineers but optimizing resource allocation is vital. To do an automated analysis of TPS resource usage data does provide valuable information but there can be questions about whether or not the TPS developer allocated the ATE resources properly or optimally. It is a fact, TPS developers vary in skill level and there can be profound differences in how resources are allocated. Relying on improperly allocated res","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126578223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Modeling & simulation accelerates complex system design, test, and verification process","authors":"U. Jha, E. Chowdhury","doi":"10.1109/AUTEST.2016.7589586","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589586","url":null,"abstract":"Modeling and Simulation (M&S) has been a key contributor to the validation of key system concepts, trade-off analysis, and dimensioning of the system performance before it could be realized in cost effective and timely manner. Leading system developers harness M&S capabilities for competitive advantage and operational/business efficiency by leveraging advances in VLSI technologies (processing horse power, memory, storage, high throughput buses), graphics, display, and networking technologies and its utility spans not only across concept development, and trade-off analysis but also in system design, test and evaluation, failure analysis, and, to some extent, identifying production issues.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116904948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Method and device for hot air leak detection in aircraft installation by wire diagnosis","authors":"S. Sallem, L. Sommervogel, M. Olivas, Arnaud Peltier","doi":"10.1109/AUTEST.2016.7589616","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589616","url":null,"abstract":"In most aircrafts, hot air leak detection loops are formed by thermo-sensitive cables having temperature dependent characteristics. These wires are installed along air ducts in order to be able to react to temperature changes induced by leaks. Hence, an alert is sent to the cockpit. However, with old configurations, this alert does not include the leak localization information. Classic methods based on load measurement allowing defect localization are not accurate enough as they do not take into account the cable aging and junction degradation. This may cause false alerts. The proposed method uses multi-carrier reflectometry: MCTDR (Multi-Carrier Time Domain reflectometry). Advantageously, the MCTDR measures allow our device to be superimposed on the already installed systems without interfering with current signals. Moreover, we can detect and locate precisely any abnormality or change on cable. The reflectometer measures received signal and compares it to a given reference in terms of peaks magnitudes. A hot point is detected when the peak magnitudes of a given number of successive reflectograms are increasingly smaller than reference. This is being caused by a decrease in local value of impedance. The device allows the detection and localization of defects with a good accuracy. Moreover, we deduce the value of the temperature at the hot area by computing its impedance. This tool can be used in maintenance mode or embedded mode allowing preventive maintenance and avoiding aircraft on ground (AOG) situation.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122991709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Unlocking the potential of “big data” and advanced analytics in ATE","authors":"C. Hernández, L. Hernandez, David L. Miller, M. Modi, Anne Dlugosz","doi":"10.1109/AUTEST.2016.7589608","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589608","url":null,"abstract":"Big Data and advanced analytics capabilities are delivering value in many commercial sectors. The motivation for implementing this new technology is having the ability to conduct analysis of big data to achieve cost reductions, business process improvements, faster and better decisions, and new offerings for customers. These key business objectives also apply to the domain of Automatic Test Equipment (ATE). It is clear that big data and advanced analytics technologies have the potential to bring dramatic improvements to the DoD ATE Community of Interest (COI). However, in order to unlock the potential of Big Data and advanced analytics in ATE, we have to deal with some fundamental issues that impede their implementation. For example, currently there is no connectivity or integration of Unit Under Test (UUT) test results or health monitoring data produced by the system itself to the troubleshooting, test and repair data produced throughout the maintenance process or test data produced by the ATE. Also, there is no standard format or interface employed for capturing, storing, managing and accessing the health state data produced by the ATE. Data collected across operational maintenance activities is in numerous non-standard formats, making it difficult to correlate and aggregate to support advanced analytics. This paper discusses the fundamental shift in business practice required to address these critical issues, the specific benefits that can result from the integration of Big Data and advanced analytics in ATE, including enabling Prognostics and Health Management (PHM). The paper also provides an overview description of a specific case study, the application of ATML standards in the approach, and some critical design and implementation issues based on current (actual) development efforts.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124800818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Design of high precision analog modules and system architectures to maximize testability and long-term system reliability","authors":"Brigid Angelini, A. Cunningham, Andrew M. Goldfarb","doi":"10.1109/AUTEST.2016.7589628","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589628","url":null,"abstract":"To achieve cutting edge performance in measurement and control systems, it is often necessary to execute many high-accuracy and high-speed system functions in the analog domain. Including custom analog hardware in complex long lifecycle defense or aerospace systems presents challenges in integration, reliability, and maintainability of the system. Examples of these issues include: sub-system test of Analog Modules, system calibration, drift of analog component bounds, and the effect of temperature on analog measurements. This paper presents best practices and novel methods to increase the practicality of designing custom analog system solutions, and discusses trade-offs between designing custom Analog Modules versus procuring equivalent commercial off the shelf components. In addition, the design of system architectures to minimize the risks and costs associated with the use of custom modules is discussed.