2016 IEEE AUTOTESTCON最新文献

{"title":"Measurement and analysis of arc tracking characteristics in the high frequency band","authors":"V. Degardin, L. Koné, P. Laly, M. Liénard, P. Degauque, F. Valensi","doi":"10.1109/AUTEST.2016.7589591","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589591","url":null,"abstract":"High voltage direct current networks are now being implemented in the new generation of civil aircrafts. If a short circuit occurs between wires of the power cable, an “arc tracking” may happen. Such an arc can sustain over a time which can reach one second or more and propagate along the cable. New kind of intelligent breakers have thus been developed based either on the time domain or the low frequency characteristics of the pulses associated with this arc. In this paper, the spectral components of the arc in the high frequency band, typically between 1 and 30 MHz are studied. A Thevenin generator equivalent to the arc is proposed allowing to determine the disturbing current and voltage spectral density at any point of the power network. Such an approach can be used to improve the efficiency of actual breakers and also to be able to predict interferences between the disturbing signals due to this arc and sensitive control-command systems.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128051909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Rotating machine fault detection using principal component analysis of vibration signal","authors":"T. Plante, L. Stanley, Ashkan Nejadpak, C. Yang","doi":"10.1109/AUTEST.2016.7589634","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589634","url":null,"abstract":"Current vibration based maintenance methods can be improved by using principle component analysis to identify fault patterns in rotating machinery. The intent of this paper is to study the effects of using principle component analysis in a vibration based fault detection process and to understand the capability of this method of maintenance. Because vibration-based maintenance practices are capable of identifying motor faults based on their respective vibration patterns, principle component analysis observed in frequency domain can be used to automate the fault detection process. To test this theory, an experiment was set up to compare health conditions of a motor and determine if their patterns could be grouped using principle component analysis. The result from this study demonstrated that the proposed method successfully identified healthy, unbalance and parallel misalignments of rotary rotor. Therefore, it is capable of detecting faults in early stages and reducing maintenance costs.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"221 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132302220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Merging ATE: An interesting possibility","authors":"L. Kirkland","doi":"10.1109/AUTEST.2016.7589593","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589593","url":null,"abstract":"There have been great strides in the open system plug and play concept for Automatic Test Equipment (ATE) in the Department of Defense (DoD). An ideal test system can be thought of as the sum of its parts: measurement and stimulus hardware, signal switching, power supplies, cabling and interconnect system (Interface Test Adapter - ITA), external PC or embedded controller, Operating System (OS), control and support software, and the programming environment. Each part is selected based on parameters such as Unit Under Test (UUT) test parameters, physical dimensions, test times, and cost. UUT test requirements are the crucial aspect of instrument selection and functionality. The open system plug and play concept gives rise to the possibility to run a test program on a different ATE, that is, taking your ITA and your Test Program Set (TPS) from its programmed ATE and running the TPS on a different ATE utilizing the same ITA. The main components for running a TPS on different ATE are an ITA Transition Adapter and Translation Software to convert or compile the Test Program to run on another ATE. The ITA hardware configuration and the Interface Connection Assembly (ICA) variations between different ATE are critical factors. If instruments have compatible features then UUT test requirements might not require examination, however if there are distinct differences in instrument capability between ATEs then UUT Test Requirements become a critical factor. Also, there will be ATE switching variances between ATE designs so this is a prime consideration. In pursuit of merging ATE TPSs from its programmed ATE to a different ATE, an ITA transition adapter can be developed. The transition adapter is the hardware between the ITA and the different ATE ICA. The transition adapter is wired to route signals from one ICA configuration to another ICA configuration. The transition adapter design requires an ICA to ITA evaluation that consists of a pin-to-pin comparison between each ATE. Each ICA connection must be traced to the instrument or instruments which can be connected to that pin. In addition, instrument specifications must be evaluated and compared between different ATE. One thing of critical importance is the instrument driver compatibility. The translation software will convert an existing TPS from one ATE to another ATE. That is, the translation software must compile the existing test program to run on a different ATE test executive. At this point, many factors come into focus; the re-compiled Test Program must be analyzed for capability to run on the new platform or ATE. Remember, instruments from different manufacturers don't always perform completely inter-changeably. Quirks between instruments, which theoretically have the same specifications, can be a major setback. During the ITA hardware development signal integrity is analyzed not only by signal evaluation and noise but also by actual test program execution. Every design detail is important to minimize","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"412 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115239561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Virtual machines and automated test equipment","authors":"E. Bean","doi":"10.1109/AUTEST.2016.7589575","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589575","url":null,"abstract":"Supporting