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1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)最新文献

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Measurement of rising part due to starting of micro gap discharge in air using distributed constant line system 用分布式恒线系统测量空气中微间隙放电启动上升部分
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812890
K. Kawamata, S. Minegishi, A. Haga, R. Sato
{"title":"Measurement of rising part due to starting of micro gap discharge in air using distributed constant line system","authors":"K. Kawamata, S. Minegishi, A. Haga, R. Sato","doi":"10.1109/ISEMC.1999.812890","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812890","url":null,"abstract":"Very fast voltage rising time in positive polarity and falling time in negative polarity due to starting of the gap discharge were investigated in the time domain. The gap space was set very small for voltages below 1500 V as a simulation of the CDM ESD and the gap discharge of switch devices. The measurement system consists of a distributed constant line system with a tapered coaxial electrode which has a matched impedance for the characteristic impedance of the distributed constant line system. The insertion loss of the tapered coaxial electrode was within -3 dB in the frequency range below 4.5 GHz The atmosphere around the electrode is ordinary air. This experimental system enables one to measure the high speed transients of about 100 ps due to gap discharge in the time domain. As a consequence of the experiment, the relationship between the discharge voltage and transition duration were confirmed. The voltage rise time was slowed down gradually in positive polarity, while the voltage fall time was slowed down remarkably in negative polarity for the 0.1 mm needle.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127192466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Burst immunity tests according to IEC 1000-4-4 standard used to improve design of a new integrated power function 根据IEC 1000-4-4标准进行突发抗扰度测试，用于改进新型集成电源功能的设计
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812926
D. Magnon, A. Feybesse, F. Guitton
{"title":"Burst immunity tests according to IEC 1000-4-4 standard used to improve design of a new integrated power function","authors":"D. Magnon, A. Feybesse, F. Guitton","doi":"10.1109/ISEMC.1999.812926","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812926","url":null,"abstract":"Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"321 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132385350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Radiation pattern of a PCB based probe intended for near field measurements 用于近场测量的基于PCB的探针的辐射图
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810169
M. Quílez, F. Silva, A. Martin, J. Fontanilles, P. Riu
{"title":"Radiation pattern of a PCB based probe intended for near field measurements","authors":"M. Quílez, F. Silva, A. Martin, J. Fontanilles, P. Riu","doi":"10.1109/ISEMC.1999.810169","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810169","url":null,"abstract":"In some situations, the OATS (open air test site) far field condition cannot be satisfied, and near field measurements must be performed. The EMI environment inside a car is one of these situations, where only near field probes can be used for measurement. We developed a near field probe that can measure the electric and magnetic fields simultaneously. The probe was built on a PCB (printed circuit board) along with the electronics needed to transmit the signals through an analog optical link. Calibration of the probe was performed in a TEM cell. The results for the sensitivity as a function of the frequency and the radiation pattern are presented.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132870129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Improving calibration to ensure better correlation between different EMC test facilities 改进校准以确保不同EMC测试设备之间更好的相关性
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812935
B. Archambeault, C. Brench
{"title":"Improving calibration to ensure better correlation between different EMC test facilities","authors":"B. Archambeault, C. Brench","doi":"10.1109/ISEMC.1999.812935","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812935","url":null,"abstract":"This paper discusses a series of measurements performed to investigate site to site variations in radiated emission levels. After the data were examined a series of corrections were made to help account for the observed variations. This permits emission levels to be more realistically compared without excessive concern about where the testing was carried out.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130860904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An investigation on power plane decoupling for high speed multiprocessor boards 高速多处理器板电源平面解耦研究
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812927
J. Nuebel, T. Roy, S. Das
{"title":"An investigation on power plane decoupling for high speed multiprocessor boards","authors":"J. Nuebel, T. Roy, S. Das","doi":"10.1109/ISEMC.1999.812927","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812927","url":null,"abstract":"New generations of high speed processors are requiring more power. Consequently in order to cope with the high amount of switching currents, efficient decoupling of power planes has become critical for both signal integrity (SI) and EMC. In this paper an investigation has been conducted to find out the effects of decoupling capacitors on SI and EMC. A procedure for optimizing the decoupling capacitors based on the fundamental frequency and harmonic frequencies has been illustrated. The optimized decoupling strategy was then implemented on a dual processor board and the emissions were measured in a semi-anechoic chamber. The authors have tried to find out the effect of the decoupling strategy on both SI and EMI.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126262072","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Practical finite difference time domain (FDTD) shielding analysis of thin coatings and shield bonding methods 实用的薄涂层时域有限差分(FDTD)屏蔽分析及屏蔽键合方法
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810157
J. G. Kraemer
