1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)最新文献

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Impact on radiated emissions of printed circuit board stitching 印制电路板拼接对辐射发射的影响
G. Haussmann, M. Matthews, F. Gisin
{"title":"Impact on radiated emissions of printed circuit board stitching","authors":"G. Haussmann, M. Matthews, F. Gisin","doi":"10.1109/ISEMC.1999.810120","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810120","url":null,"abstract":"The use of closely-spaced vias, or \"stitching\", is used to reduce radiated emissions from the edge of a printed circuit board (PCB). However, this stitching, by confining the electromagnetic noise to the PCB internals instead of allowing it to radiate, causes undesirable effects by coupling to internal traces and vias. Internal traces connected to outside traces and components provide a second path for radiation, in addition to the edge radiation that stitching is intended to suppress.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121612809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Effect of interplane capacitance on the radiation from printed traces 平面间电容对印刷走线辐射的影响
S. Bokhari
{"title":"Effect of interplane capacitance on the radiation from printed traces","authors":"S. Bokhari","doi":"10.1109/ISEMC.1999.812876","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812876","url":null,"abstract":"The paper examines the effect of the capacitance between power and ground planes on the direct radiation from signal traces. The analysis is based on a full wave moment method solution combined with a multi-port network formulation. Techniques that exploit interplane capacitance by reducing the distance between power and ground planes are found to also reduce the radiation from traces over a certain frequency range. Numerical results are presented.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126391269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Nonuniformity of coupled data transmission line profile to reduce crosstalk 耦合数据传输线轮廓的非均匀性以减少串扰
Eui-Joon Park, Byoung-Hee Lee, Woo-Jun Yang
{"title":"Nonuniformity of coupled data transmission line profile to reduce crosstalk","authors":"Eui-Joon Park, Byoung-Hee Lee, Woo-Jun Yang","doi":"10.1109/ISEMC.1999.812940","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812940","url":null,"abstract":"Signal bus lines interconnected between circuitry on PCB have been mostly layouted using uniform lines. The purpose of this paper is to present a synthesis method for nonuniform line profile that handles and reduces the crosstalk for high-speed pulse transmission in coupled lines without altering circuitry dimensions. The theory is based on the generalized taper theory containing control ability for input reflection coefficients without significant degradation of output waveform integrity. Transient responses of various line profiles are compared and the taper profile is extracted which is adequate to increase the average spacing between lines and to evenly reflect significant pulse spectra, hence drastically reducing the spike-like crosstalk peak level of sense line in the time domain.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114184983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Characterization of common-mode excitation at the driving point of a circuit 电路驱动点的共模激励特性
T. Jerse
{"title":"Characterization of common-mode excitation at the driving point of a circuit","authors":"T. Jerse","doi":"10.1109/ISEMC.1999.812875","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812875","url":null,"abstract":"Common-mode currents are a leading contributor to the radiated emissions from electronic equipment. Such currents are particularly difficult to identify when designing circuits because conventional circuit analysis programs do not predict them. The currents flowing in the physical structure of a circuit can be found by means of full-wave analysis, but the results must be decomposed into their differential- and common-mode parts to identify the mechanism that excites the radiated emissions. The work described in this paper formulates a method for computing a common-mode impedance at the driving point of the circuit. This single figure of merit gives instructive insight into the proclivity of a particular circuit layout to produce common-mode emissions. Computing common-mode impedance values across a frequency range can expose resonances in the common-mode excitation to predict where peaks in the radiated emissions are likely.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116666038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The mythology of ground bounce 地面弹跳的神话
R.G. Kaires
{"title":"The mythology of ground bounce","authors":"R.G. Kaires","doi":"10.1109/ISEMC.1999.812937","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812937","url":null,"abstract":"The concepts of \"ground bounce\" or \"noisy reference planes\" or \"voltage drops along ground\" are all tied in with the idea that a ground plane (or just a length of wire for that matter) can be modeled as an equivalent lumped inductor. If care is taken to consider the entire circuit, and mutual inductances are properly taken into account, this inductor model works. However, it appears that this model is often interpreted too literally. One notices that in the literature, authors often refer to \"voltage drops\" along ground. Some even purport to be able to measure this voltage. Others claim that this voltage is real and causes \"ground bounce\". Still others claim that this voltage can be used to drive antenna elements. In this paper we show that this voltage is a fiction. The above inductor model is valid only when measuring a voltage from well-defined model \"terminals\" or \"ports\". Misuse of the model can lead to erroneous conclusions.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116881758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
