根据IEC 1000-4-4标准进行突发抗扰度测试，用于改进新型集成电源功能的设计

1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) Pub Date : 1999-08-02 DOI:10.1109/ISEMC.1999.812926

D. Magnon, A. Feybesse, F. Guitton

{"title":"根据IEC 1000-4-4标准进行突发抗扰度测试，用于改进新型集成电源功能的设计","authors":"D. Magnon, A. Feybesse, F. Guitton","doi":"10.1109/ISEMC.1999.812926","DOIUrl":null,"url":null,"abstract":"Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"321 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Burst immunity tests according to IEC 1000-4-4 standard used to improve design of a new integrated power function\",\"authors\":\"D. Magnon, A. Feybesse, F. Guitton\",\"doi\":\"10.1109/ISEMC.1999.812926\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design.\",\"PeriodicalId\":312828,\"journal\":{\"name\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"volume\":\"321 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1999.812926\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.812926","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

任何电子应用都必须满足有关电磁干扰的抗扰性要求。这种抗扰度可以通过IEC 1000-4-4标准批准，该标准不允许对单个设备进行测试。为了达到这个结果，我们必须设计一种测试方法。我们从一个新的集成功率函数得到的结果是令人满意的，它们证实了器件的可靠性，并允许我们保持或改进设计。

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Burst immunity tests according to IEC 1000-4-4 standard used to improve design of a new integrated power function

Any electronics application has to satisfy immunity requirements concerning electromagnetic perturbations. This immunity can be ratified by the IEC 1000-4-4 standard, which does not allow for the testing of a single device. In order to achieve the results, we had to design a test method. The results we got from a new integrated power function are satisfactory for they confirm the reliability of the device and allow us to keep or improved the design.

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1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)

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