Brigid Angelini, A. Cunningham, Andrew M. Goldfarb
{"title":"设计高精度模拟模块和系统架构,最大限度地提高可测试性和长期系统可靠性","authors":"Brigid Angelini, A. Cunningham, Andrew M. Goldfarb","doi":"10.1109/AUTEST.2016.7589628","DOIUrl":null,"url":null,"abstract":"To achieve cutting edge performance in measurement and control systems, it is often necessary to execute many high-accuracy and high-speed system functions in the analog domain. Including custom analog hardware in complex long lifecycle defense or aerospace systems presents challenges in integration, reliability, and maintainability of the system. Examples of these issues include: sub-system test of Analog Modules, system calibration, drift of analog component bounds, and the effect of temperature on analog measurements. This paper presents best practices and novel methods to increase the practicality of designing custom analog system solutions, and discusses trade-offs between designing custom Analog Modules versus procuring equivalent commercial off the shelf components. In addition, the design of system architectures to minimize the risks and costs associated with the use of custom modules is discussed.","PeriodicalId":314357,"journal":{"name":"2016 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of high precision analog modules and system architectures to maximize testability and long-term system reliability\",\"authors\":\"Brigid Angelini, A. Cunningham, Andrew M. Goldfarb\",\"doi\":\"10.1109/AUTEST.2016.7589628\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To achieve cutting edge performance in measurement and control systems, it is often necessary to execute many high-accuracy and high-speed system functions in the analog domain. Including custom analog hardware in complex long lifecycle defense or aerospace systems presents challenges in integration, reliability, and maintainability of the system. Examples of these issues include: sub-system test of Analog Modules, system calibration, drift of analog component bounds, and the effect of temperature on analog measurements. This paper presents best practices and novel methods to increase the practicality of designing custom analog system solutions, and discusses trade-offs between designing custom Analog Modules versus procuring equivalent commercial off the shelf components. In addition, the design of system architectures to minimize the risks and costs associated with the use of custom modules is discussed.\",\"PeriodicalId\":314357,\"journal\":{\"name\":\"2016 IEEE AUTOTESTCON\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2016.7589628\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2016.7589628","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of high precision analog modules and system architectures to maximize testability and long-term system reliability
To achieve cutting edge performance in measurement and control systems, it is often necessary to execute many high-accuracy and high-speed system functions in the analog domain. Including custom analog hardware in complex long lifecycle defense or aerospace systems presents challenges in integration, reliability, and maintainability of the system. Examples of these issues include: sub-system test of Analog Modules, system calibration, drift of analog component bounds, and the effect of temperature on analog measurements. This paper presents best practices and novel methods to increase the practicality of designing custom analog system solutions, and discusses trade-offs between designing custom Analog Modules versus procuring equivalent commercial off the shelf components. In addition, the design of system architectures to minimize the risks and costs associated with the use of custom modules is discussed.