An investigation of PCB radiated emissions from simultaneous switching noise

S. Radu, D. Hockanson
{"title":"An investigation of PCB radiated emissions from simultaneous switching noise","authors":"S. Radu, D. Hockanson","doi":"10.1109/ISEMC.1999.810174","DOIUrl":null,"url":null,"abstract":"Processors are currently operating with fundamental clock frequencies that are at or above the resonant frequencies of typical processor boards and modules. Adequately decoupling printed-circuit boards (PCBs) at high frequencies has become an increasingly urgent task in the light of increasing clock frequencies with decreasing rise times. Providing sufficient charge at frequencies near and above 1 GHz is extremely difficult with lumped-element capacitors. To further complicate the issue, modern PCB power buses may be analogous to microstrip-patch antennas. Exciting a power bus at board harmonics may result in significant radiated EMI from the bus. Much has been done to improve high-frequency decoupling from a signal-integrity perspective. However, the benefit to EMI is somewhat unclear, because the mechanism by which power-bus noise results in radiated EMI is not well understood. Input impedance of a power bus, transfer impedance across a power bus, and radiated emissions from a PCB are presented herein. The results are discussed to provide characterization of radiated EMI directly from a PCB power bus.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"63","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.810174","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 63

Abstract

Processors are currently operating with fundamental clock frequencies that are at or above the resonant frequencies of typical processor boards and modules. Adequately decoupling printed-circuit boards (PCBs) at high frequencies has become an increasingly urgent task in the light of increasing clock frequencies with decreasing rise times. Providing sufficient charge at frequencies near and above 1 GHz is extremely difficult with lumped-element capacitors. To further complicate the issue, modern PCB power buses may be analogous to microstrip-patch antennas. Exciting a power bus at board harmonics may result in significant radiated EMI from the bus. Much has been done to improve high-frequency decoupling from a signal-integrity perspective. However, the benefit to EMI is somewhat unclear, because the mechanism by which power-bus noise results in radiated EMI is not well understood. Input impedance of a power bus, transfer impedance across a power bus, and radiated emissions from a PCB are presented herein. The results are discussed to provide characterization of radiated EMI directly from a PCB power bus.
同时开关噪声对PCB辐射发射的研究
处理器目前使用的基本时钟频率等于或高于典型处理器板和模块的谐振频率。随着时钟频率的不断增加和上升时间的不断减少,印制电路板的高频去耦已成为一个日益紧迫的任务。对于集总元件电容器来说,在接近和高于1ghz的频率下提供足够的充电是极其困难的。使问题进一步复杂化的是,现代PCB电源总线可能类似于微带贴片天线。以板载谐波对电源母线进行激励可能导致母线产生显著的电磁干扰辐射。从信号完整性的角度来看,人们已经做了很多工作来改善高频去耦。然而,对电磁干扰的好处尚不清楚,因为电力总线噪声导致辐射电磁干扰的机制尚不清楚。本文介绍了电源总线的输入阻抗、跨电源总线的传输阻抗和PCB的辐射发射。讨论了直接从PCB电源总线辐射EMI的特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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