{"title":"Practical finite difference time domain (FDTD) shielding analysis of thin coatings and shield bonding methods","authors":"J. G. Kraemer","doi":"10.1109/ISEMC.1999.810157","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810157","url":null,"abstract":"Thin coatings such as indium tin oxide (ITO) or gold splatter on glass are often used on electronic display enclosures for shielding to allow compliance with radiated emissions standards while allowing optical transmission. The thin coatings are often bonded to the display enclosure to allow realization of the maximum shielding. The bonding is often accomplished by the use of a conductive gasket that mates with a busbar on one or more edges of the thin coating. Shielding effectiveness of the coating and gasket configuration is very difficult to predict using traditional shielding effectiveness equations. This paper shows how 3-dimensional (3D) finite difference time domain (FDTD) simulation and analysis are used to examine trends in shielding effectiveness with respect to gasket characteristics, thin coating characteristics (thickness and conductivity), and bonding methods. Practical simulation and model setup methods are presented. Results are provided for common configurations.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122955378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A cooperative research for experimental characterization of signal integrity in deep submicron integrated circuits 深亚微米集成电路信号完整性实验表征的合作研究
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812928
E. Sicard, S. Delmas, F. Caignet, R. De Smedt, T. Steinecke, J. Ferrante, P. Saintot
{"title":"A cooperative research for experimental characterization of signal integrity in deep submicron integrated circuits","authors":"E. Sicard, S. Delmas, F. Caignet, R. De Smedt, T. Steinecke, J. Ferrante, P. Saintot","doi":"10.1109/ISEMC.1999.812928","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812928","url":null,"abstract":"The following paper describes a cooperative project between four major European industries and one academic institute, on the development of a novel measurement method for the precise characterization of signal integrity. The method has been implemented in 0.35, 0.25 and 0.18 /spl mu/m CMOS technology, and several aspects of signal integrity have been investigated: interconnect delay, crosstalk within interconnects, delay induced by crosstalk and power supply lines fluctuations. Details on the method and the milestones of the project are reported in the paper.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115257084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Effective boundary conditions for the time-domain analysis of the EMC performances of fiber composites 纤维复合材料电磁兼容性能时域分析的有效边界条件
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812948
M. S. Sarto, C.L. Holloway
{"title":"Effective boundary conditions for the time-domain analysis of the EMC performances of fiber composites","authors":"M. S. Sarto, C.L. Holloway","doi":"10.1109/ISEMC.1999.812948","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812948","url":null,"abstract":"An efficient model is proposed for the analysis of the shielding performances of fiber reinforced composites against transient electromagnetic plane waves. The non-homogeneous material is simulated by an equivalent non-uniform anisotropic slab, characterized by proper tensors of effective permittivity and conductivity. The analysis of the field propagation through the effective panel is carried out in the frequency-domain, in order to compute the transmission and surface impedance matrices of the panel. The time-domain effective boundary conditions, which describe the relations among the TE and TM field components tangential to the external faces of the slab, are expressed in terms of the transient transmission and surface impedance matrices. The model is implemented in a three-dimensional finite-difference time-domain procedure and is applied to the analysis of the field penetration inside a composite box illuminated by an impulsive plane wave.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128022743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Cloud influence in evaluating the electric field of a lightning return stroke 云对闪电回击电场评价的影响
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810090
G. Ala, P. Buccheri, Giuseppe Domino
{"title":"Cloud influence in evaluating the electric field of a lightning return stroke","authors":"G. Ala, P. Buccheri, Giuseppe Domino","doi":"10.1109/ISEMC.1999.810090","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810090","url":null,"abstract":"A theoretical model to evaluate the electric field of a lightning return-stroke by taking into account the presence of the cloud, is illustrated. The cloud-lightning channel system is modelled by employing a perfectly conducting sphere placed above a thin-wire vertical antenna excited by a lightning current at the ground level. The current distribution in the channel is derived by a transmission line model found in technical literature. The ground is considered perfectly conductive. Different examples related to various channel lengths and sphere radii are reported in the paper, by stressing the different behaviour with and without the cloud. A comparison with recorded data available in literature, enables to qualitatively validate the results computed by means of the proposed model.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133207421","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
NIST assessment of uncertainties for standard antenna measurements NIST对标准天线测量不确定度的评估
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812934
D.G. Camell, K. Cavcey
{"title":"NIST assessment of uncertainties for standard antenna measurements","authors":"D.G. Camell, K. Cavcey","doi":"10.1109/ISEMC.1999.812934","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812934","url":null,"abstract":"The National Institute of Standards and Technology calibrates electromagnetic compatibility reference antennas using the standard antenna method. This method uses a fundamental antenna to precisely measure the electric field. Frequencies of interest are 30 to 1000 MHz. Complete uncertainties are determined for calibrations performed an the open area test site and lead to a statement of uncertainty for the method. The results of this procedure yield a standard uncertainty of 0.4 dB.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"137 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133612867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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