设计高精度模拟模块和系统架构,最大限度地提高可测试性和长期系统可靠性

Brigid Angelini, A. Cunningham, Andrew M. Goldfarb
{"title":"设计高精度模拟模块和系统架构,最大限度地提高可测试性和长期系统可靠性","authors":"Brigid Angelini, A. Cunningham, Andrew M. Goldfarb","doi":"10.1109/AUTEST.2016.7589628","DOIUrl":null,"url":null,"abstract":"To achieve cutting edge performance in measurement and control systems, it is often necessary to execute many high-accuracy and high-speed system functions in the analog domain. Including custom analog hardware in complex long lifecycle defense or aerospace systems presents challenges in integration, reliability, and maintainability of the system. Examples of these issues include: sub-system test of Analog Modules, system calibration, drift of analog component bounds, and the effect of temperature on analog measurements. This paper presents best practices and novel methods to increase the practicality of designing custom analog system solutions, and discusses trade-offs between designing custom Analog Modules versus procuring equivalent commercial off the shelf components. In addition, the design of system architectures to minimize the risks and costs associated with the use of custom modules is discussed.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of high precision analog modules and system architectures to maximize testability and long-term system reliability\",\"authors\":\"Brigid Angelini, A. Cunningham, Andrew M. Goldfarb\",\"doi\":\"10.1109/AUTEST.2016.7589628\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To achieve cutting edge performance in measurement and control systems, it is often necessary to execute many high-accuracy and high-speed system functions in the analog domain. Including custom analog hardware in complex long lifecycle defense or aerospace systems presents challenges in integration, reliability, and maintainability of the system. Examples of these issues include: sub-system test of Analog Modules, system calibration, drift of analog component bounds, and the effect of temperature on analog measurements. This paper presents best practices and novel methods to increase the practicality of designing custom analog system solutions, and discusses trade-offs between designing custom Analog Modules versus procuring equivalent commercial off the shelf components. In addition, the design of system architectures to minimize the risks and costs associated with the use of custom modules is discussed.\",\"PeriodicalId\":314357,\"journal\":{\"name\":\"2016 IEEE AUTOTESTCON\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2016.7589628\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2016.7589628","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

为了在测量和控制系统中实现最先进的性能,通常需要在模拟域中执行许多高精度和高速的系统功能。在复杂的长生命周期国防或航空航天系统中包括定制模拟硬件,对系统的集成、可靠性和可维护性提出了挑战。这些问题的例子包括:模拟模块的子系统测试、系统校准、模拟组件边界漂移以及温度对模拟测量的影响。本文介绍了提高设计定制模拟系统解决方案的实用性的最佳实践和新方法,并讨论了设计定制模拟模块与采购等效的商业现成组件之间的权衡。此外,还讨论了系统架构的设计,以尽量减少与使用定制模块相关的风险和成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of high precision analog modules and system architectures to maximize testability and long-term system reliability
To achieve cutting edge performance in measurement and control systems, it is often necessary to execute many high-accuracy and high-speed system functions in the analog domain. Including custom analog hardware in complex long lifecycle defense or aerospace systems presents challenges in integration, reliability, and maintainability of the system. Examples of these issues include: sub-system test of Analog Modules, system calibration, drift of analog component bounds, and the effect of temperature on analog measurements. This paper presents best practices and novel methods to increase the practicality of designing custom analog system solutions, and discusses trade-offs between designing custom Analog Modules versus procuring equivalent commercial off the shelf components. In addition, the design of system architectures to minimize the risks and costs associated with the use of custom modules is discussed.
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