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1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)最新文献

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The low voltage directive-overcoming our local "design culture" and getting it right 低电压指令-克服我们当地的“设计文化”，并把它做好
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810179
G. Kervill
{"title":"The low voltage directive-overcoming our local \"design culture\" and getting it right","authors":"G. Kervill","doi":"10.1109/ISEMC.1999.810179","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810179","url":null,"abstract":"This paper proposes that many product safety non-compliances are consistently reproduced because designers are influenced by a set of local beliefs and assumptions that, unfortunately, vary from region to region. In this way, by understanding \"why\" these problems occur we will be better placed to correct the offending 'design cultures' within our companies, eliminate the problem and save substantial cost.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132678517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Slot and aperture coupling for airflow aperture arrays in shielding enclosure designs 屏蔽罩设计中气流孔阵列的槽孔耦合
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812863
M. Li, J. Drewniak, T. Hubing, R. DuBroff, T. P. Vandoren
{"title":"Slot and aperture coupling for airflow aperture arrays in shielding enclosure designs","authors":"M. Li, J. Drewniak, T. Hubing, R. DuBroff, T. P. Vandoren","doi":"10.1109/ISEMC.1999.812863","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812863","url":null,"abstract":"The coupling between apertures or slots in airflow arrays is investigated numerically by means of the method of moments (MoM). Application to shielding enclosure design is of particular interest. Justification for a previously extracted simple empirical design approach for the relation between the number N and size a of apertures, and the shielding effectiveness /spl sim/Na/sup 3/ for an airflow aperture array is given. The coupling between slots is also investigated. The application limit of the empirical design approach is demonstrated.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128854255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Predicting vehicle-level EMC performance utilizing on-bench component characterization results 利用台架组件特性结果预测车辆级EMC性能
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810115
Chingchi Chen
{"title":"Predicting vehicle-level EMC performance utilizing on-bench component characterization results","authors":"Chingchi Chen","doi":"10.1109/ISEMC.1999.810115","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810115","url":null,"abstract":"This paper proposes a simple, but powerful technique to predict the system-level electromagnetic compatibility (EMC) performance from the results of on-bench component characterization. Using a network analyzer, the components of a vehicle ignition system were characterized on-bench up to 1 GHz, and then the results were manipulated numerically to estimate the system-level performance. Results have shown that the prediction matches the open-area-test-site (OATS) test results pretty well, which shows that this can be a very handy tool for predicting possible system-level problems from component-level features, or the problems can be traced down to subsystem-/component-level to pinpoint the troublesome bottle neck(s).","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127851071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Semi-empirical modeling of apertures by use of FDTD 利用时域有限差分法对孔径进行半经验建模
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810128
T. Martin, M. Backstrom
{"title":"Semi-empirical modeling of apertures by use of FDTD","authors":"T. Martin, M. Backstrom","doi":"10.1109/ISEMC.1999.810128","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810128","url":null,"abstract":"A novel method to include models of complex apertures into the finite-difference time-domain method is presented. Instead of resolving the geometrical details of the aperture, the aperture is treated as a magnetic dipole. The properties of the magnetic dipole moment are determined using the measured transmission cross section of the aperture. This semi-empirical model permits inclusion of complex apertures in FDTD simulations. Comparisons between simulations and measurements are presented.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"298 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115543505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Application of the finite difference time domain (FDTD) method to a challenging real-world EMC problem 时域有限差分(FDTD)方法在实际电磁兼容问题中的应用
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.810099
I. Rumsey, M. Piket-May
{"title":"Application of the finite difference time domain (FDTD) method to a challenging real-world EMC problem","authors":"I. Rumsey, M. Piket-May","doi":"10.1109/ISEMC.1999.810099","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.810099","url":null,"abstract":"As high speed systems place greater demands on electronic packaging and interconnects, numerical simulation at the package and circuit board levels before prototyping is needed to produce designs which meet stringent EMI, EMC, signal integrity, and timing constraints. The finite-difference time-domain technique is an intuitive modeling technique that may be used for a number of interesting EMC problems. This paper discusses initial results for grand challenge problems 2 and 4.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124143865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
EMC development process for information technology equipment 信息技术设备的EMC开发过程