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128347330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Radio frequency test set: An ethernet-based RF ATE system designed to test a minuteman telemetry wafer: Distribution statement: A — Approved for public release; distribution is unlimited. Ref# 75ABW-2016-0058","authors":"T. Ung, Tranchau Nguyen, L. Vuu, Brad Barrus, Mark Reimann, Steve Archibald, Scott Rawlings, Jason Tuft, J. Dam, George Barber, Kim Owen, Heather Homquist, Michael Stenquist, M. Sithivong, Sharon McKinlay","doi":"10.1109/AUTEST.2016.7589636","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589636","url":null,"abstract":"The LGM-30G Minuteman III Inter-Continental Ballistic Missile (ICBM) System is facing legacy test system that are becoming difficult to sustain. For instance, the Test Set Group, Electronic System (ESTSG) is a test set approaching end-of-life. The ESTSG is comprised of outdated test instruments, and test operation is manually controlled. The Radio Frequency Test Set (RFTS) is a test system developed to replace the ESTSG to system fit and function. A major RFTS function is to increase test automation of the Telemetry Wafer (TW) checkout at the system, and subsystem levels. This function inherently lead to decrease test time, increase reliability, and reduce sustainment cost. RFTS is designed as an expandable Ethernet-based test system that performs DC and RF test. This paper gives an overview of the RFTS design using the widespread Ethernet-based architecture for the Automatic Test Equipment (ATE).","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127860696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Loopback test unit benefits","authors":"Patrick Cushing, Sergio Gutierrez","doi":"10.1109/AUTEST.2016.7589625","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589625","url":null,"abstract":"Failure in the Production test set can halt production and lead to extended downtime spent isolating the failure. Identifying a failure in a test set often relies on using a known good unit, or “golden unit”. Use of a Loopback Test Unit in place of a “golden unit” addresses issues with safety, cost, signal accessibility and fault isolation. A Loopback Test Unit is used in place of the “golden unit” for test set fault detection and isolation. Therefore, it is designed to simulate the production unit's physical form factor and interface in order to be compatible with the production test set. It receives the power forms and signal inputs or outputs from the production test set and, as applicable, provides a response, loops the signal back or generates a test signal. Maximum utility is achieved by implementing the Loopback Test Unit at the lowest level of assembly. Commonly this is at a circuit card assembly (CCA) with test connections by spring probes or bed of nails fixtures, which have a higher rate of connectivity failure. Designing with JTAG compatible test interfaces provides an automated connectivity test. This allows verification via automated testing of individual test probe connections to a common power plane. Furthermore, a welldesigned CCA Loopback Test Unit can be reused and incorporated into the next “module” level of assembly, providing design and test verticality. Designed for the production test interface the Loopback Test Unit can use the same or modified test automation software. A Loopback Test Unit with automated testing provides an easy way of verifying the proper function of the production test set and can be integrated as a standard operation into the factory test flow, as appropriate. If a failure, or especially repetitive failures, occurs with a production test set, the technician can insert a Loopback Test Unit, run an automated test and begin failure analysis. By design, the Loopback Test Unit can provide signal accessibility and isolation, greatly facilitating fault identification. Signal isolation also allows signal insertion which may be necessary for more complex failures. In this paper, the author will present the general concept of a Loopback Test Unit, the time consuming troubleshooting deficiencies it resolves, and address the financial benefits of implementing this in production testing.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127876498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A nonintrusive magnetically self-powered vibration sensor for automated condition monitoring of electromechanical machines","authors":"Jinyeong Moon, Peter A. Lindahl, J. Donnal, S. Leeb, Ryan Zachar, William Cotta, C. Schantz","doi":"10.1109/AUTEST.2016.7589635","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589635","url":null,"abstract":"This paper presents a nonintrusive and electromagnetically self-powered embedded system with vibration sensor for condition monitoring of electromechanical machinery. This system can be installed inside the terminal block of a motor or generator and supports wireless communication for transferring data to a mobile device or computer for subsequent performance analysis. As an initial application, the sensor package is configured for automated condition monitoring of resiliently mounted machines. Upon detecting a spin-down event, e.g. a motor turnoff, the system collects and transmits vibration and residual backemf data as the rotor decreases in rotational speed. This data is then processed to generate an empirical vibrational transfer function (eVTF) rich in condition information for detecting and differentiating machinery and vibrational mount pathologies. The utility of this system is demonstrated via lab-based tests of a resiliently mounted 1.1 kW three-phase induction motor, with results showcasing the usefulness of the embedded system for condition monitoring.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121694096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}