{"title":"Burst immunity tests according to IEC 1000-4-4 standard used to improve design of a new integrated power function","authors":"D. Magnon, A. Feybesse, F. Guitton","doi":"10.1109/ISEMC.1999.812926","DOIUrl":null,"url":null,"abstract":"Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"321 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.812926","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design.