{"title":"A benchmark catalog for numerical field calculations with respect to EMC problems","authors":"G. Mrozynski, V. Schulz, H. Garbe","doi":"10.1109/ISEMC.1999.812955","DOIUrl":null,"url":null,"abstract":"In this paper one of the activities of the German IEEE EMC-Chapter is presented. The members of a working group have developed 15 benchmarks for the evaluation of numerical methods for the field calculation with respect to EMC problems. For the choice of benchmarks, the members tried to select simple but critical benchmarks for which well known analytical or numerical methods can be applied whenever possible. The majority of the benchmarks leans on examples related to EMC. Each benchmark is described in detail.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.812955","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
In this paper one of the activities of the German IEEE EMC-Chapter is presented. The members of a working group have developed 15 benchmarks for the evaluation of numerical methods for the field calculation with respect to EMC problems. For the choice of benchmarks, the members tried to select simple but critical benchmarks for which well known analytical or numerical methods can be applied whenever possible. The majority of the benchmarks leans on examples related to EMC. Each benchmark is described in detail.