{"title":"信息技术设备的EMC开发过程","authors":"V. Mandrusov, T. Jackman, T. Roaque, D. Friesen","doi":"10.1109/ISEMC.1999.812880","DOIUrl":null,"url":null,"abstract":"Data processing products continue to be designed using higher and higher clock speeds. This increases EMC related problems, especially in such areas as radiated emissions. At the same time, \"market windows\" that limit the useful life of a product forces development cycles to become shorter and shorter. If a company is to produce cost effective products in such an environment, EMC must become an integral part of new and sustaining product development cycles. This paper describes how EMC processes and tools, ranging from conceptual design reviews to automated testing, can be effectively integrated into a company's overall product design strategy.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"EMC development process for information technology equipment\",\"authors\":\"V. Mandrusov, T. Jackman, T. Roaque, D. Friesen\",\"doi\":\"10.1109/ISEMC.1999.812880\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Data processing products continue to be designed using higher and higher clock speeds. This increases EMC related problems, especially in such areas as radiated emissions. At the same time, \\\"market windows\\\" that limit the useful life of a product forces development cycles to become shorter and shorter. If a company is to produce cost effective products in such an environment, EMC must become an integral part of new and sustaining product development cycles. This paper describes how EMC processes and tools, ranging from conceptual design reviews to automated testing, can be effectively integrated into a company's overall product design strategy.\",\"PeriodicalId\":312828,\"journal\":{\"name\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1999.812880\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.812880","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
EMC development process for information technology equipment
Data processing products continue to be designed using higher and higher clock speeds. This increases EMC related problems, especially in such areas as radiated emissions. At the same time, "market windows" that limit the useful life of a product forces development cycles to become shorter and shorter. If a company is to produce cost effective products in such an environment, EMC must become an integral part of new and sustaining product development cycles. This paper describes how EMC processes and tools, ranging from conceptual design reviews to automated testing, can be effectively integrated into a company's overall product design strategy.