legacy automated test equipment (ATE) has always been a challenge while also maintaining configuration control. Often, it is the computer that fails before any other instrumentation or circuitry. With the rapid changes in computing technology, both hardware and software, it can be particularly difficult to replace the computer in a legacy test system. Likewise, it can be challenging to maintain configuration control on a released test system for production when additional capability is required and development is being performed on the production system. This paper examines the capabilities and limitations of the use of virtual machines to mitigate the issues surrounding support of legacy ATE as well its application to future development on production test systems. In the author's experimentation, communication with GPIB, LAN, and PXI instruments was considered. Furthermore, a test case was developed in which a virtual machine of a legacy tester computer was created and tested with the existing ATE instrumentation. Additionally, virtual machines were considered for use as a configuration management tool during tester development and after a tester is released to production.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124220749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Trends in radar systems drive the need for smarter test systems","authors":"A. Samant","doi":"10.1109/AUTEST.2016.7589638","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589638","url":null,"abstract":"Active Electronically Scanned Array (AESA) technology will enable next generation radars achieve better jamming resistance capability and low probability of intercept by spreading their emissions over a wide frequency range. These radars systems consist of a large number of transmit/receive modules (TRMs) which are electronically scanned in a tight time-synchronized manner. This requires digital control to move closer to the radio front end on the antennas. Other emerging technologies, such as cognitive radars and MIMO radars, will continue to drive the need for complex timing, synchronization, and high mix RF and digital measurement requirements. To meet these challenges, radar engineers will need a platform based approach which delivers capabilities such as multi-channel phase aligned measurements over wide bandwidths and high-throughput streaming. This paper discusses the fundamentals of AESA radars and trends in radar systems. It analyzes the impact of these trends on test system architecture and explains how the advances in PXI modular instrumentation can meet these challenging requirements.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122864957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Dedicated engineering test equipment design for multi-function radar hybrid T/R modules","authors":"Izzet Serbest, Muharrem Arik","doi":"10.1109/AUTEST.2016.7589637","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589637","url":null,"abstract":"The demand for complicated sensor (multi-function capabilities) technologies over radar platforms has grown while mission and efficiency constraints have become more stringent. Development of Active Electronically Scanned Array (AESA) and Digital Array Radar (DAR) technologies has created a strong demand to combine the functions of several digital and analog implementations into a single unit. Combining the functionality of several modules into one special package also makes testing process more challenging due to its comprehensive capabilities. It has also changed the way radars are characterized, from component level tests through complete system verification. Therefore, these complicated tasks require one special and unique test solution dedicated to hybrid T/R modules. Hybrid beam-forming technique and multi channel systems impose challenges on testing of T/R modules operating in a variety of modes. Therefore, T/R modules require a broad array of measurements and all interfaces must be driven by the Dedicated Engineering Test Equipment (DETE) platform. Beside basic challenges of testing, the test system rely not only on conventional microwave instruments but also on analog and digital test blocks optimized to the specific requirements of the radar system. Hence, DETE takes place between synthetic and rack-and-stack test solutions. The user could modify the test system for various purposes to cover all requirements of both test sets due to the verification requirements. Moreover, RF tests could be run much faster with more accurate and repeatable results during the design process and in the production line. In this paper, our goal is to put forward a special and dedicated design and verification test solution developed by ASELSAN Inc. for X-Band Compact Hybrid T/R modules. This paper describes the system level architecture, test solution abilities. Additionally, designing methods of the hardware and software architecture are presented.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126383521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Automated testing and quality assurance of 3D printing/3D printed hardware: Assessment for quality assurance and cybersecurity purposes","authors":"J. Straub","doi":"10.1109/AUTEST.2016.7589613","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589613","url":null,"abstract":"This paper discusses the automation of quality assurance and produced part testing for additive manufacturing systems. The process of identifying defects, determining their impact and potentially taking corrective action is discussed. Algorithms for this purposes are presented. Examples of assessment are considered. The correction of both incidental and deliberately introduced defects is discussed.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"61 39","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131637525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Acquisition of out of production ATE Test Program Sets-A DoD perspective","authors":"L.T. Beck","doi":"10.1109/AUTEST.2016.7589594","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589594","url":null,"abstract":"This paper is a discussion of the highs and lows related to procurement of Automatic Test Equipment (ATE) Operational Test Program Sets (OTPSs) that have been out of production for any length of time as seen from a Department of Defense viewpoint (as opposed to a private industry viewpoint). Focus is on procurement strategies, Technical Data Package development, and issues with how to overcome component obsolescence and “minimum buy” requirements. Payment of assets would be completed as part of an Foreign Military Sale (FMS)/Direct Commercial Sale case with Dept of Defense or Dept of State. These procurements tend to be from FMS customers due to changes in their preferred support postures and dependence on failing legacy ATE.