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1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)最新文献

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Non-linear behaviour of LEMP excited power lines terminated on surge-arresters 端接在避雷器上的LEMP励磁电力线的非线性行为
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810094
A. Andreotti, U. De Martinis, A. Maffucci, G. Miano, L. Verolino
{"title":"Non-linear behaviour of LEMP excited power lines terminated on surge-arresters","authors":"A. Andreotti, U. De Martinis, A. Maffucci, G. Miano, L. Verolino","doi":"10.1109/ISEMC.1999.810094","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810094","url":null,"abstract":"The transient analysis of non-linearly loaded power lines is carried out. The line is excited by indirect lightning and the analysis is performed in the time domain, where the line is represented as an equivalent dynamic m-port and the effects of the lightning excitation are taken into account through equivalent independent sources. The analysis has been carried our taking into account the effects of the finite ground conductivity. Furthermore, an accurate model has been used for the non-linear surge-arresters, to take into account dynamic effects.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114917727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Helmholtz coils for MIL-STD-462D RS101 testing 亥姆霍兹线圈用于MIL-STD-462D RS101测试
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810184
J. D. Spencer, R. Davis
{"title":"Helmholtz coils for MIL-STD-462D RS101 testing","authors":"J. D. Spencer, R. Davis","doi":"10.1109/ISEMC.1999.810184","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810184","url":null,"abstract":"The design of a square Helmholtz coil pair for MIL-STD-462D RS101 radiated susceptibility magnetic field testing is detailed. The square coil shape provides a uniform magnetic field volume that is better suited to typical DUT (device under test) shapes when compared to round coils. The coil pair provides a 30/spl times/30/spl times/40 inch (76/spl times/76/spl times/102 cm) test volume. Capacitors are used to resonate the coils and reach the MIL-standard specified test field levels over most of the frequency range.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126014528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Higher order mode behavior in loaded and unloaded TEM cells 加载和卸载TEM单元中的高阶模式行为
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812899
C. Groh, H. Garbe, M. Koch
{"title":"Higher order mode behavior in loaded and unloaded TEM cells","authors":"C. Groh, H. Garbe, M. Koch","doi":"10.1109/ISEMC.1999.812899","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812899","url":null,"abstract":"The resonances of higher order modes determine the usable bandwidth of a TEM cell. Since the resonating mode and its characteristic field distribution are known, measures are taken to selectively suppress resonances of higher order modes. Thus the bandwidth of the cell is expanded without affecting the TEM mode. Loading the cell with objects results in abrupt changes of the cross sectional geometry. The effects on the resonances due to the size and position of the objects are examined.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123678242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Prediction of RF environments worldwide for ground, airborne, and space launch trajectory applications via automated database 通过自动化数据库预测全球地面、机载和空间发射轨迹应用的射频环境
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810197
L.R. Warboys, J. Lukash
{"title":"Prediction of RF environments worldwide for ground, airborne, and space launch trajectory applications via automated database","authors":"L.R. Warboys, J. Lukash","doi":"10.1109/ISEMC.1999.810197","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810197","url":null,"abstract":"The evaluation of the radio frequency (RF) environment for electronic systems in the field has often been a time consuming and burdensome task, especially for mobile systems. This paper discusses a methodology for determining the RF environment for such systems using common office spreadsheet software. The model developed has been validated and used successfully to evaluate the RF environment on the ground and during ascent for several launch vehicles, launch sites, and payloads.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126338424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Reflectivity calculation of a periodical-patch-loaded absorber by the FD-TD method 用FD-TD法计算周期性贴片加载吸收体的反射率
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812924
T. Ojima
{"title":"Reflectivity calculation of a periodical-patch-loaded absorber by the FD-TD method","authors":"T. Ojima","doi":"10.1109/ISEMC.1999.812924","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812924","url":null,"abstract":"An objective of this paper is to show low reflectivity of a lossy material with periodical metal patches on the surface by FD-TD computations in addition to experiments. Symmetry conditions based on image theory have been introduced to reduce the computational volume. A uniaxial perfectly-matched-layer (UPML) is used as an absorbing boundary condition, which also reduces computer memory and calculation time. By the computations and experiments, the absorber of this kind is proved to have low reflectivity as a viable microwave absorber. It features potential versatility of design.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132931065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
An investigation of PCB radiated emissions from simultaneous switching noise 同时开关噪声对PCB辐射发射的研究
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810174
S. Radu, D. Hockanson