The "current driven model"-experimental verification and the contribution of I/sub dd/ delta to digital device radiation “电流驱动模型”——实验验证及I/sub / dd/ delta对数字器件辐射的贡献
G. Dash, J. Curtis, I. Straus
{"title":"The \"current driven model\"-experimental verification and the contribution of I/sub dd/ delta to digital device radiation","authors":"G. Dash, J. Curtis, I. Straus","doi":"10.1109/ISEMC.1999.812920","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812920","url":null,"abstract":"Several researchers have proposed that a primary source of emissions from digital devices is due to the partial inductance of the return trace on printed circuit boards. In this \"current driven model,\" RF currents derived from the nanosecond rise time of periodic signals such as clocks create a voltage across the return due to this inductance. This paper reports on an experimental verification of this model, but points out apparent limitations-at frequencies above a certain point, internal characteristics of integrated circuits such as I/sub dd/ delta appear to dominate the emissions, at least in the circuits examined.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122721489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Normalized site attenuation calculations using standard spreadsheet analysis 标准化站点衰减计算使用标准电子表格分析
M. Barron
{"title":"Normalized site attenuation calculations using standard spreadsheet analysis","authors":"M. Barron","doi":"10.1109/ISEMC.1999.812882","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812882","url":null,"abstract":"Normalized site attenuation (NSA), has become the standard method for determining the adequacy of EMC test sites to perform EMI emission measurements. The measurement of the NSA parameter for a test site and the subsequent required data processing and analysis can sometimes be complicated, tedious, and time-consuming. This is particularly so for alternate test sites (e.g., semi-anechoic chambers) where 'volumetric' NSA analysis is required and also when swept frequency measurements are performed that contain large amounts of data. In cases such as this the management of the large amounts of data can be just as critical as the actual measurements. This paper proposes a method by which the large amount of NSA data and calculations can be managed in a reasonably simplistic manner through the use of standard spreadsheet analysis. This method has the distinct advantage (in contrast to special custom software) of providing an open framework model whereby all calculation details are readily available and visible for review and inspection, including all formulas used in the calculations. The foundation for this spreadsheet analysis discussion is based on the author's recent work involving NSA qualification testing of a new 10-meter semi-anechoic chamber for a major manufacturer.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128867580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Noise simulation of hard disk drive by using moment method 基于矩量法的硬盘噪声仿真
S. Ohtsu, T. Kishimoto, M. Mukai
{"title":"Noise simulation of hard disk drive by using moment method","authors":"S. Ohtsu, T. Kishimoto, M. Mukai","doi":"10.1109/ISEMC.1999.812879","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812879","url":null,"abstract":"Noise, which is generated in a read amp of a hard disk drive (HDD), is analyzed by using the moment method. The noise source is assumed to be a near-by interface cable. From the results of the analysis, the methods used to decrease the noise are shown to be effective. In addition, it is shown that the noise is affected by the grounding method between signal ground (SG) and frame ground (FG).","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128594103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Introduction to EMC and type approval for wireless devices-a preview of the IEEE representative advisory committee special session on wireless device approval 介绍无线设备的EMC和型式认证- IEEE无线设备认证代表咨询委员会特别会议预览
D. A. Case
{"title":"Introduction to EMC and type approval for wireless devices-a preview of the IEEE representative advisory committee special session on wireless device approval","authors":"D. A. Case","doi":"10.1109/ISEMC.1999.812869","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812869","url":null,"abstract":"This is an introduction to the special session hosted by the IEEE EMC society representative advisory committee on EMC and type approval requirements for wireless devices. This session provides an overview of the current and some of the proposed EMC and type approval requirements for devices such as spread spectrum, cellular phones and PCS.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124475871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A benchmark catalog for numerical field calculations with respect to EMC problems 关于EMC问题的数值场计算的基准目录
G. Mrozynski, V. Schulz, H. Garbe
{"title":"A benchmark catalog for numerical field calculations with respect to EMC problems","authors":"G. Mrozynski, V. Schulz, H. Garbe","doi":"10.1109/ISEMC.1999.812955","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812955","url":null,"abstract":"In this paper one of the activities of the German IEEE EMC-Chapter is presented. The members of a working group have developed 15 benchmarks for the evaluation of numerical methods for the field calculation with respect to EMC problems. For the choice of benchmarks, the members tried to select simple but critical benchmarks for which well known analytical or numerical methods can be applied whenever possible. The majority of the benchmarks leans on examples related to EMC. Each benchmark is described in detail.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124698189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
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