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131221715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Recurrent TPS development issues or ascertaining the excellence of an automated unit test","authors":"L. Kirkland, Cori N. McConkey","doi":"10.1109/AUTEST.2016.7589643","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589643","url":null,"abstract":"Although Test Program Set (TPS) development is a science; it can be construed as an ART if a precise software environment and exacting test program development practices are utilized. Also, the ability to build an effective and precise software development environment for TPS development is not an off-the-wall bunch of guesswork routines. This can only be accomplished by true test engineers who work in the test and diagnosis environment and understand the various requirements to develop a group of measurements that cover all of the aspects of a TPS. An advocate of true test technology, who wants a complete and comprehensive fault coverage of a Unit Under Test (UUT), will not be satisfied with mundane TPSs that are not capable of scoping out UUT failures is a precise, timely and factual manner. To scope out UUT problems requires practicing many factors which focus on TPS quality, robust software tools, powerful test hardware and the inclusion of state-of-the-art hardware with interactive diagnostics. Major TPS weaknesses continue to be diagnostics, manual probing, real life trends, time to repair, cross-referencing, weak test equipment, test time, etc. About 70% of the TPS development effort can go to diagnostics. Accurately estimated enhanced diagnostics can result in a substantial life-cycle cost savings. In fact, during TPS development and TPS support, fault localization should be the first step and always the most critical step. Ideally, there should be no more than 3-4 probes to (no probing is best) and fault isolate to 2 or less components with very high accuracy. UUT accessibility and thru-put complicate the TPS design and the UUT repairer. Complicated state transition sequences and edge changes can be a setback when trying to control the UUT circuits. We should always focus on what's really happening at some internal circuit element. The time to repair can be hindered by Fan Out, No-Fault-Found (NFF), Intermittents, UUT Source and sink circuits, noise with the Automatic Test equipment (ATE) or in the Interface Test Adapter (ITA), component weakness, miss-matched replacement parts, poor connections (solder / pins), component variations, etc. All elements are critical and time to repair can go into days and even weeks. There are clues to TPS weaknesses that dictate re-examination and reconsideration. These clues can include things like glitches, limits, % detect, test time, impedance, instrument selection, signal routing, ITA design, diagnostic issues, excessive code or software routines, ambiguity groups, signal degradation from various sources, signal amplification, signal reduction, lack of test requirements or data, improper grounding, noise, etc. TPS weaknesses need attention and improvement when they are observed. Support costs tend to compound when weaknesses are not corrected ASAP. This paper will cover many aspects associated with a TPS that fulfills the customer's needs and expectations and this includes the ATE and a focus on diag","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"121 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132563372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An economic analysis of false alarms and no fault found events in air vehicles","authors":"M. Ilarslan, L. Ungar, Kenan Ilarslan","doi":"10.1109/AUTEST.2016.7589571","DOIUrl":"https://doi.org/10.1109/AUTEST.2016.7589571","url":null,"abstract":"False Alarms (FAs) that occur in a fielded system and No Fault Found (NFF) events that are discovered after line replaceable units (LRUs) have been returned to repair are costly situations whose full impact is difficult to put into monetary terms. For that reason, pragmatic economic models of NFFs are difficult to develop. In this paper, we deal with the problem of having to differentiate between NFFs of good units under test (UUTs) and of faulty UUTs. While we cannot tell which UUT is good and which is faulty, we can determine using probabilities what percentage of the NFFs are faulty and what percentage are good. Based on these probabilities, we can evaluate various strategies. Assigning cost factors that are knowable, such as the cost of testing a UUT, the cost we incur for good UUTs vs. costs we incur for faulty UUTs and various test and repair costs, we can calculate the performance of various strategies and assumptions. In this paper, we formulate three strategies: 1) We assume all NFF UUTs are good and are willing to endure the cost of bad actors (i.e. faulty UUTs) sent back to the aircraft. 2) We assume all NFF UUTs are faulty and we environmentally stress all NFF UUTs, hoping to fix some and avoid bad actors. 3) We rely on the technician to reasonably select some NFF UUTs and perform appropriate repair. We formulate each of these strategies for a case when NFF is 70%. The formulation is similar with any NFF distribution, but the coefficients in each formula will be different. With proper cost data, we can actually decide which strategy works best. We conclude by tabulating the formulas and calculate NFF costs for an example situation. The numbers we picked for this example may be appropriate for some operations, but not for others. As a follow-up to this paper we would like to validate the model with real data, which may be available in some military and commercial avionics maintenance departments.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123701896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}