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812880
V. Mandrusov, T. Jackman, T. Roaque, D. Friesen
{"title":"EMC development process for information technology equipment","authors":"V. Mandrusov, T. Jackman, T. Roaque, D. Friesen","doi":"10.1109/ISEMC.1999.812880","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812880","url":null,"abstract":"Data processing products continue to be designed using higher and higher clock speeds. This increases EMC related problems, especially in such areas as radiated emissions. At the same time, \"market windows\" that limit the useful life of a product forces development cycles to become shorter and shorter. If a company is to produce cost effective products in such an environment, EMC must become an integral part of new and sustaining product development cycles. This paper describes how EMC processes and tools, ranging from conceptual design reviews to automated testing, can be effectively integrated into a company's overall product design strategy.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116942977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Analysis of compatibility between digital television DVB-T and radio astronomy sharing the same frequency band: 608-614 MHz 数字电视DVB-T与射电天文608-614 MHz频段兼容性分析
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812891
D. Wiecek
{"title":"Analysis of compatibility between digital television DVB-T and radio astronomy sharing the same frequency band: 608-614 MHz","authors":"D. Wiecek","doi":"10.1109/ISEMC.1999.812891","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812891","url":null,"abstract":"The paper presents results of compatibility analysis between digital television DVB-T and radioastronomy in the frequency range 608-614 MHz. The co-ordination distances and allowed interfering field strength are evaluated.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":" 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120829449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Some aspects of shielding effectiveness related to measurements and simulations 屏蔽效能的一些方面与测量和模拟有关
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812952
J. Catrysse, R. De Smedt
{"title":"Some aspects of shielding effectiveness related to measurements and simulations","authors":"J. Catrysse, R. De Smedt","doi":"10.1109/ISEMC.1999.812952","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812952","url":null,"abstract":"Two aspects of the shielding effectiveness of an enclosure are addressed: characteristics of the material of the shield and the leakage through apertures and grids. In both cases a suitable measurement set-up is presented, which enables to concentrate on the aspect under study: a TEM-t cell to characterize a thin sheet of conducting material, a dedicated test enclosure with removable front panel to study the effect of apertures. These configurations are also simulated with 3D full wave field solvers and suitable equivalent circuits are derived. The numerical results help to interpret the measurement procedure and confirm the measured results. The equivalent circuits provide fast and approximate, but still accurate enough answers to the EMC designer.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116174227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Verifying RF amplifier characteristics at EMC lab 在EMC实验室验证射频放大器特性
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812932
A. Manara, F. Colombo
{"title":"Verifying RF amplifier characteristics at EMC lab","authors":"A. Manara, F. Colombo","doi":"10.1109/ISEMC.1999.812932","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812932","url":null,"abstract":"This paper deals with the measurement of AM percent modulation of the radio-frequency fields used in RF immunity test (conducted and radiated) International standards set a requirement on the amplitude modulation depth of the RF voltages to be injected in CDN (or antennas) and prescribe a tolerance around the nominal value to be verified using a scope. Such small tolerance (5%) is difficult to measure with an oscilloscope and (moreover) other discrepancies of the modulated signal are not visible on the oscilloscope. Using a spectrum analyzer the modulation depth and the harmonic contents as well other types of distortion can be seen at a glance with higher accuracy.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123530282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterization of loaded TEM-waveguides using time-domain reflectometry 负载tem波导的时域反射表征
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI: 10.1109/ISEMC.1999.812881
J.P. Karst, H. Garbe
{"title":"Characterization of loaded TEM-waveguides using time-domain reflectometry","authors":"J.P. Karst, H. Garbe","doi":"10.1109/ISEMC.1999.812881","DOIUrl":"https://doi.org/10.1109/ISEMC.1999.812881","url":null,"abstract":"An approach is presented to characterize the load state of a TEM-waveguide using the local characteristic impedance Z/sub c/(z) derived from time-domain reflectometry (TDR) measurements. The field homogeneity and the field polarization can be estimated using the deviation from the intended Z/sub c/=50 /spl Omega/ of the empty TEM-waveguide. Considering wave propagation only in the TEM-mode an analytical relationship between load state and characteristic impedance is derived. Multiple reflections due to the nonuniformity of the loaded TEM-waveguide and higher order modes excited by the load are taken into account. Experimental results are presented using a GTEM-cell with several load states.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125775932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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