{"title":"屏蔽效能的一些方面与测量和模拟有关","authors":"J. Catrysse, R. De Smedt","doi":"10.1109/ISEMC.1999.812952","DOIUrl":null,"url":null,"abstract":"Two aspects of the shielding effectiveness of an enclosure are addressed: characteristics of the material of the shield and the leakage through apertures and grids. In both cases a suitable measurement set-up is presented, which enables to concentrate on the aspect under study: a TEM-t cell to characterize a thin sheet of conducting material, a dedicated test enclosure with removable front panel to study the effect of apertures. These configurations are also simulated with 3D full wave field solvers and suitable equivalent circuits are derived. The numerical results help to interpret the measurement procedure and confirm the measured results. The equivalent circuits provide fast and approximate, but still accurate enough answers to the EMC designer.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Some aspects of shielding effectiveness related to measurements and simulations\",\"authors\":\"J. Catrysse, R. De Smedt\",\"doi\":\"10.1109/ISEMC.1999.812952\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two aspects of the shielding effectiveness of an enclosure are addressed: characteristics of the material of the shield and the leakage through apertures and grids. In both cases a suitable measurement set-up is presented, which enables to concentrate on the aspect under study: a TEM-t cell to characterize a thin sheet of conducting material, a dedicated test enclosure with removable front panel to study the effect of apertures. These configurations are also simulated with 3D full wave field solvers and suitable equivalent circuits are derived. The numerical results help to interpret the measurement procedure and confirm the measured results. The equivalent circuits provide fast and approximate, but still accurate enough answers to the EMC designer.\",\"PeriodicalId\":312828,\"journal\":{\"name\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"volume\":\"99 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1999.812952\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.812952","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Some aspects of shielding effectiveness related to measurements and simulations
Two aspects of the shielding effectiveness of an enclosure are addressed: characteristics of the material of the shield and the leakage through apertures and grids. In both cases a suitable measurement set-up is presented, which enables to concentrate on the aspect under study: a TEM-t cell to characterize a thin sheet of conducting material, a dedicated test enclosure with removable front panel to study the effect of apertures. These configurations are also simulated with 3D full wave field solvers and suitable equivalent circuits are derived. The numerical results help to interpret the measurement procedure and confirm the measured results. The equivalent circuits provide fast and approximate, but still accurate enough answers to the EMC designer.