{"title":"An investigation of PCB radiated emissions from simultaneous switching noise","authors":"S. Radu, D. Hockanson","doi":"10.1109/ISEMC.1999.810174","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810174","url":null,"abstract":"Processors are currently operating with fundamental clock frequencies that are at or above the resonant frequencies of typical processor boards and modules. Adequately decoupling printed-circuit boards (PCBs) at high frequencies has become an increasingly urgent task in the light of increasing clock frequencies with decreasing rise times. Providing sufficient charge at frequencies near and above 1 GHz is extremely difficult with lumped-element capacitors. To further complicate the issue, modern PCB power buses may be analogous to microstrip-patch antennas. Exciting a power bus at board harmonics may result in significant radiated EMI from the bus. Much has been done to improve high-frequency decoupling from a signal-integrity perspective. However, the benefit to EMI is somewhat unclear, because the mechanism by which power-bus noise results in radiated EMI is not well understood. Input impedance of a power bus, transfer impedance across a power bus, and radiated emissions from a PCB are presented herein. The results are discussed to provide characterization of radiated EMI directly from a PCB power bus.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133192880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 63
The design of a lightning attachment simulator 雷电附着模拟器的设计
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810092
C. Douglas, J. Feist, G. Loerzel, R. Nelson, J. Glower, J. Jorgenson, F. Heather
{"title":"The design of a lightning attachment simulator","authors":"C. Douglas, J. Feist, G. Loerzel, R. Nelson, J. Glower, J. Jorgenson, F. Heather","doi":"10.1109/ISEMC.1999.810092","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810092","url":null,"abstract":"When lightning strikes an airplane, it generally attaches to a leading edge such as the nose, wing tips, forward part of a vertical tail, or some other leading edge protrusion and leaves via a sharp trailing edge such as the rear wing tip or tail. In order to clearly visualize this phenomena, a lightning attachment simulator was designed and constructed by students at North Dakota State University for the Naval Air Warfare Center Aircraft Division. This paper describes the design and development of the simulator.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"416 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133645080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Backplane grounding models for controlling common-mode noise and radiation 控制共模噪声和辐射的背板接地模型
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812897
D. Moongilan, T.S. Palaniswamy
{"title":"Backplane grounding models for controlling common-mode noise and radiation","authors":"D. Moongilan, T.S. Palaniswamy","doi":"10.1109/ISEMC.1999.812897","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812897","url":null,"abstract":"Common-mode noise unintentionally generated in electronic systems must be controlled to reduce unwanted conducted and radiated emissions and crosstalk. Because common mode noise in a backplane, when coupled into cables attached to the backplane, causes those cables to acts as a monopole antenna, such noise must be minimized. This paper models backplane design techniques to extract common mode noise current from power layers, signal ground layers, and frame ground layers and to drain them to the chassis. A method of gradually lowering the impedance of power layers and signal ground layers with respect to frame ground layers (and frame ground layers with respect to chassis) is explained. This gradual reduction in impedance enables common mode noise in backplane power layers to flow differentially with respect to signal ground layers. Similarly, it allows common mode noise in signal ground layers to drain to frame ground layers and from frame ground layers to chassis. These models were implemented in a large backplane and the resultant measured radiated emissions are presented.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129882631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
RF isolation using power islands in DC power bus design 在直流电源母线设计中使用功率岛进行射频隔离
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810129
J. Fan, Yong Ren, Juan Chen, D. Hockanson, Hao Shi, J. Drewniak, T. Hubing, T. van Doren, R. DuBroff
{"title":"RF isolation using power islands in DC power bus design","authors":"J. Fan, Yong Ren, Juan Chen, D. Hockanson, Hao Shi, J. Drewniak, T. Hubing, T. van Doren, R. DuBroff","doi":"10.1109/ISEMC.1999.810129","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810129","url":null,"abstract":"Power island structures are often employed for minimizing the propagation of high-frequency noise on DC power buses. The rationale is based on introducing a series impedance in the power plane to provide isolation of a noise source from the rest of the PCB design. The power island concept is investigated herein experimentally, to determine its noise mitigation attributes and limitations. A modeling approach that is suitable for arbitrary PCB island geometries including lumped SMT decoupling capacitors is also presented. The modeling and measurements indicate that island structures can achieve some degree of isolation under certain conditions.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"557 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116517680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 44
Noise immunity characteristics of semiconductor memory devices-a comparison of UV-EPROM with static RAM 半导体存储器件的抗噪特性——UV-EPROM与静态RAM的比较
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812885
A. Mutoh, S. Nitta
{"title":"Noise immunity characteristics of semiconductor memory devices-a comparison of UV-EPROM with static RAM","authors":"A. Mutoh, S. Nitta","doi":"10.1109/ISEMC.1999.812885","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812885","url":null,"abstract":"This paper describes noise immunity characteristics of two kinds of semiconductor memory devices: ultraviolet erasable programmable ROM (UV-EPROM) and static RAM (SRAM). Noise immunity characteristics of SRAM are compared with that of UV-EPROM and it is concluded that UV-EPROM is superior to SRAM from the point of view that a the former has a self-recovery function after malfunction due to noise and is effective in realizing safe and reliable digital systems.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"386 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116522271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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