A cooperative research for experimental characterization of signal integrity in deep submicron integrated circuits

Abstract

The following paper describes a cooperative project between four major European industries and one academic institute, on the development of a novel measurement method for the precise characterization of signal integrity. The method has been implemented in 0.35, 0.25 and 0.18 /spl mu/m CMOS technology, and several aspects of signal integrity have been investigated: interconnect delay, crosstalk within interconnects, delay induced by crosstalk and power supply lines fluctuations. Details on the method and the milestones of the project are reported in the paper.